SYMPOSIA PAPER Published: 01 January 1993
STP14897S

Recent Developments in Quantitative Fractography

Source

Quantitative characterization of fracture surface topography is an important aspect of quantitative fractography. This contribution is concerned with the profilometric methods for the estimation of the important descriptors of the fracture surface topography. The parameters such as fracture surface roughness, tortuosity, fraction overlap, etc. are defined, and the profilometric measurements that enable the estimation of such parameters are described. Recent experimental data on the surface roughness and fractal dimension pertaining to creep and impact fracture surfaces are presented to demonstrate the utility of the topographic parameters.

Author Information

Gokhale, AM
School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA
Drury, WJ
School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA
Mishra, S
School of Materials Engineering, Georgia Institute of Technology, Atlanta, GA
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Details
Developed by Committee: D30
Pages: 3–22
DOI: 10.1520/STP14897S
ISBN-EB: 978-0-8031-5249-6
ISBN-13: 978-0-8031-1866-9