Journal Published Online: 01 September 2000
Volume 45, Issue 5

RFLP Band Size Standards: NIST Standard Reference Material® 2390

CODEN: JFSCAS

Abstract

The procedural standard for DNA profiling developed by the U.S. advisory board on DNA quality assurance methods mandates annual confirmation of forensic DNA measurement systems against an appropriate reference material supplied by or traceable to the National Institute of Standards and Technology (NIST). NIST Standard Reference Material® (SRM®) 2390 is a suitable and appropriate standard for HaeIII restriction enzyme-based restriction fragment length polymorphism (RFLP) profiling systems. Originally issued in 1992, an among-laboratory SRM 2390 recertification study was initiated in 1997. Using data provided by the 20 state, local, or commercial forensic laboratory participants, quantitative band sizes values (expected mean values and associated bivariate tolerance intervals) are established for two different-source DNAs (female cell line K562 and healthy male “TAW”) for genetic loci D1S7, D2S44, D4S139, D5S110, D10S28, and D17S79. Methods for validating an RFLP measurement system, validating a control material or other secondary standard, and for tracing a particular set of RFLP measurements to NIST SRM 2390 are described in detail.

Author Information

Duewer, DL
Chemical and Science Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD
Richie, KL
Chemical and Science Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD
Reeder, DJ
Chemical and Science Technology Laboratory, National Institute of Standards and Technology, Gaithersburg, MD
Pages: 13
Price: $25.00
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Stock #: JFS14836J
ISSN: 0022-1198
DOI: 10.1520/JFS14836J