STP Published: 1990

MiCon 90: Advances in Video Technology for Microstructural Control

Editor(s): G F Vander Voort

Reviews some of the most recent developments in the emerging field of computer-enhanced imaging and automatic image analysis. 27 papers cover:

• General Overview

• Nondestructive Testing Applications

• Metallographic Applications

Table of Contents

GF Vander Voort

GS Cole

JC Russ

PM Schleitweiler, MH Ransick

JP Basart

ER Generazio, DJ Roth

L Adler, PB Nagy

MA Sutton, TL Chae, JL Turner, HA Bruck

C Forget

DW Hetzner

JJ Friel, EB Prestridge, F Glazer

TB Abbott, A Brownrigg

V Horálek, J Klofáč

DR Green

J Boutin, M Baumer

GF Vander Voort

JC Grande

LM Karlsson, LM Cruz-Orive

BM Jenkins, RR Lovel, JA Thurlby

GS Cole, DJ Melotik, WF Buckingham

BM Jenkins, BW Cherry

AM Gokhale

EE Underwood

EE Underwood

MM Smith, W Petruk

Contact Sales
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Developed by Committee: E04
Pages: 400
DOI: 10.1520/STP1094-EB
ISBN-EB: 978-0-8031-5162-8
ISBN-13: 978-0-8031-1399-2