Journal Published Online: 01 May 1981
Volume 9, Issue 3

Precision Strain Measurement at Elevated Temperatures Using a Capacitance Probe



A new type of capacitance displacement measuring system has been developed. The gage is directly attached to the specimen for measurements at elevated temperatures. This system has been successfully used in materials testing at temperatures up to 600°C with excellent repeatability and resolution in strain in the 10−6 range. Good temperature stability of the entire system is required to achieve the reported capabilities.

Author Information

Keusseyan, RL
Cornell University, Bard Hall, Ithaca, N.Y.
Li, C-Y
Cornell University, Bard Hall, Ithaca, N.Y.
Pages: 4
Price: $25.00
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Stock #: JTE11559J
ISSN: 0090-3973
DOI: 10.1520/JTE11559J