Journal Published Online: 10 October 2014
Volume 43, Issue 6

Assessing True TFT-LCD Process Quality in the Presence of Unavoidable Measurement Errors



The rapid growth of the thin-film-transistor–liquid crystal-display (TFT-LCD) market has led to a highly competitive environment for TFT-LCD suppliers. Therefore, it is very important for TFT-LCD suppliers to seek high-quality technology. In this paper, we adopt the index Cpp to measure the critical quality of TFT-LCD products. However, the existent method for assessing true Cpp value assumes zero gauge measurement errors. This assumption does not reflect reality, despite the use of modern and highly sophisticated measuring instruments. Because measurement errors may result in unreliable decisions, this study proposes the concept of generalized pivotal quantities (GPQs) to construct generalized confidence intervals (GCIs) for Cpp, with consideration for measurement errors. Simulations show that the proposed method is effective for large measurement errors. Therefore, this method is reliable for a manufacturer to assess a TFT-LCD supplier's process quality. This method is also applicable to other industries.

Author Information

Liao, Mou-Yuan
Dept. of Statistics and Informatics Science, Providence Univ., Taichung, TW
Wu, Chien-Wei
Dept. of Industrial Engineering and Engineering Management, National Tsing Hua Univ., Hsinchu, TW
Lin, Chien-Hua
Dept. of Statistics and Informatics Science, Providence Univ., Taichung, TW
Pages: 8
Price: $25.00
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Stock #: JTE20140103
ISSN: 0090-3973
DOI: 10.1520/JTE20140103