Journal Published Online: 30 March 2005
Volume 33, Issue 3

Estimation of the Uncertainty of Fe in Metallic Silicon Determined by Inductively Coupled Plasmas-Atomic Emission Spectroscopy



This practice provides information for combining standard uncertainties of Fe in metallic silicon determined by the ICP-AES method of the China Inspection and Quarantine (CIQ). The measurand Fe% is determined from other quantities p.q.r. . . through a functional relationship of the model f: Fe% = f(p.q.r . . .). The estimated standard deviation associated with the output estimate Fe%, called combined standard uncertainty and denoted by uc (Fe%), is determined from the estimated standard deviation associated with each larger input estimate (p.q.r . . .). The combined variance u2c (Fe%) can be viewed, by the sensitivity coefficients, as a sum of terms with the minor errors omitted.

Author Information

Wang, DW
Liaoning Entry-Exit Inspection and Quarantine Bureau, Dalian, PR, China
Wang, SW
The Open University of Hong Kong, Hong Kong, PR, China
Zhao, SQ
Statistics, Animal Science, Shenyang Agriculture University, Shenyang, PR, China
Pages: 5
Price: $25.00
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Stock #: JTE12061
ISSN: 0090-3973
DOI: 10.1520/JTE12061