ASTM's electronics standards are instrumental in specifying, evaluating, and testing the performance requirements of the materials and accessories used in the fabrication of electronic components, devices, and equipments. These components include thin films and substrates, membrane switches, surface mount devices, electron tubes and emitters, integrated circuits, microelectronic devices, bonding wires, gas distribution system components, and flat panel displays. These electronics standards guide semiconductor device manufacturers and other companies that deal with such parts and components in the appropriate fabrication and treatment procedures, as well as in the examination and assessment of the end-products' properties to ensure quality towards safe utilization.

Electronics Standards

ASTM's electronics standards are instrumental in specifying, evaluating, and testing the performance requirements of the materials and accessories used in the fabrication of electronic components, devices, and equipments. These components include thin films and substrates, membrane switches, surface mount devices, electron tubes and emitters, integrated circuits, microelectronic devices, bonding wires, gas distribution system components, and flat panel displays. These electronics standards guide semiconductor device manufacturers and other companies that deal with such parts and components in the appropriate fabrication and treatment procedures, as well as in the examination and assessment of the end-products' properties to ensure quality towards safe utilization.

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Compound Semiconductors

F2358-04 Standard Guide for Measuring Characteristics of Sapphire Substrates

F76-08(2016)e1 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors

F1404-92(2007) Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique (Withdrawn 2016)

F418-77(2002) Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements (Withdrawn 2008)

F1212-89(2002) Standard Test Method for Thermal Stability Testing of Gallium Arsenide Wafers (Withdrawn 2008)

F358-83(2002) Standard Test Method for Wavelength of Peak Photoluminescence and the Corresponding Composition of Gallium Arsenide Phosphide Wafers (Withdrawn 2008)

Contamination Control

F1396-93(2020) Standard Test Method for Determination of Oxygen Contribution by Gas Distribution System Components

F1438-93(2020) Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components

F1398-93(2020) Standard Test Method for Determination of Total Hydrocarbon Contribution by Gas Distribution System Components

F1397-93(2020) Standard Test Method for Determination of Moisture Contribution by Gas Distribution System Components

F1373-93(2020) Standard Test Method for Determination of Cycle Life of Automatic Valves for Gas Distribution System Components

F1376-92(2020) Standard Guide for Metallurgical Analysis for Gas Distribution System Components

F1375-92(2020) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components

F1374-92(2020) Standard Test Method for Ionic/Organic Extractables of Internal Surfaces-IC/GC/FTIR for Gas Distribution System Components

F1394-92(2020) Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves

F1372-93(2020) Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components

F1094-87(2020) Standard Test Methods for Microbiological Monitoring of Water Used for Processing Electron and Microelectronic Devices by Direct Pressure Tap Sampling Valve and by the Presterilized Plastic Bag Method

Management Practices and Guides

F2725-19 Standard Guide for European Union's Registration, Evaluation, and Authorization of Chemicals (REACH) Supply Chain Information Exchange

F2931-19a Standard Guide for Analytical Testing of Substances of Very High Concern in Materials and Products

F2577-22 Standard Guide for Compositional Evaluation of Declarable Substances and Substances of Concern for Materials in Products

Metallic Materials, Wire Bonding, and Flip Chip

F1466-20 Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications

F375-20 Standard Specification for Integrated Circuit Lead Frame Material

F72-21 Standard Specification for Gold Wire for Semiconductor Lead Bonding

F44-21 Standard Specification for Metallized Surfaces on Ceramic

F19-21 Standard Test Method for Tension and Vacuum Testing Metallized Ceramic Seals

F106-12(2017) Standard Specification for Brazing Filler Metals for Electron Devices

F73-96(2017) Standard Specification for Tungsten-Rhenium Alloy Wire for Electron Devices and Lamps

F30-96(2017) Standard Specification for Iron-Nickel Sealing Alloys

F1269-13(2018) Standard Test Methods for Destructive Shear Testing of Ball Bonds

F85-76(2018) Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes

F83-71(2018) Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters

F458-13(2018) Standard Practice for Nondestructive Pull Testing of Wire Bonds

F219-96(2018) Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps

F204-76(2018) Standard Test Method for Surface Flaws in Tungsten Seal Rod and Wire

F487-13(2018) Standard Specification for Fine Aluminum–1 % Silicon Wire for Semiconductor Lead-Bonding

F459-13(2018) Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds

F364-96(2019) Standard Specification for Molybdenum Flattened Wire for Electron Tubes 

F289-96(2019) Standard Specification for Molybdenum Wire and Rod for Electronic Applications

F269-60(2019) Standard Test Method for Sag of Tungsten Wire

F288-96(2019) Standard Specification for Tungsten Wire for Electron Devices and Lamps

F96-77(2020) Standard Specification for Electronic Grade Alloys of Copper and Nickel in Wrought Forms

F180-94(2020) Standard Test Method for Density of Fine Wire and Ribbon Wire for Electronic Devices

F205-94(2020) Standard Test Method for Measuring Diameter of Fine Wire by Weighing

F290-94(2020) Standard Specification for Round Wire for Winding Electron Tube Grid Laterals

F256-05(2020) Standard Specification for Chromium-Iron Sealing Alloys with 18 or 28 Percent Chromium

F798-97(2002) Standard Practice for Determining Gettering Rate, Sorption Capacity, and Gas Content of Nonevaporable Getters in the Molecular Flow Region (Withdrawn 2008)

F508-77(2002) Standard Practice for Specifying Thick-Film Pastes (Withdrawn 2008)

F3-02a Standard Specification for Nickel Strip for Electron Tubes (Withdrawn 2008)

F1-03 Standard Specification for Nickel-Clad and Nickel-Plated Steel Strip for Electron Tubes (Withdrawn 2009)

F979-86(2003) Standard Test Method for Hermeticity of Hybrid Microcircuit Packages Prior to Lidding (Withdrawn 2009)

F357-78(2002) Standard Practice for Determining Solderability of Thick Film Conductors (Withdrawn 2008)

F78-97(2002) Standard Test Method for Calibration of Helium Leak Detectors by Use of Secondary Standards (Withdrawn 2008)

F816-83(2003) Standard Test Method for Combined Fine and Gross Leaks for Large Hybrid Microcircuit Packages (Withdrawn 2009)

F4-66(2005) Standard Specification for Carbonized Nickel Strip and Carbonized Nickel-Plated and Nickel-Clad Steel Strip for Electron Tubes (Withdrawn 2010)

F692-97(2002) Standard Test Method for Measuring Adhesion Strength of Solderable Films to Substrates (Withdrawn 2008)

F97-72(2002)e1 Standard Practices for Determining Hermeticity of Electron Devices by Dye Penetration (Withdrawn 2008)

F111-96(2002) Standard Practice for Determining Barium Yield, Getter Gas Content, and Getter Sorption Capacity for Barium Flash Getters (Withdrawn 2008)

F1684-06(2021) Standard Specification for Iron-Nickel and Iron-Nickel-Cobalt Alloys for Low Thermal Expansion Applications

F7-95(2021) Standard Specification for Aluminum Oxide Powder

F31-21 Standard Specification for Nickel-Chromium-Iron Sealing Alloys

F15-04(2022) Standard Specification for Iron-Nickel-Cobalt Sealing Alloy

F16-12(2022) Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps

F18-12(2022) Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices

F29-97(2022) Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications

Nuclear and Space Radiation Effects

F617-00 Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)

F769-00 Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006)

F773M-16 Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)

F744M-16 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)

F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

F1892-12(2018) Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

F1192-11(2018) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

F448-18 Standard Test Method for Measuring Steady-State Primary Photocurrent

F1893-18 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

F1467-18 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

F1190-18 Standard Guide for Neutron Irradiation of Unbiased Electronic Components

F996-11(2018) Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics

F1263-11(2019) Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

F1259M-96(2003) Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] (Withdrawn 2009)

F616M-96(2003) Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric) (Withdrawn 2009)

F1261M-96(2003) Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric] (Withdrawn 2009)

F1260M-96(2003) Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009)

F1262M-14 Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

F676-97(2003) Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)

F615M-95(2013) Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric) (Withdrawn 2022)

F528-99(2005) Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011)

Printed Electronics

F2073-14 Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch

F1996-14 Standard Test Method for Silver Migration for Membrane Switch Circuitry

F1596-15 Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity

F2360-08(2015)e1 Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source

F1661-09(2015) Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch

F1842-15 Standard Test Method for Determining Ink or Coating Adhesion on Flexible Substrates for a Membrane Switch or Printed Electronic Device

F1812-15 Standard Test Method for Determining the Effect of an ESD Discharge on a Membrane Switch or Printed Electronic Device

F1663-15 Standard Test Method for Determining the Capacitance of a Membrane Switch or Printed Electronic Device

F3147-15 Standard Test Method for Evaluating the Reliability of Surface Mounted Device (SMD) Joints on a Flexible Circuit by a Rolling Mandrel Bend

F2749-15 Standard Test Method for Determining the Effects of Creasing a Membrane Switch or Printed Electronic Device

F1843-15 Standard Practice for Sample Preparation of Plastic Films used on Membrane Switch Overlays for Specular Gloss Measurements

F2114-02 Standard Guide for ASTM Standard Test Methods, Standard Practices, and Typical Values of a Membrane Switch (Withdrawn 2009)

F1662-16 Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch or Printed Electronic Device

F1896-16 Test Method for Determining the Electrical Resistivity of a Printed Conductive Material

F2592-16 Standard Test Method for Measuring the Force-Displacement of a Membrane Switch

F2771-10(2016) Standard Test Method for Determining the Luminance Curve of an Electroluminescent Lamp at Ambient Conditions

F2750-16 Standard Test Method for Determining the Effects of Bending a Membrane Switch or Printed Electronic Device

F3152-16 Standard Test Method for Determining Abrasion Resistance of Inks and Coatings on Substrates Using Dry or Wet Abrasive Medium

F3291-17 Standard Test Method for Measuring the Force-Resistance of a Membrane Force Sensor

F3290-17 Standard Guide for Handling and Application of a Membrane Switch or Printed Electronic Device to its Final Support Structure

F2187-02(2019) Standard Test Method for Determining the Effect of Random Frequency Vibration on a Membrane Switch or Membrane Switch Assembly

F2112-02(2019) Standard Terminology for Membrane Switches

F2866-11(2019) Standard Test Method for Flammability of a Membrane Switch in Defined Assembly

F2359-04(2019) Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source

F2188-02(2019) Standard Test Method for Determining the Effect of Variable Frequency Vibration on a Membrane Switch or Membrane Switch Assembly

F1762-14 Standard Test Method for Determining the Effects of Atmospheric Pressure Variation on a Membrane Switch

F1681-14 Standard Test Method for Determining Current Carrying Capacity of a Membrane Switch Circuit

F1683-09 Standard Practice for Creasing or Bending a Membrane Switch, Membrane Switch Flex Tail Assembly or Membrane Switch Component (Withdrawn 2018)

F1895-14 Standard Test Method for Submersion of a Membrane Switch

F1682-02 Standard Test Method for Determining Travel of a Membrane Switch (Withdrawn 2008)

F1578-07(2014) Standard Test Method for Contact Closure Cycling of a Membrane Switch

F1997-07 Standard Test Method for Determining the Sensitivity (Teasing) of a Tactile Membrane Switch (Withdrawn 2008)

F1570-01e1 Standard Test Method for Determining the Tactile Ratio of a Membrane Switch (Withdrawn 2007)

F1680-07a(2014) Standard Test Method for Determining Circuit Resistance of a Membrane Switch

F2357-10 Standard Test Method for Determining the Abrasion Resistance of Inks and Coatings on Membrane Switches Using the Norman Tool "RCA" Abrader (Withdrawn 2017)

F1598-95(2014) Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)

F2072-14 Standard Test Method for Hosedown of a Membrane Switch

F1597-02 Standard Test Method for Determining the Actuation Force and Contact Force of a Membrane Switch (Withdrawn 2008)

F1689-05(2020) Standard Test Method for Determining the Insulation Resistance of a Membrane Switch

F2964-12(2020) Standard Test Method for Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device

F1595-00(2020) Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches

F1995-13(2021) Standard Test Method for Determining the Shear Strength of the Bond between a Surface Mount Device (SMD) and Substrate in a Membrane Switch

F2865-13(2021) Standard Guide for Classifying the Degrees of Ingress of Dust and Water into a Membrane Switch

Sputter Metallization

F2086-01 Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets, Method 2 (Withdrawn 2007)

F1711-96(2016) Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method

F1593-08(2016) Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer

F1709-97(2016) Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications

F1710-08(2016) Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer

F1845-08(2016) Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer

F1844-97(2016) Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage

F3192-16 Standard Specification for High-Purity Copper Sputtering Target Used for Through-Silicon Vias (TSV) Mettalization

F3166-16 Standard Specification for High-Purity Titanium Sputtering Target Used for Through-Silicon Vias (TSV) Metallization

F1512-94(2011) Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies (Withdrawn 2020)

F2113-01(2011) Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications (Withdrawn 2020)

F1367-98(2011) Standard Specification for Chromium Sputtering Targets for Thin Film Applications (Withdrawn 2020)

F390-11 Standard Test Method for Sheet Resistance of Thin Metallic Films With a Collinear Four-Probe Array (Withdrawn 2020)

F1238-95(2011) Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications (Withdrawn 2020)

F2405-04(2011) Standard Test Method for Trace Metallic Impurities in High Purity Copper by High-Mass-Resolution Glow Discharge Mass Spectrometer (Withdrawn 2020)

F1761-00(2011) Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets (Withdrawn 2020)

F1594-95(2011) Standard Specification for Pure Aluminum (Unalloyed) Source Material for Vacuum Coating Applications (Withdrawn 2020)

F1894-98(2011) Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness (Withdrawn 2020)

F1513-99(2011) Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications (Withdrawn 2020)

Terminology

F2576-15a Standard Terminology Relating to Declarable Substances in Materials

Test Methods

F3139-15 Standard Test Method for Analysis of Tin-Based Solder Alloys for Minor and Trace Elements Using Inductively Coupled Plasma Atomic Emission Spectrometry

F2853-10(2015) Standard Test Method for Determination of Lead in Paint Layers and Similar Coatings or in Substrates and Homogenous Materials by Energy Dispersive X-Ray Fluorescence Spectrometry Using Multiple Monochromatic Excitation Beams

F3078-15 Standard Test Method for Identification and Quantification of Lead in Paint and Similar Coating Materials using Energy Dispersive X-ray Fluorescence Spectrometry (EDXRF)

F2617-15 Standard Test Method for Identification and Quantification of Chromium, Bromine, Cadmium, Mercury, and Lead in Polymeric Material Using Energy Dispersive X-ray Spectrometry

F2980-13(2017) Standard Test Method for Analysis of Heavy Metals in Glass by Field Portable X-Ray Fluorescence (XRF)