Journal Published Online: 11 December 2012
Volume 41, Issue 1

White OLED Weibull Life Prediction Using Maximum Likelihood Estimation

CODEN: JTEVAB

Abstract

A theoretical model using Weibull distribution and maximum likelihood estimation (MLE) was established to statistically analyze the test data, which were obtained by three groups of constant stress accelerated life tests. The life prediction software was applied to simplify the calculation and achieve organic light-emitting device (OLED) life estimation. The results indicate that the Weibull distribution is fit to describe white OLED life, and the precise accelerated parameter β is particularly useful to predict the white OLED life within a shorter time, which provides significant guidelines to help engineers make decisions in design and manufacturing strategy from the aspect of reliability life.

Author Information

Zhang, Jian-ping
School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai, CN
Wu, Jiong-lei
School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai, CN
Liu, Yu
Chinese Academy of Sciences, Shanghai Institute of Ceramics, Shanghai, CN
Wu, Helen
School of Engineering, Univ. of Western Sydney, Penrith, NSW, AU
Zhou, Aixi
Dept. of Engineering Technology, Univ. of North Carolina at Charlotte, NC, US
Wu, Wen-li
School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai, CN
Pages: 5
Price: $25.00
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Details
Stock #: JTE20120183
ISSN: 0090-3973
DOI: 10.1520/JTE20120183