STP Published: 2000

Fatigue Crack Growth Thresholds, Endurance Limits, and Design

Editor(s): J. C. Newman Jr, R. S. Piascik

Leading experts provide 24 papers addressing four areas pertinent to fatigue crack growth thresholds: mechanisms, test procedures, analysis, and applications.

Mechanisms: Three mechanisms that influence thresholds are discussed including: crack-tip closure, environment, and Kmax effects. A simplistic four-parameter model that describes FCG threshold behavior of elastic-plastic materials is also presented.

Test Procedures: Eight papers focus on loading and specimen-type effects with research showing that the resistance-curve (R-curve) method to determine the threshold for fatigue-crack growth should allow more reliable application of ΔKth values to engineering problems.

Analysis: Three papers analyze the behavior of fatigue cracks in the threshold regime using several different analysis methods. These methods were the elastic-plastic finite-element method (FEM), the Dugdale-type mode, the BCS (Bilby, Cottrell and Swinden) model, and a discrete-dislocation model.

Applications: Nine papers address applications of threshold concepts and endurance limits to aerospace and structural materials. The impact of a number of testing variables on the measurement of fatigue-crack-growth thresholds, in particular ASTM E 647, Test Method for Measurement of Fatigue Crack Growth Rates is also discussed.

Table of Contents

J Petit, G Henaff, C Sarrazin-Baudoux

A Hadrboletz, B Weiss, R Stickler

H-J Schindler

JA Newman, WT Riddell, RS Piascik

G Marci

B Tabernig, P Powell, R Pippan

SW Smith, RS Piascik

AJ McEvily, M Ohashi, R Shover, A DeCarmine

C Bathias

KR Garr, GC Hresko

HO Liknes, RR Stephens

A Varvani-Farahani, TH Topper

RC McClung

JC Newman

FO Riemelmoser, R Pippan

RW Bush, JK Donald, RJ Bucci

MJ Caton, JW Jones, JE Allison

Y Akiniwa, K Tanaka

EJ Czyryca

C Sarrazin-Baudoux, Y Chabanne, J Petit

D Taylor, G Wang

P Albrecht, WJ Wright

R Lindström, P Lidar, B Rosborg

G Marquis, R Rabb, L Siivonen

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Developed by Committee: E08
Pages: 452
DOI: 10.1520/STP1372-EB
ISBN-EB: 978-0-8031-5424-7
ISBN-13: 978-0-8031-2624-4