STP Published: 2005

Fatigue Testing and Analysis Under Variable Amplitude Loading Conditions

Editor(s): Peter C. McKeighan, Narayanaswani Ranganathan

Thirty-eight peer-review papers provide the latest information on fatigue testing and analysis under variable amplitude spectrum loading conditions focus purely on fatigue testing, fatigue design techniques, or a combination of both. This new ASTM publication serves as an important reference for engineers and scientists involved in structural integrity and component lifetime management.

Six sections cover:
• Fatigue Testing and Laboratory
• Aerospace Applications, including full-scale aircraft testing
• Design Approaches and Modelling
• Other Applications
• Load Interaction
• Probabilistic and Multiaxial Effects

Table of Contents

CM Sonsino

SW Hopkins, MR Mitchell, J Ménigault

PC McKeighan, FJ McMaster

JK Donald, K George

S Pöting, M Traupe, J Hug, H Zenner

K George, HS Reemsnyder, JK Donald, RJ Bucci

MG Sullentrup

RL Hewitt, JP Weiss, PK Nor

LL Divenah, JY Beaufils

M Yanishevsky, RA Everett

RR Stephens, RI Stephens, SC Berge, DE Lemm, CD Glancey

FJ McMaster, PC McKeighan

N Gérard, R Leroy, O Girard, N Ranganathan

NV Tumanov

GB Marquis, BR Rabb, P Karjalainen-Roikonen

JC Newman, EP Phillips

DL Ball

RC McClung, FJ McMaster, JH Feiger

R Sunder, NE Ashbaugh, WJ Porter, AH Rosenberger

J-H Song, C-Y Kim, S-Y Lee

Z Wu, G Glinka, H Jakubczak, L Nilsson

W El-Ratal, M Bennebach, X Lin, R Plaskitt

AJ McEvily, S Ishihara, M Endo

JJ Thomas, A Bignonnet, G Perroud

F Morel, N Ranganathan

J Petermann, S Hinz, K Schulte

Y Tomita, K Hashimoto, N Osawa, K Terai, Y Wang

J Hünecke, D Schöne

F Romeiro, M de Freitas, S Pommier

N Ranganathan, A Tougui, F Lacroix, J Petit

B Tabernig, R Pippan, J Foulquier, A Rapaport, S Sereni

P Darcis, N Recho

V Aubin, P Quaegebeur, S Degallaix

UO Akpan, PA Rushton, TE Dunbar, TS Koko

M Huther, S Mahérault, G Parmentier, G Césarine

T Łagoda, E Macha, A Niesłony

G Fischer

A Banvillet, T Palin-Luc, JF Vittori

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Developed by Committee: E08
Pages: 600
DOI: 10.1520/STP1439-EB
ISBN-EB: 978-0-8031-5503-9
ISBN-13: 978-0-8031-3479-9