Journal Published Online: 26 October 2015
Volume 44, Issue 5

Development of an Optimal Design for Conforming Run Length Sampling Methods in the Presence of Inspection Errors

CODEN: JTEVAB

Abstract

In this research, a new sampling system was introduced based on the concept of conforming run length. The inspection error was considered in the proposed model as well. This methodology was based on Markov modeling and a negative binomial distribution. The proposed sampling system was compared with classical sampling methods such as the Dodge-Romig single sampling plan based on average outgoing quality limit (AOQL) in the presence of inspection errors. The superiority of the proposed method for larger values of lot sizes and process average was denoted using a comparison study.

Author Information

Yazdi, Ahmad
Yazd Univ., Yazd, IR
Fallah Nezhad, Mohammad
Yazd Univ., Yazd, IR
Shishebori, Davood
Yazd Univ., Yazd, IR
Mostafaeipour, Ali
Yazd Univ., Yazd, IR
Pages: 7
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Stock #: JTE20140478
ISSN: 0090-3973
DOI: 10.1520/JTE20140478