Work Item
ASTM WK87644

Withdrawal of F996-11(2018) Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics

Rationale

This standard is being balloted for withdrawal with no replacement because with no replacement because A ballot to disband the committee was conducted in May 2023 and the committee voted to approve this action. All F01 standards will be available on the ASTM website as “historical” standards. Should anyone be aware of an organization willing to assume responsibility of the F01 Standards, please let me know. Please contact Kelly Paul (kpaul@astm.org) with any questions.

Details

Developed by Subcommittee: F01.11

Committee: F01

Staff Manager: Kelly Paul

Work Item Status

Date Initiated: 08-23-2023

Technical Contact: Kelly Paul