STP Published: 2007

Structural Integrity of Fasteners Including the Effects of Environment and Stress Corrosion Cracking: 3rd Volume

Editor(s): Pir M. Toor, Joseph Barron

Eleven peer-reviewed papers provide the latest information on the structural integrity of fasteners, including the effect s of environmental and stress corrosion cracking. For Sections cover:

Fatigue and Crack Growth Experimental Techniques—three papers cover the development of a fastener structural element test for certifying navy fasteners material; experimental crack growth behavior for aerospace application; and influence of cold rolling threads before and after heat treatment on the fatigue resistance of high strength coarse thread bolts for multiple preload conditions.

Design/Environmental Effects—two papers examined the relationship between the tightening speed with friction and clamped-load; and the optimum thread rolling process that improves SCC resistance to improve quality of design.

Fatigue and Crack Growth Analytical Techniques—three papers describe current analytical techniques for fatigue and crack growth evaluations of fasteners; a numerical crack growth model using the finite element analysis generated stress field; and s the resistance of high strength fine thread bolts for multiple preload conditions.

Design Consideration—focuses on the comprehensive nonlinear 3D finite element model to simulate a displacement controlled for riveted structure; state-of-the-art fatigue crack growth analysis techniques which are used in various industries to damage tolerance evaluation of structures; and the material stress state within the thread of the bolt; and on each parameter affecting the structural integrity of a bolted joint.

Table of Contents

Amarendra Atre, W. S. Johnson

Kirk W. Olsen

Kirk W. Olsen, Clare M. Rimnac, Douglas W. Ferrell, Carl E. Garrett

Kirk W. Olsen, Clare M. Rimnac

Ralph I. Stephens, Nathan J. Bradley, Nathan J. Horn, James M. Arkema, Jeffrey J. Gradman

Eric M. Focht, Brian P. L'Heureux, Charles Roe

Michael P. Oliver, Vinod K. Jain

Alan R. Kephart

Mark L. Renauld, Hue Lien, Weldon W. Wilkening

Kirk W. Olsen, Clare M. Rimnac, Paul A. Wawrzynek, Bruce J. Carter

N. J. Bradley, R. I. Stephens, N. J. Horn, J. J. Gradman, J. M. Arkema, C. S. Borgwardt

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Developed by Committee: E08
Pages: 150
DOI: 10.1520/STP1487-EB
ISBN-EB: 978-0-8031-6235-8
ISBN-13: 978-0-8031-3413-3