F01.11 Jurisdiction Page

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Subcommittee F01.11 on Nuclear and Space Radiation Effects

Matching Standards Under the Jurisdiction of F01.11 by Status

Active 11 matching standards

F448-18 Standard Test Method for Measuring Steady-State Primary Photocurrent
F744M-16 Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
F773M-16 Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)
F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
F996-11(2018) Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics
F1190-18 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
F1192-11(2018) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
F1263-11(2019) Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
F1467-18 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
F1892-12(2018) Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
F1893-18 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

Withdrawn, Replaced 16 matching standards

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