STP Published: 2000

Fatigue and Fracture Mechanics: 30th Volume

Editor(s): Kenneth L. Jerina, Paul C. Paris

STP 1360 provides advanced state-of-the-art techniques for predicting fracture and fatigue, as well as applications and engineering problem solving in a number of key industries. Over 30 comprehensive, peer-reviewed papers from the world's leading experts address topics in fracture mechanics, fatigue, and applications.

Areas of fracture mechanics covered include:

• Effects of geometry

• Specimen size on fracture behavior

• Toughness in the transition region

• Loading effects on fracture

• Innovative crack solutions

• Analysis techniques in analytical fracture mechanics

Areas of fatigue include:

• Effects of crack closure, stress ratio, residual stress and loading on fatigue

• Novel test methods and data analysis

Applications include:

• Predicting and measuring fatigue performance

• Fracture mechanics applications

• Finite element modeling of cracks and crack growth

This is a critical resource for mechanical, materials, and structural engineers involved with structural parts design and analysis; regulatory and investigative organizations and national laboratories.

Table of Contents

JD Landes

DE McCabe, JG Merkle, K Wallin

JR Donoso, JD Landes

ME Natishan, MT Kirk

PC Gioielli, JD Landes, PC Paris, H Tada, L Loushin

CD Wilson, JD Landes

AS Gullerud, RH Dodds, RW Hampton, DS Dawicke

C Thaulow, ZL Zhang, Ø Ranestad, M Hauge

DM Lambert, HA Ernst

T Siegmund, W Brocks

IC Howard, ZH Li, MA Sheikh

SC TerMaath, AR Ingraffea, PA Wawrzynek

JK Donald, GM Connelly, PC Paris, H Tada

M Lang, JM Larsen

H-L Wang, AF Grandt

JD Dougherty, TS Srivatsan, J Padovan

H-Y Zhang, RI Stephens, G Glinka

RW Hertzberg

F Ye, C Mercer, D Farkas, WO Soboyejo

A Varvani-Farahani, TH Topper

JH Lee, YJ Kim, KB Yoon

ABO Soboyejo, MA Foster, C Mercer, JC Papritan, WO Soboyejo

HP Rossmanith

JA Joyce, RL Tregoning

GN Vigilante, JH Underwood, D Crayon

JR Brockenbrough, GH Bray

JC Newman, WG Reuter, CR Aveline

V Weiss, N Goldfine, M Natishan

W-M Chi, GG Deierlein, AR Ingraffea

EH Glaessgen, IS Raju, CC Poe

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Developed by Committee: E08
Pages: 485
DOI: 10.1520/STP1360-EB
ISBN-EB: 978-0-8031-5418-6
ISBN-13: 978-0-8031-2617-6