Journal Published Online: 06 October 2014
Volume 43, Issue 3

Estimation of -resistance Curves for CT Specimen Based on Unloading Compliance Method and CMOD Data

CODEN: JTEVAB

Abstract

The unloading compliance method is one of the most widely used methods in laboratory testing for J-resistance estimation. A specimen configuration including compact tension (CT) is recommended by almost all the standard test procedures for evaluating fracture toughness, such as ASTM E1820-11, ISO 12135-2002, and GB/T 21143-2007. In the unloading compliance method, key techniques including instantaneous crack size measurement, correction of specimen rotation, and J-integral computation can be used for a CT specimen when using load line displacement (LLD) but not when using crack mouth opening displacement (CMOD) from those standard test procedures. However, a CT specimen with CMOD measurement is also used for J-resistance estimation under certain severe environments because of the convenience of measuring displacement. This study proposes a simplified linear formula for crack size calculation for a CT specimen with CMOD data, discusses the rotation correction in detail based on the equivalence of work, and develops reasonable incremental expressions for J-integral computation and a CMOD-to-LLD conversion equation. By measuring the LLD and CMOD data of a CT specimen simultaneously, we carried out experiments on J-resistance curve estimation for four different types of materials. According to the developed procedure of the unloading compliance method in this study, J-resistance curves for all materials determined from LLD and CMOD data of the CT specimen are clearly exhibited.

Author Information

Bao, Chen
School of Mechanics and Engineering, Southwest Jiaotong Univ., Chengdu, CN
Cai, Li-xun
School of Mechanics and Engineering, Southwest Jiaotong Univ., Chengdu, CN
Shi, Kai-kai
School of Mechanics and Engineering, Southwest Jiaotong Univ., Chengdu, CN
Yao, Yao
School of Mechanics and Engineering, Southwest Jiaotong Univ., Chengdu, CN
Pages: 11
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Details
Stock #: JTE20130223
ISSN: 0090-3973
DOI: 10.1520/JTE20130223