Journal Published Online: 22 March 2006
Volume 34, Issue 5

Evaluation of Residual Stress in Fiber-Textured Films by X-ray Diffraction



The X-ray method is used extensively to determine the residual stress in bulk or thin film materials on the assumptions that the material is composed of fine crystals with random orientation and the stress state is biaxial and homogeneous through the X-ray penetrating region. But the method cannot be used in textured films due to oscillations in ε -sin2 Ψ relation. In this paper, a new method is proposed for measuring residual stress in cubic films with any [hkl] fiber texture.

Author Information

Zhang, J-M
College of Physics and Information Technology, Shannxi Normal University, Xian, Shaanxi, PR China
Xu, K-W
State Key Laboratory for Mechanical Behavior of Materials. Xian Jiaotong University, Xian, Shaanxi, PR China
Ji, V
LIM UMR 8006 ENSAM 151 bd. de L'Hôpital, Paris, France
Pages: 5
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Stock #: JTE13113
ISSN: 0090-3973
DOI: 10.1520/JTE13113