Journal Published Online: 01 November 1982
Volume 10, Issue 6

Goodness-of-Fit of the Ramberg-Osgood Analytic Stress-Strain Curve to Tensile Test Data



One form of the Ramberg-Osgood analytic approximation of the stress-strain curve, which uses the 0.2% offset yield stress as one of the three parameters, has recently been approved for inclusion in Military Standardization Handbook-5. Using the root-mean-square error as a criterion, the fit of this formulation to data from 2357 tension tests of various materials was found to be excellent. In 90% of the tests, the root-mean-square error in stress was less than 1% of the yield stress and in half the tests the error was less than 0.4% of the yield stress.

Author Information

Papirno, R
Army Materials and Mechanics Research Center, Watertown, MA
Pages: 6
Price: $25.00
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Stock #: JTE10264J
ISSN: 0090-3973
DOI: 10.1520/JTE10264J