SYMPOSIA PAPER Published: 01 January 1994

Creep Behavior of Silicon Nitride Determined From Curvature and Neutral Axis Shift Measurements in Flexure Tests


The creep behavior of a hot-pressed silicon nitride was determined in flexure in air at 1200 and 1300°C by monitoring the creep deflection, the specimen curvature and the position of the neutral axis. The resulting data was used to evaluate the steady-state creep rate from the conventional elastic solution, curvature-moment relations and a model accounting for neutral axis shift. Fractography and measurements of specimen compliance before and after testing indicated bulk cracking and a loss of stiffness. The validity of flexural data to determine creep life parameters was considered.

Author Information

Salem, JA
NASA LeRC, Cleveland, OH
Choi, SR
Cleveland State University, Cleveland, OH
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Developed by Committee: C28
Pages: 84–97
DOI: 10.1520/STP12776S
ISBN-EB: 978-0-8031-5268-7
ISBN-13: 978-0-8031-1864-5