Journal Published Online: 26 March 2013
Volume 41, Issue 3

Lifetime Prediction of White OLED Based on MLE Under Lognormal Distribution

CODEN: JTEVAB

Abstract

To predict the lifetime of a white organic light-emitting diode (OLED) and reduce test time and cost, we conducted two constant stress and one step stress accelerated lifetime tests to obtain the failure time data of samples, described the lifetime distribution of white OLED with the lognormal distribution function, estimated the log mean and log standard deviation by using maximum likelihood estimation (MLE), achieved statistics and analysis of lifetime data, and developed lifetime prediction software by ourselves. Numerical results shows that white OLED lifetime follows the lognormal distribution, that the acceleration model is consistent with inverse power law, and that the acceleration parameters, which are accurately calculated, make fast estimation of white OLED lifetime possible.

Author Information

Zhang, Jian-Ping
School of Energy and Mechanical Engineering, Shanghai Univ. of Electric Power, Shanghai, CN School of Mechanical Engineering, Shanghai Jiaotong Univ., Shanghai, CN
Li, Dong-Liang
School of Energy and Mechanical Engineering, Shanghai Univ. of Electric Power, Shanghai, CN
Wu, Wen-Li
School of Energy and Mechanical Engineering, Shanghai Univ. of Electric Power, Shanghai, CN
Wu, Helen
School of Engineering, Univ. of Western Sydney, NSW, AU
Zhu, Wen-Qing
Key Laboratory of Advanced Display and System Applications of EMC Shanghai Univ., Shanghai, CN
Pages: 5
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Stock #: JTE20120095
ISSN: 0090-3973
DOI: 10.1520/JTE20120095