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E2825-18: Standard Guide for Forensic Digital Image Processing

F2926-18: Standard Guide for Selection and Operation of Vessel-mounted Camera Systems

F1467-18: Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

F1893-18: Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices

F448-18: Standard Test Method for Measuring Steady-State Primary Photocurrent

F1192-11(2018): Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

F1269-13(2018): Standard Test Methods for Destructive Shear Testing of Ball Bonds

F1892-12(2018): Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

F204-76(2018): Standard Test Method for Surface Flaws in Tungsten Seal Rod and Wire

F219-96(2018): Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps

F458-13(2018): Standard Practice for Nondestructive Pull Testing of Wire Bonds

F459-13(2018): Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds

F487-13(2018): Standard Specification for Fine Aluminum–1 % Silicon Wire for Semiconductor Lead-Bonding

F83-71(2018): Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters

F85-76(2018): Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes

F996-11(2018): Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics

F1190-18: Standard Guide for Neutron Irradiation of Unbiased Electronic Components

E746-18: Standard Practice for Determining Relative Image Quality Response of Industrial Radiographic Imaging Systems

D7782-13: Standard Practice for Determination of the 99 %/95 % Critical Level (WCL) and a Reliable Detection Estimate (WDE) Based on Within-laboratory Data

D7783-13: Standard Practice for Determination of the 99 %/95 % Critical Level (WCL) and a Reliable Detection Estimate (WDE) Based on Within-laboratory Data

E2578-07(2018): Standard Practice for Calculation of Mean Sizes/Diameters and Standard Deviations of Particle Size Distributions

E2834-12(2018): Standard Guide for Measurement of Particle Size Distribution of Nanomaterials in Suspension by Nanoparticle Tracking Analysis (NTA)

E2865-12(2018): Standard Guide for Measurement of Electrophoretic Mobility and Zeta Potential of Nanosized Biological Materials

F773M-16: Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)

F72-17: Standard Specification for Gold Wire for Semiconductor Lead Bonding

F3095-17a: Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System

F1716-96(2015): Standard Guide for Transition and Performance of Marine Software Systems Maintenance

E1165-12(2017): Standard Test Method for Measurement of Focal Spots of Industrial X-Ray Tubes by Pinhole Imaging

E2904-17: Standard Practice for Characterization and Verification of Phased Array Probes

E2153-01(2017): Standard Practice for Obtaining Bispectral Photometric Data for Evaluation of Fluorescent Color

E2152-12(2017): Standard Practice for Computing the Colors of Fluorescent Objects from Bispectral Photometric Data