In section 6.1.1 maximum test pan ledge widths are given for “thick” specimens. However, no dimension is given that would define a thick specimen. As a result of discussion within the TG, it was decided that the ledge width limits should be applied to all specimens. Although for “thin” materials such as films or sheet vapor retarders, there would be little or no ledge and mask error at any width, this eliminates any question about when a distinction is to be made. As such, the word “thick” can be deleted from the sentence.
Date Initiated: 09-05-2024
Technical Contact: Charles Petty