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STP159320160016: Development and Validation of an Alternative Chemical Permeation Test Cell - 01 September 2016

STP1584-EB: Evaluation of Existing and New Sensor Technologies for Fatigue, Fracture and Mechanical Testing - 30 September 2015

STP1584-EB: - 30 September 2015

STP158420140053: Static and Dynamic Strain Measurement at Ambient and Elevated Temperatures Using an Extrinsic Fabry–Perot Interferometer (EFPI) Optical Strain Sensor - 30 September 2015

STP157520130173: Relative Humidity Sensors and the Solubility of Water in Lubricants - 30 October 2014

STP157120130080: Automated Real Time Correction of Motion Induced Dynamic Load Errors in the Force Readout of a Test Apparatus - 28 August 2014

STP156420120119: Hand-Portable Kinematic Viscometer - 29 November 2013

STP104254: Impact of Vacancy-Type Defects on Thermal Conductivity of β-SiC: Molecular Dynamics Versus an Analytical Approach - 01 January 2013

STP104207: Developing a Thermal Sensor for Use in the Fingers of the PyroHands Fire Test System - 01 October 2012

STP104205: Factors Influencing the Uptake Rate of Passive Adsorbent Dosimeters Used in the Man-in-Simulant-Test - 01 October 2012

STP104491: Development of Ultrasonic Torsional Fatigue Tester to Evaluate Rolling Bearing Steels - 01 October 2012

STP49345S: Monitoring and Blending Biofuels Using a Microfluidic Sensor - 01 January 2011

STP49289S: Creep-Fatigue Relationships in Electroactive Polymer Systems and Predicted Effects in an Actuator Design - 01 January 2011

STP1530-EB: Lead-free Solders - 01 January 2011

STP49325S: Loading Mixity on the Interfacial Failure Mode in Lead-Free Solder Joint - 01 January 2011

STP49326S: Ball Grid Array Lead-Free Solder Joint Strength under Monotonic Flexural Load - 01 January 2011

STP49327S: Tensile Properties of Sn-10Sb-5Cu High Temperature Lead Free Solder - 01 January 2011

STP49328S: Empirical Modeling of the Time-Dependent Structural Build-Up of Lead-Free Solder Pastes Used in the Electronics Assembly Applications - 01 January 2011

STP49329S: Rheological Characterisation and Empirical Modelling of Lead-Free Solder Pastes and Isotropic Conductive Adhesive Pastes - 01 January 2011

STP49320S: Wetting Behavior of Solders - 01 January 2011

STP49321S: A Review of Pb-Free High-Temperature Solders for Power-Semiconductor Devices: Bi-Base Composite Solder and Zn-Al Base Solder - 01 January 2011

STP49322S: Wetting Behaviour and Evolution of Microstructure of Sn-Ag-Zn Solders on Copper Substrates with Different Surface Textures - 01 January 2011

STP49323S: Solder Joint Reliability of SnBi Finished TSOPs with Alloy 42 Lead-Frame under Temperature Cycling - 01 January 2011

STP49324S: The Microstructural Aspect of the Ductile-to-Brittle Transition of Tin-Based Lead-Free Solders - 01 January 2011

STP49747S: Pilot Evaluation for Lead-Based Paint Proficiency Testing of Field Portable XRF Instruments - 01 January 2011

STP49926S: Recent Developments in Online Oil Condition Monitoring Sensors and Alignment with ASTM Methods and Practices - 01 January 2011

STP49082S: The Practical Application of a Flatbed Scanner for Air-Void Characterization of Hardened Concrete - 01 January 2010

STP49083S: Evaluation of the Critical Air-Void System Parameters for Freeze-Thaw Resistant Ternary Concrete Using the Manual Point-Count and the Flatbed Scanner Methods - 01 January 2010

STP49061S: Using Directional Flame Thermometers for Measuring Thermal Exposure - 01 January 2010

STP49062S: Comparisons of Temperature and Heat Flux in Furnaces Controlled by Different Types of Temperature Sensors - 01 January 2010

STP49029S: Use of Fiber Optic and Electrical Resistance Sensors for Monitoring Moisture Movement in Building Stones Subjected to Simulated Climatic Conditions - 01 January 2010

STP47760S: Case History of the Use of Electronic Survey Techniques to Assess Planar Distortions in Building Facades - 01 January 2009

STP48743S: A Review of Coupled Multielectrode Array Sensors for Corrosion Monitoring and a Study on the Behaviors of the Anodic and Cathodic Electrodes - 01 January 2009

STP48749S: Performance of an Enzyme Electrode Designed for a Sulfide Monitoring Biosensor - 01 January 2009

STP48751S: Comparison of Measurements Provided by Several Corrosion Rate Meters with Modulated Confinement of the Current - 01 January 2009

STP48742S: Use of Coupled Multi-Electrode Arrays to Advance the Understanding of Selected Corrosion Phenomena - 01 January 2009

STP48835S: Electrical Arc Ignition Testing for Common Handheld Electrical Devices in Oxygen-Enriched Atmosphere - 01 January 2009

STP46577S: Internal Probe to Detect Defects from Cascades—In-situ Ion Irradiation Experiments Revisited - 01 January 2008

STP45247S: Analysis of Error in Pavement Ground Truth Indicators for Evaluating the Accuracy of Automated Image Collection and Analysis System - 01 January 2007

STP45246S: An Automatic Pavement Surface Distress Inspection System - 01 January 2007

STP45250S: Harmonization of Macrotexture Measuring Devices - 01 January 2007

STP45438S: Neutron and Photon Dosimetry at the LR-0 Reactor Using Paired Detectors - 01 January 2007

STP45469S: Fast Neutron Dosimetry and Spectrometry Using Silicon Carbide Semiconductor Detectors - 01 January 2007

STP45471S: Spent Fuel Monitoring with Silicon Carbide Semiconductor Neutron/Gamma Detectors - 01 January 2007

STP45472S: Digital Multiparameter System for Characterizing the Neutron-Gamma Field in the LR-O Experimental Reactor - 01 January 2007

STP45474S: Application of a Silicon Calorimeter in Fast Burst Reactor Environments - 01 January 2007

STP45476S: Neutron Damage in SiC Semiconductor Radiation Detectors in the GT-MHR - 01 January 2007

STP45477S: Evaluation of Diamond Detectors for Fast Neutron Fluence Measurements in WWER-1000 Surveillance Assemblies - 01 January 2007

STP37622S: Simulative Performance Test for Hot Mix Asphalt Using Asphalt Pavement Analyzer - 01 January 2006

STP37590S: Plutonium-238 Alpha-Decay Damage Study of A Glass-Bonded Sodalite Ceramic Waste Form - 01 January 2006

STP12594S: Development of Electronic Textiles to Transport Data and Power in Future U.S. Military Protective Clothing Systems - 01 January 2005

STP11664S: New Technique for Measuring Extended Viscosity Ranges — Gel Times, Pot Life, or Cure Monitoring — with Programmable Rotational Viscometers or Rheometers - 01 January 2005

STP12201S: Comparing GCL Performance Using Rigid Versus Flexible Wall Permeameters - 01 January 2004

STP10745S: Implications for the Development of Slip-Resistance Standards Arising from Rank Comparisons of Friction-Test Results Obtained Using Different Walkway-Safety Tribometers Under Various Conditions - 01 January 2003

STP10741S: Comparison of Slip Resistance Measurements between Two Tribometers Using Smooth and Grooved Neolite®-Test-Liner Test Feet - 01 January 2003

STP10773S: Fretting Wear and Fatigue in Overhead Electrical Conductor Cables - 01 January 2003

STP42145S: Measurement of Stress Distributions on Silicon IC Chips Using Piezoresistive Sensors - 01 January 2001

STP42139S: Sensing Crack Nucleation and Growth in Hard Alpha Defects Embedded in Ti-6A1-4V Alloy - 01 January 2001

STP42147S: Strain Gauges, Fiber Optic versus Electric - 01 January 2001

STP42148S: Long-Term Measurement of Local Creep Deformation by Optical Fiber Marking and Remote Monitoring - 01 January 2001

STP42140S: Use Experience With a Developmental General Purpose Non-Contacting Extensometer With High Resolution - 01 January 2001

STP13609S: Results from the NIST Round Robin Test of Fissionable Dosimeters in a Reactor Leakage Spectrum - 01 January 2001

STP10705S: Analysis of Curing Using Simultaneous Dynamic Mechanical and Dielectric Measurements - 01 January 2001

STP10985S: High Accuracy Measurement of Elastic Constants of Thin Films by Surface Brillouin Scattering - 01 January 2001

STP1413-EB: Mechanical Properties of Structural Films - 01 January 2001

STP10987S: Characterization of the Young's Modulus of CMOS Thin Films - 01 January 2001

STP10988S: Derivation of Elastic Properties of Thin Films from Measured Acoustic Velocities - 01 January 2001

STP10989S: Side-by-Side Comparison of Passive MEMS Strain Test Structures under Residual Compression - 01 January 2001

STP10977S: Cross Comparison of Direct Strength Testing Techniques on Polysilicon Films - 01 January 2001

STP10991S: Tensile Testing of Thin Films Using Electrostatic Force Grip - 01 January 2001

STP10992S: Tensile Tests of Various Thin Films - 01 January 2001

STP10995S: Determining the Strength of Brittle Thin Films for MEMS - 01 January 2001

STP10997S: Deformation and Stability of Gold/Polysilicon Layered MEMS Plate Structures Subjected to Thermal Loading - 01 January 2001

STP10998S: The Effects of Radiation on the Mechanical Properties of Polysilicon and Polydiamond Thin Films - 01 January 2001

STP10979S: Effects of Microstructure on the Strength and Fracture Toughness of Polysilicon: A Wafer Level Testing Approach - 01 January 2001

STP10976S: Surface Topology and Fatigue in Si MEMS Structures - 01 January 2001

STP10981S: Direct Tension and Fracture Toughness Testing Using the Lateral Force Capabilities of a Nanomechanical Test System - 01 January 2001

STP10983S: Integrated Platform for Testing MEMS Mechanical Properties at the Wafer Scale by the IMaP Methodology - 01 January 2001

STP14767S: Comparison of the Dynamic Cone Penetrometer with Other Tests During Subgrade and Granular Base Characterization in Minnesota - 01 January 2000

STP14768S: The Israeli Experience with the Regular and Extended Dynamic Cone Penetrometer for Pavement and Subsoil-Strength Evaluation - 01 January 2000

STP14769S: Use of Instrumented Dynamic Cone Penetrometer in Pavement Characterization - 01 January 2000

STP14775S: Pavement Characterization Using Ground Penetrating Radar: State of the Art and Current Practice - 01 January 2000

STP14777S: Use of Seismic Pavement Analyzer in Forensic Studies in Texas - 01 January 2000

STP1376-EB: Electrical Insulating Materials: International Issues - 01 January 2000

STP13487S: Application of Gate Oxide Integrity Measurements in Silicon Wafer Manufacturing - 01 January 2000

STP1382-EB: Gate Dielectric Integrity: Material, Process, and Tool Qualification - 01 January 2000

STP13488S: Silicon Substrate Related Gate Oxide Integrity at Different Oxide Thicknesses - 01 January 2000

STP13489S: Single-Wafer Gate Dielectric Technologies for Sub-0.18 μm Applications - 01 January 2000

STP13490S: High Resolution Gate Oxide Integrity (GOI) Measurement in Near-Perfect Silicon - 01 January 2000

STP13491S: Qualification of Epi Layers and Interface Properties by an Improved μ-PCD Technique - 01 January 2000

STP13481S: Ultra-Thin Film Dielectric Reliability Characterization - 01 January 2000

STP13480S: Gate Oxide Reliability Assessment and Some Connections to Oxide Integrity - 01 January 2000

STP13482S: Voltage Step Stress for 10 nm Oxides - 01 January 2000

STP13483S: Localized Charging Damage in Thin Oxides - 01 January 2000

STP13484S: Characterization of Gate Dielectrics with Mercury Gate MOS Current-Voltage Measurements - 01 January 2000

STP13485S: COCOS (Corona Oxide Characterization of Semiconductor) Metrology: Physical Principles and Applications - 01 January 2000

STP13486S: Application of Quantox Measurements to Identify Phosphorus Contamination in Silicon Wafers - 01 January 2000

STP15272S: Development and Industry Acceptance of Nuclear Gauges - 01 January 2000

STP12477S: Advances in Accelerated Weathering Instrumentation Technology Using Advanced Control Systems - 01 January 2000

STP15854S: Review Clogging Behavior by the Modified Gradient Ratio Test Device with Implanted Piezometers - 01 January 2000

STP12487S: Investigations about Oxygen Fires in Electronic Circuits of Medical Devices - 01 January 2000

STP15783S: Calibration of Acoustic Emission Transducers by a Reciprocity Method - 01 January 1999

STP1358-EB: Field Instrumentation for Soil and Rock - 01 January 1999

STP14216S: Instrumentation for Monitoring Buried Pipe Behavior During Backfilling - 01 January 1999

STP14217S: Monitoring Pavement Response and Performance Using In-Situ Instrumentation - 01 January 1999

STP14218S: Apparatus and Method for Field Calibration of Nuclear Surface Density Gauges - 01 January 1999

STP14219S: Two Weight System for Measuring Depth and Sediment in Slurry-Supported Excavations - 01 January 1999

STP14220S: A Comparison of Portable and Permanent Landfill Liner Leak Detection Systems - 01 January 1999

STP14211S: An Instrumented Geogrid Reinforced Slope in Central Italy: Field Measurements and FEM Analysis Results - 01 January 1999

STP14221S: Instrumentation of Dredge Spoil for Landfill Construction - 01 January 1999

STP14222S: Field Measurements of Frost Penetration into a Landfill Cover that uses a Paper Sludge Barrier - 01 January 1999

STP14223S: Stability Monitoring System for the Fresh Kills Landfill in New York City - 01 January 1999

STP14224S: Field Measurement of Water Contents and Densities by Nuclear Methods in Clay Deposits - 01 January 1999

STP14225S: Monitoring Preload Performance - 01 January 1999

STP14226S: Instrumentation for Slope Stability - Experience from an Urban Area - 01 January 1999

STP14227S: Remote Field Methods to Measure Frost Depth - 01 January 1999

STP14228S: Integrated Automation of the New Waddell Dam Performance Data Acquisition System - 01 January 1999

STP14229S: Using Geomatics in the Acquisition and Management of Field Data - 01 January 1999

STP14230S: Documentation of Data Collected from Field Instrumentation for Spatial Applications - 01 January 1999

STP14231S: Data Acquisition and Management for Geotechnical Instrumentation on the Central Artery/Tunnel Project - 01 January 1999

STP14232S: Data Management System for Organic Soil - 01 January 1999

STP14233S: Review of GIS Developments in Geotechnical Instrumentation on the Central Artery/Tunnel Project, Boston, Massachusetts - 01 January 1999

STP14212S: Uses of Automated Geotechnical Instrumentation Systems - 01 January 1999

STP14234S: Use of Tensiometer for In Situ Measurement of Nitrate Leaching - 01 January 1999

STP14235S: Compaction Comparison Testing Using a Modified Impact Soil Tester and Nuclear Density Gauge - 01 January 1999

STP14236S: Selecting Surface Geophysical Methods for Geological, Hydrological, Geotechnical, and Environmental Investigations: The Rationale for the ASTM Provisional Guide - 01 January 1999

STP14210S: Comparison of Horizontal Load Transfer Curves for Laterally Loaded Piles from Strain Gages and Slope Inclinometer: A Case Study - 01 January 1999

STP14237S: The Key Role of Monitoring in Controlling the Construction of the New Jubilee Line between Waterloo and Westminster, London - 01 January 1999

STP14213S: Instrumentation and Long Term Monitoring of a Soil Nailed Slope at Madeira Walk, Exmouth, UK - 01 January 1999

STP14214S: Instrumentation for Monitoring Large-Span Culverts - 01 January 1999

STP14215S: Measurement of Earth Pressures on Concrete Box Culverts under Highway Embankments - 01 January 1999

STP1340-EB: Recombination Lifetime Measurements in Silicon - 01 January 1998

STP15698S: New Developments of the Elymat Technique - 01 January 1998

STP15699S: Optimization and Control of Elymat Lifetime Measurement for Use in a Manufacturing Setting - 01 January 1998

STP15700S: Present Status of the Surface Photovoltage Method (SPV) for Measuring Minority Carrier Diffusion Length and Related Parameters - 01 January 1998

STP15701S: Non-Contact Measurements of the Minority Carrier Recombination Lifetime at the Silicon Surface - 01 January 1998

STP15702S: Monitoring of Surface Minority Carrier Lifetime Using Modulated Photocurrent - 01 January 1998

STP15703S: Non-Contact Silicon Epilayer and Subsurface Characterization with UV/mm Wave Technique - 01 January 1998

STP15704S: Canalysis of Photoconductance Decay and Surface Photovoltage Techniques: Theoretical Perspective and Experimental Evidence - 01 January 1998

STP15691S: Minority Carrier Diffusion Length Degradation in Silicon: Who is the Culprit? - 01 January 1998

STP15705S: Application and Comparison of SPV and μPCD for Iron Measurement in Silicon Wafer Manufacturing - 01 January 1998

STP15706S: Problems and Possibilities of Comparing Different Lifetime Measuring Instruments and Techniques - 01 January 1998

STP15707S: Metallic Contamination from Wafer Handling - 01 January 1998

STP15708S: The Application of Minority Carrier Lifetime Techniques in Modern CZ Silicon - 01 January 1998

STP15709S: Recombination Lifetime Variations and Defect Introduction by Rapid Thermal Processing - 01 January 1998

STP15710S: Influence of Iron and Copper on Minority Carrier Recombination Lifetime in Silicon - 01 January 1998

STP15711S: Characteristics and Evaluation Methods of Carrier Recombination Lifetimes in High-quality Silicon Wafers - 01 January 1998

STP15712S: Silicon Lifetime Degradation as a Function of Wet Chemical Cleans and Chemical Purity - 01 January 1998

STP15713S: Influence of Metal Impurities on Lifetime - 01 January 1998

STP15714S: Oxygen Precipitation Characterization Using the Elymat Technique - 01 January 1998

STP15692S: Aspects of Silicon Contamination Control by Lifetime Measurements - 01 January 1998

STP15715S: Application of Recombination Lifetime Measurements in Silicon Wafer Manufacturing - 01 January 1998

STP15716S: Spatial Nonuniformities in the Minority-Carrier Diffusion Length/Lifetime: Measurement and Implications on a Large-Area Device Performance - 01 January 1998

STP15717S: Measurement of Minority Carrier Recombination Lifetime in Silicon Wafers by Measurement of Photoconductivity Decay by Microwave Reflectance: Result of Round Robin Test - 01 January 1998

STP15718S: Results of the Lifetime Round Robins Done in the Framework of the Semi M6 Solar Silicon Standardization Task Force - 01 January 1998

STP15693S: Carrier Lifetime Measurements by Microwave Photoconductivity Decay Method - 01 January 1998

STP15694S: The Optical Excitation Effect in Transition Metal Doped CZ Silicon Wafers Revealed by the Microwave Photoconductive Decay Lifetime Measurement - 01 January 1998

STP15690S: Recombination Lifetimes in Silicon - 01 January 1998

STP15695S: Contactless Frequency Resolved Photoconductance (FR-PC) Measurement of Iron Contaminated P-Type Silicon - 01 January 1998

STP15696S: Lifetime Measured by Low Injection Level μ-PCD Technique - 01 January 1998

STP15697S: Effects of Sample Inhomogeneity and Geometry on Photoconductivity Decay - 01 January 1998

STP11804S: Laboratory Hydraulic Conductivity Testing of GCLs in Flexible-Wall Permeameters - 01 January 1997

STP13773S: Data Evaluation Methodology for High-Temperature Superconductors - 01 January 1997

STP37933S: A New Load Application System for In Vitro Study of Ligamentous Injuries to the Human Knee Joint - 01 January 1996

STP37942S: A New Electromechanical Ski Binding with Release Sensitivity to Torsion and Bending Moments Transmitted by the Leg - 01 January 1996

STP16532S: Use of Laser Extensometer for Mechanical Tests on Irradiated Materials - 01 January 1996

STP16969S: Field Measurement of the Corrosion Rate of Steel in Concrete using a Microprocessor Controlled Unit with a Monitored Guard Ring for Signal Confinement - 01 January 1996

STP37959S: A Review of EPRI Projects Since 1984 that Used Electrochemical Noise Measurement Instrumentation - 01 January 1996

STP37962S: On-Line Monitoring Using Electrochemical Noise Measurement in CO-CO2-H2O Systems - 01 January 1996

STP16574S: The Multiport Sampler: An Innovative Sampling Technology - 01 January 1996

STP16151S: Parametric Control of a Fresnel Reflecting Concentrator Outdoor Accelerated Weathering Device - 01 January 1996

STP16152S: Effects of Filter and Burner Aging on the Spectral Power Distribution of Xenon Arc Lamps - 01 January 1996

STP15551S: The Development and Evolution of the Cone Calorimeter: A Review of 12 Years of Research and Standardization - 01 January 1995

STP18187S: The Development of the Bending Beam Rheometer; Basics and Critical Evaluation of the Rheometer - 01 January 1995

STP16435S: The Effects of Configuration, Forced Convection, and Oxygen Concentration on the Flammability Behavior of Electronic Equipment - 01 January 1995

STP23908S: Two Case Histories: Field Sealed Double Ring Infiltrometer(SDRI) and Laboratory Hydraulic Conductivity Comparison Test Programs - 01 January 1994

STP1153-EB: Fatigue of Electronic Materials - 01 January 1994

STP23919S: High-Cycle Fatigue of Kovar - 01 January 1994

STP23920S: Thermal Stresses in Cooled Heat-Releasing Elements of Electronic Devices - 01 January 1994

STP23921S: Stress and Thermal Analysis of Resistance Temperature Detectors - 01 January 1994

STP23913S: Creep-Fatigue Damage Analysis of Solder Joints - 01 January 1994

STP23914S: Creep-Fatigue Interactions in Eutectic Tin-Lead Solder Alloys - 01 January 1994

STP23915S: A Unified Creep-Plasticity Theory for Solder Alloys - 01 January 1994

STP23916S: Thermomechanical and Fatigue Behavior of High-Temperature Lead and Lead-Free Solder Joints - 01 January 1994

STP23917S: A Model for Primary Creep of 63Sn-37Pb Solder - 01 January 1994

STP23918S: Test Methodologies to Perform Valid Accelerated Thermomechanical Fatigue Tests of Solder Joints - 01 January 1994

STP18158S: Radar for Pavement Thickness Evaluation - 01 January 1994

STP13207S: Low Strain Dynamic Characteristics of Soils with the Downhole Seismic Piezocone Penetrometer - 01 January 1994

STP15123S: Proton Recoil Spectroscopy 400 Meters from a Fission Neutron Source - 01 January 1994

STP15137S: Reusability of CaF2:Mn Thermoluminescence Dosimeters for Photon Irradiations at High Absorbed-Dose Levels - 01 January 1994

STP15138S: Gamma-Ray Dose Mapping in Operational CANDU Reactor Containment Areas Using MOS Dosimeters - 01 January 1994

STP15146S: Intercomparison of Neutron Test Facilities for Equivalent Damage to Electronics - 01 January 1994

STP15153S: Investigation of Laboratory Neutron Spectral Characterizations Used for the Testing of Electronic Parts - 01 January 1994

STP25077S: Fiber Optic Chemical Sensors — An Overveiw - 01 January 1993

STP25082S: Evaluation of Pipeline Leak Detection Systems - 01 January 1993

STP25072S: Error Sources in Automatic Tank Gauging System - 01 January 1993

STP25076S: Evaluation of Metal Oxide Semiconductor and Polymer Adsorption Gas Sensors as Applied to Underground Storage Tank Leak Detection - 01 January 1993

STP19264S: A Case Study: Linking an Automated Tension Testing Machine to a Laboratory Information Management System - 01 January 1993

STP19134S: Using Vibration Strip Transducers for Measuring Water Levels in Monitoring Wells - 01 January 1992

STP19136S: Deployment and Purging for In Situ Sensors in Monitoring Wells - 01 January 1992

STP19137S: A Review of Fiber Optic and Related Technologies for Environmental Sensing Applications - 01 January 1992

STP19140S: Measurement of Hydraulic Conductivity in Clay Using Push-In Piezometers - 01 January 1992

STP19122S: Vadose Zone Characterization Using Field Permeameters and Instrumentation - 01 January 1992

STP14566S: Design Parameters of a Serpentine Optical Fiber Bending Transducer for Strain Measurements in Smart Structures - 01 January 1992

STP19767S: An Automatic Pipe Corrosion Inspection System - 01 January 1992

STP19756S: Evaluation of an Atmospheric Corrosion Rate Monitor - 01 January 1992

STP19594S: Pumping Viscosity by Mini-Rotary Viscometer: Critical Aspects - 01 January 1992

STP1148-EB: Corrosion of Electronic and Magnetic Materials - 01 January 1992

STP15059S: Electrochemical and Structural Characterization of Permalloy - 01 January 1992

STP15051S: Electrical Resistance of Wires Used as a Corrosion Rate Monitor - 01 January 1992

STP15050S: Corrosion-Resistant Outdoor Electronics - 01 January 1992

STP15052S: Formation of Copper Sulfide in Moist Air-Sulfur Dioxide - 01 January 1992

STP15053S: The Effect of Conversion Coated and Plated Components on the Corrosion of Cobalt Alloy Magnetic Disks - 01 January 1992

STP15054S: Accelerated Environmental Testing of Magnetic Recording Disks - 01 January 1992

STP15055S: The Effect of Temperature, Humidity, and Silicon Content on the Oxidation of Fine Iron Particles - 01 January 1992

STP15056S: Corrosion Mechanism of Nd-Fe-B Magnets in Humid Environments - 01 January 1992

STP15057S: Corrosion of Soft Magnetic, Controlled Expansion, and Glass Sealing Alloys - 01 January 1992

STP15058S: The Influence of a Magnetic Field on Corrosion of Steel - 01 January 1992

STP23787S: Electrical Cable Fire Hazard Assessment with the Cone Calorimeter - 01 January 1992

STP24683S: Equivalent Electronic Circuits Computer Generated from Alternating-Current Impedance Data - 01 January 1992

STP14871S: Climate Driven Durability Tester - 01 January 1992

STP25466S: An Evaluation and Comparison of the Photovac Tip II and HNu PI 101 Total Organic Vapor Analyzers - 01 January 1991

STP25467S: The Automated Determination of Volatile Organic Contaminants in Ambient Air and/or Soil Gas by Gas Chromatography with Selective Detectors - 01 January 1991

STP25465S: Evaluation of a Field-Portable Supercritical Fluid Extraction Apparatus for Rapid Characterization of Contaminated Soils - 01 January 1991

STP25468S: An Advanced Autosampling System for Gas Chromatography-Mass Spectrometry - 01 January 1991

STP19104S: Monitoring of the Machining Process by Means of Acoustic Emission Sensors - 01 January 1991

STP19082S: Monitoring Electron Beam Welding Process Using Electro-Magnetic Acoustic Transducers (EMAT's) - 01 January 1991

STP19080S: The General Problems of AE Sensors - 01 January 1991

STP25067S: Deep Soil Compaction Using Vibratory Probes - 01 January 1991

STP25068S: Densification of Sand Using a Variable Frequency Vibratory Probe - 01 January 1991

STP17599S: A Gas Chromatography Detector Based on Chemiluminescence for the Determination of Pesticides - 01 January 1991

STP17602S: Evaluation of the Hanby Field Test Kit for Detection of Aromatics in Water - 01 January 1991

STP17613S: New Technology for Protozoology: Immunofluorescence and Gene Probe Technology for Detection of Parasites - 01 January 1991

STP17615S: Monitoring Microbial Pathogens and Indicator Microorganisms in Water by Using the Polymerase Chain Reaction and Gene Probes - 01 January 1991

STP17634S: A Six-Degree-of-Freedom Acoustic Transducer for Rotation and Translation Measurements Across the Knee - 01 January 1991

STP17758S: Automation of Autogenous Ignition Equipment - 01 January 1991

STP23595S: Glass Transition Determination by Thermomechanical Analysis, a Dynamic Mechanical Analyzer, and a Differential Scanning Calorimeter - 01 January 1991

STP23600S: In-Plane and Out-of-Plane Coefficient of Thermal Expansion Characterization of New High-Performance Printed Circuit Boards Using Dilatometer and Thermomechanical Analysis - 01 January 1991

STP23591S: A New Thermodilatometric Instrument for Thin Metallic Ribbons - 01 January 1991

STP1141-EB: Laser-Induced Damage in Optical Materials: 1990 - 01 January 1991

STP23618S: Photoacoustic Characterization of Surface Absorption - 01 January 1991

STP23607S: Comparison of Laser-Induced Damage of Optical Crystals from the U.S.A. and U.S.S.R. - 01 January 1991

STP23619S: Absorption Calorimetry and Laser Induced Damage Threshold Measurements of AR-Coated ZnSe and Metal Mirrors at 10.6 μm - 01 January 1991

STP23620S: The Role of Valence-Band Excitation in Laser Ablation of KCl - 01 January 1991

STP23621S: The Interaction of 1064 nm Photons with the Al2O3(110) Surface - 01 January 1991

STP23622S: Time Dependence of Laser-Induced Surface Breakdown in Fused Silica at 355 nm in the Nanosecond Regime - 01 January 1991

STP23623S: Subsurface Polishing Damage of Fused Silica: Nature and Effect on Laser Damage of Coated Surfaces - 01 January 1991

STP23608S: Effect of Ionizing Radiations and Thermal Treatment on the Infrared Transmittance of Polycrystal CsI - 01 January 1991

STP23624S: Characterization of Subsurface Damage in Glass and Metal Optics - 01 January 1991

STP23625S: Multipulse Laser-Induced Failure Prediction for Mo Metal Mirrors - 01 January 1991

STP23626S: Laser Raman Measurements of Dielectric Coatings as a Function of Temperature - 01 January 1991

STP23627S: An Understanding of the Abnormal Wavelength Effect of Overcoats - 01 January 1991

STP23628S: Applications of Pulsed Photothermal Deflection Technique in the Study of Laser-Induced Damage in Optical Coatings - 01 January 1991

STP23629S: Morphology and Laser Damage Studies by Atomic Force Microscopy of E-Beam Evaporation Deposited AR and HR Coatings - 01 January 1991

STP23630S: Optical Characterization of Damage Resistant “kilolayer” Rugate Filters - 01 January 1991

STP23631S: High Threshold HR Coatings at 1064 nm - 01 January 1991

STP23632S: Development of Damage Resistant Optics for KrF Excimer Lasers - 01 January 1991

STP23633S: Defect Enhancement of Local Electric Fields in Dielectric Films - 01 January 1991

STP23634S: Laser Conditioning and Electronic Defects of HfO2 and SiO2 Thin Films - 01 January 1991

STP23609S: Development and Implementation of MIS-36477 Laser Damage Certification of Designator Optical Components - 01 January 1991

STP23635S: Multishot Ablation of Thin Films: Sensitive Detection of Film/Substrate Transition by Shockwave Monitoring - 01 January 1991

STP23636S: Investigation of Neutral Atom and Ion Emission During Laser Conditioning of Multilayer HfO2-SiO2 Coatings - 01 January 1991

STP23637S: A Novel Perfluorinated AR and Protective Coating for KDP and other Optical Materials - 01 January 1991

STP23605S: The Need for Laser Beam Diagnostics - 01 January 1991

STP23638S: High Laser Damage Threshold and Low Cost Sol-Gel Coated Epoxy-Replicated Mirrors - 01 January 1991

STP23639S: Fabrication and Characterisation of Microwave Plasma Assisted Chemical Vapour Deposited Dielectric Coatings - 01 January 1991

STP23610S: A Simple High Precision Extinction Method for Measuring Refractive Index of Transparent Materials - 01 January 1991

STP23640S: Reactive Ion-Beam-Sputtering of Fluoride Coatings for the UV/VUV Range - 01 January 1991

STP23641S: Highly Damage-Resistant Reflectors for 248 nm Formed by Fluorides Multilayers - 01 January 1991

STP23642S: Laser-Induced Damage of Diamond Films - 01 January 1991

STP23643S: Ion Assisted Deposition of Graded Index Silicon Oxynitride Coatings - 01 January 1991

STP23644S: Correlation of Surface Topography and Coating Damage with Changes in the Responsivity of Silicon PIN Photodiodes - 01 January 1991

STP23645S: The Effects of Polishing Materials on the Laser Damage Threshold of Optical Coatings - 01 January 1991

STP23611S: An Interferometric Technique for the Concurrent Determination of Thermo-optic and Thermal Expansion Coefficients - 01 January 1991

STP23646S: Physics of Multishot Laser Damage to Optical Materials - 01 January 1991

STP23647S: Closed-Form Onset Threshold Analysis of Defect-Driven Surface and Bulk Laser Damage - 01 January 1991

STP23648S: Finite Element Analysis of the Transient Behavior of Optical Components under Irradiation - 01 January 1991

STP23649S: Dispersion of n2 in Solids - 01 January 1991

STP23650S: Damage Resistant Optics for a Mega-Joule Solid-State Laser - 01 January 1991

STP23651S: Thermal Analysis of Multifacet-Mirror Ring Resonator for XUV Free-Electron Lasers - 01 January 1991

STP23612S: Thermal Transport Properties of Optical Thin Films - 01 January 1991

STP23652S: Determination of SBS Induced Damage Limits in Large Fused Silica Optics for Intense, Time-Varying Laser Pulses - 01 January 1991

STP23653S: Monte Carlo Calculations of Laser-Induced Free Electron Heating in SiO2 - 01 January 1991

STP23654S: Thermal Stress Modeling for Diamond-Coated Optical Windows - 01 January 1991

STP23655S: Contributions of π' Bonding to the Nonlinear Optical Properties of Inorganic Polymers - 01 January 1991

STP23656S: Correlation Between the Laser-Induced Breakdown Threshold in Solids, Liquids, and Gases - 01 January 1991

STP23657S: Damage to InAs Surface from Long Pulse 10.6μm Laser Radiation - 01 January 1991

STP23658S: Effect of Polarization on Two Color Laser-Induced Damage - 01 January 1991

STP23659S: Two Photon Absorption Calculations in HgCdTe - 01 January 1991

STP23660S: Excimer Laser Optics - 01 January 1991

STP23613S: Refractive Index Measurement Capabilities at the National Institute of Standards and Technology - 01 January 1991

STP23614S: High-Power Transmission Through Step-Index, Multimode Fibers - 01 January 1991

STP23615S: Use of Dome (Meniscus) Lenses to Eliminate Birefringence and Tensile Stresses in Spatial Filters for the Nova Laser - 01 January 1991

STP23616S: Ion Beam Milling of Fused Silica for Window Fabrication - 01 January 1991

STP23617S: Ion-Exchange Strengthening of High Average Power Phosphate Laser Glass - 01 January 1991

STP23606S: Multiple-Pulse Damage of BK-7 Glass - 01 January 1991

STP39187S: Erosion-Corrosion Measuring Devices - 01 January 1990

STP39194S: A Study of Large Sets of ASTM G 84 Time-of-Wetness Sensors - 01 January 1990

STP23326S: Use of Two Heat Flow Transducers for Transient Thermal Measurements on Porous Insulating Materials - 01 January 1990

STP23341S: High-Temperature Calorimeter Performance Variable Study - 01 January 1990

STP23342S: An Automated High-Temperature Guarded-Hot-Plate Apparatus for Measuring Apparent Thermal Conductivity of Insulations Between 300 and 750 K - 01 January 1990

STP23343S: On the Thermal Insulation of Outdoor Electronic Cabinets - 01 January 1990

STP23356S: A Closed-Loop Calibration Procedure for a British Pendulum Tester - 01 January 1990

STP23359S: New-Generation Skid Testers for the 1990s - 01 January 1990

STP23361S: The Development of a Simple Instrument for Measuring Pavement Roughness and Predicting Pavement Rideability - 01 January 1990

STP23362S: Equipment and Methods for Assessing Surface Characteristics of a Road Network - 01 January 1990

STP23370S: Use of the Inertial Profilometer to Calibrate the Commonwealth of Kentucky Department of Highways' Mays Ride Meter Systems - 01 January 1990

STP17193S: Measurement of HCl in Flue Gas by Infrared Spectroscopy with the Spectran 677 Infrared HCl Monitoring System - 01 January 1990

STP23395S: Tensiometers—Theory, Construction, and Use - 01 January 1990

STP23433S: Measurements of CTOD and CTOA Around Surface-Crack Perimeters and Relationships Between Elastic and Elastic-Plastic CTOD Values - 01 January 1990

STP18954S: Canister-Based Samplers for Volatile Organics - 01 January 1990

STP25316S: Case History: Use of the Cone Penetrometer to Calculate the Settlement of a Chemically Stabilized Landfill - 01 January 1990

STP25317S: Monitoring Landfill Movements Using Precise Instruments - 01 January 1990

STP25416S: Optical and Electronic Limitations of the Forward-Scattering Spectrometer Probe - 01 January 1990

STP25418S: Characterization of Aerial Spray Nozzles with Laser Light-Scattering and Imaging Probes and Flash Photography - 01 January 1990

STP25420S: Sensitivity Assessment of a Phase-Doppler Interferometer to User-Controlled Settings - 01 January 1990

STP25425S: Experimental Investigation of a Fan Spray Using Laser Diffraction and Phase-Doppler Instruments - 01 January 1990

STP25410S: A Multiple Drop-Size Drop Generator for Calibration of a Phase-Doppler Particle Analyzer - 01 January 1990

STP25413S: Small-Droplet Spray Measurements with a Scattered-Light Scanner - 01 January 1990

STP25414S: A Laser Small-Angle Scattering Instrument for the Determination of Size and Concentration Distributions in Sprays - 01 January 1990

STP17235S: Subseabed Disposal Project Experiment: Piezometer Probe Measurement Technology - 01 January 1990

STP17238S: Pore Pressure Response to Probe Insertion and Thermal Gradient: ISIMU-II - 01 January 1990

STP17228S: The Use of REMOTS® Imaging Technology for Disposal Site Selection and Monitoring - 01 January 1990

STP17229S: The Use of Fiber Optic Sensors for In-Situ Chemical Measurements in the Ocean - 01 January 1990

STP26557S: Photovoltaic Single-Ply Roofing Membranes - 01 January 1990

STP1117-EB: Laser Induced Damage in Optical Materials: 1989 - 01 January 1990

STP26471S: Optical Characterization of Transparent Materials Using Ellipsometry - 01 January 1990

STP26480S: Laser-Induced Damage to Silicon Photosensor Arrays - 01 January 1990

STP26481S: Sensitive n2 Measurements Using a Single Beam - 01 January 1990

STP26482S: Optical Breakdown in Particle Suspension - 01 January 1990

STP26483S: Annealing of Induced Damage in Fluoride Glass Components - 01 January 1990

STP26484S: The Effect of Laser Annealing on Laser Induced Damage Threshold - 01 January 1990

STP26485S: Shockwave Detection, An Efficient Way to Determine Multiple-Pulse Damage Thresholds - 01 January 1990

STP26486S: Application of the Ronchi Ruling Beam Profiling Method to Axially Symmetric Laser Beams - 01 January 1990

STP26469S: Laser Induced Damage in Optical Materials - 01 January 1990

STP26487S: Prediction of Laser Induced Damage by Comparison of Laser Fluence Profile to Damage Spot Radius - 01 January 1990

STP26488S: IR Laser Beam Profiling Using Quenched Fluorescence - 01 January 1990

STP26489S: Laser-Induced Failure in Biased Silicon Avalanche Photodiodes - 01 January 1990

STP26490S: The Effect of Subsurface Defects on “Incipient” (Below Threshold) Laser Damage Nucleation in Fused Silica Optical Flats - 01 January 1990

STP26491S: Quantitative Analysis of Surface Trace Metal Contamination on Substrates and Films by TXRF - 01 January 1990

STP26492S: An Error Analysis of the Wyko TOPO Noncontact Surface Profiler - 01 January 1990

STP26493S: Ultra-Precision Grinding of LHG-8 Laser Glass and Laser Damage Thresholds - 01 January 1990

STP26494S: Low Scatter Surfaces on Silicon Carbide - 01 January 1990

STP26472S: Microindentation as a Technique for Assessing Subsurface Damage in Optics - 01 January 1990

STP26495S: Physical Limits on Ultra-High Albedo Diffuse Reflectors - 01 January 1990

STP26496S: Optical Damage on SiO2 Cavity Mirrors Produced by High-Power VUV Laser Irradiation - 01 January 1990

STP26497S: Damage Assessment and Possible Damage Mechanisms to 1-Meter Diameter Nova Turning Mirrors - 01 January 1990

STP26498S: Thermal Transport Studies of Optical Coatings, Interfaces and Surfaces by Thermal Diffusion Wave Interferometry - 01 January 1990

STP26499S: Investigation of Thin Films Using Total Internal Reflection Microscopy - 01 January 1990

STP26500S: Scattering Characterization of Materials in Thin Film Form - 01 January 1990

STP26501S: Optical Properties and Laser Damage Measurements of Inorganic Polymer Films - 01 January 1990

STP26502S: Interfacial Stability in Optical Coatings - 01 January 1990

STP26503S: Surface Analytical Methods for the Assessment of Damage in Optical Thin Films - 01 January 1990

STP26504S: Laser Conditioning of Optical Thin Films - 01 January 1990

STP26505S: Large Area Laser Conditioning of Dielectric Thin Film Mirrors - 01 January 1990

STP26506S: Population Distribution of Conditioned Damage Thresholds on AR Coated BK-7 Glass with Varying Laser Spot Size - 01 January 1990

STP26473S: Automated Damage Testing Facility for Excimer Laser Optics - 01 January 1990

STP26507S: Damage Threshold Measurements of Reflective and Transmissive Optics at 130 nm - 01 January 1990

STP26508S: Laser Induced Damage Thresholds of Dielectric Coatings at 193 nm and Correlations to Optical Constants and Process Parameters - 01 January 1990

STP26509S: Angular Dependence of Thin-Film Dielectric Coating Damage Thresholds Revisited - 01 January 1990

STP26510S: Pulse-Width Dependence of Optical Coating Damage at 1052 nm - 01 January 1990

STP26511S: Damage Resistant Optical Coatings Prepared Using High Temperature, Plasma Chemical-Vapor-Deposition - 01 January 1990

STP26512S: A High Temperature, Plasma-Assisted Chemical Vapor Deposition System - 01 January 1990

STP26513S: The Evolution of Molecular Beam Deposition (MBD) from Laboratory to Production Usage - 01 January 1990

STP26514S: Investigation and Modelling of Laser Damage Properties of Fabry-Perot Filters - 01 January 1990

STP26474S: Expanded Damage Test Facilities at LLNL - 01 January 1990

STP26515S: High Damage Threshold AlO.OH-SiO2 HR Coatings Prepared by the Sol-Gel Process - 01 January 1990

STP26516S: 1-on-1 And n-on-1 Laser Strength of Binder Aided ZrO2 and ZrO2-SiO2 Reflective Sol-Gel Coatings - 01 January 1990

STP26517S: Structural Modification of D2O/H2O-Dosed CaF2 Optical Thin Films - 01 January 1990

STP26518S: Non-Avalanche Dielectric Breakdown in Wide-Band-Gap Insulators at DC and Optical Frequencies - 01 January 1990

STP26519S: UV Seeding of IR Laser Induced Damage - 01 January 1990

STP26520S: Measurements of UV Induced Absorption in Dielectric Coatings - 01 January 1990

STP26521S: The Response of Multilayer Dielectric Coatings to Low Fluence Ultraviolet Light Exposure - 01 January 1990

STP26522S: Radiation Damage in Single Crystal CsI(Tl) and Polycrystal CsI - 01 January 1990

STP26523S: Effects of Thermal Conductivity and Index of Refraction Variation on the Inclusion Dominated Model of Laser-Induced Damage - 01 January 1990

STP26524S: Theoretical Determination of the Nonlinear Optical Properties of Inorganic Polymers - 01 January 1990

STP26475S: Laser Damage Database at 1064 nm - 01 January 1990

STP26525S: Relation Between n2 and Two-Photon Absorption - 01 January 1990

STP26526S: Photoconductivity of ZnS and ZnSe - 01 January 1990

STP26527S: Formation of a Pregiven Reflecting Surface Topography by Elastic Deformation of the Mirror Substrate. New Concept of Adaptive Optical System - 01 January 1990

STP26528S: Application of Ultrasonic Capillary Effect in Elements of Power Optics Cooled by Means of a Heat Pipe - 01 January 1990

STP26476S: Damage Measurements on Optical Materials for Use in High-Peak-Power Lasers - 01 January 1990

STP26477S: Laser Induced Damage to Thallium Arsenic Selenide (TAS) - 01 January 1990

STP26478S: Laser Induced Damage in Schott's OG-550 Optical Absorption Glass - 01 January 1990

STP26479S: Effects of Laser Damage Processes on Microwave Propagation - 01 January 1990

STP26470S: A Set of Standard Definitions for Laser Damage Parameters and Procedures - 01 January 1990

STP10077S: Neutron Sensitivity of LiF Chip Gamma Dosimeters at Megagray Doses - 01 January 1989

STP10078S: High Absorbed Dose (104 to 108 Gy) Gamma Dosimeters Based on Organic Conductors:Tests Performed in the Irradiation Plant of Reactor Osiris - 01 January 1989

STP10128S: Correction of Burn-In Effects in Fission Neutron Dosimeters - 01 January 1989

STP19802S: Application of Ground-Penetrating Radar and Infrared Thermography to Pavement Evaluation - 01 January 1989

STP19798S: Reliability Testing of Seven Nondestructive Pavement Testing Devices - 01 January 1989

STP19824S: The Use of Falling Weight Deflectometer Data in Monitoring Flexible Pavement Systems - 01 January 1989

STP19828S: Stress Dependency of the (Sand) Subgrade Modulus by the Dead Weight of the Pavement Layers: Field Experiments with the Falling Weight Deflectometer - 01 January 1989

STP19799S: Comparison of Two Falling Weight Deflectometer Devices, Dynatest 8000 and KUAB 2M-FWD - 01 January 1989

STP19800S: The Multidepth Deflectometer (MDD) System for Determining the Effective Elastic Moduli of Pavement Layers - 01 January 1989

STP19801S: Using the Multidepth Deflectometer to Verify Modulus Backcalculation Procedures - 01 January 1989

STP22879S: Development of a Liquid Release Tester - 01 January 1989

STP22895S: Field Testing of Waste Forms Using Lysimeters - 01 January 1989

STP22941S: Emergency Spill Control in Semiconductor Manufacture - 01 January 1989

STP22962S: Electric Field Probes for Quantitative Moisture Measurements in Building Materials - 01 January 1989

STP24600S: Investigation into Thermal Conductivity of Composite Materials for Electronics Packaging - 01 January 1989

STP25255S: Protocol for Field Tests of Ultrasonic Devices for Rodent Management - 01 January 1989

STP22999S: Development of ASTM Standard Test Methods for Measuring Engine Oil Viscosity Using Rotational Viscometers at High-Temperature and High-Shear Rates - 01 January 1989

STP23000S: Development of an ASTM Standard Test Method for Measuring Engine Oil Viscosity Using Capillary Viscometers at High-Temperature and High-Shear Rates - 01 January 1989

STP26457S: Calibrating Light Imaging and Light Scattering Probes for Atomizer Spray Characterization - 01 January 1989

STP26033S: High Dose Arsenic Implant for Bipolar Buried Layers - 01 January 1989

STP990-EB: Semiconductor Fabrication: Technology and Metrology - 01 January 1989

STP26034S: Accurate Junction-Depth Measurements Using Chemical Staining - 01 January 1989

STP26035S: Use of Polysilicon Deposition in a Cold-Wall LPCVD Reactor to Determine Wafer Temperature Uniformity - 01 January 1989

STP26036S: Dry Etching Techniques for MMIC Fabrication on GaAs - 01 January 1989

STP26037S: Dry Etching of Ion Implanted Silicon: Electrical Effects - 01 January 1989

STP26038S: Reaction Mechanisms and Rate Limitations in Dry Etching of Silicon Dioxide with Anhydrous Hydrogen Fluoride - 01 January 1989

STP26026S: Silicon Slice Fracture Analysis - 01 January 1989

STP26039S: Plasma Etching of Aluminum Alloys in BCL3/CL2 Plasmas - 01 January 1989

STP26040S: NBS Submicron Particle Standards for Microcontamination Measurement - 01 January 1989

STP26041S: Particulate Cleanliness Testing of Filters and Equipment in Process Fluids - 01 January 1989

STP26042S: Parameters Controlling Counting Efficiency for Optical Liquid-Borne Particle Counters - 01 January 1989

STP26043S: A Correlation Study of Aluminum Film Wet Etch Uniformity with the Sputter Etch of Oxide Films - 01 January 1989

STP26044S: Crack Free and Highly Reliable Double Level Metallization Process Using Plasma Oxide and Silanol-Type Sog Layers - 01 January 1989

STP26045S: VLSI Defect Detection, Classification, and Reduction from In-Process and Post-Process Sram Inspections - 01 January 1989

STP26046S: Advanced VLSI Isolation Technologies - 01 January 1989

STP26047S: Application of Total Reflection X-Ray Fluorescence Analysis for Metallic Trace Impurities on Silicon Wafer Surfaces - 01 January 1989

STP26027S: Characterization of High Growth Rate Epitaxial Silicon from a New Single Wafer Reactor - 01 January 1989

STP26048S: Chemical Analysis of Metallic Impurity on the Surface of Silicon Wafers - 01 January 1989

STP26049S: Process - Induced Influence on the Minority — Carrier Lifetime in Power Devices - 01 January 1989

STP26050S: The Role of Oxygen Precipitates in the Gettering of Iron in Silicon - 01 January 1989

STP26051S: The Calibration and Reproducibility of Oxygen Concentration in Silicon Measurements using Sims Characterization Technique - 01 January 1989

STP26052S: Defect, Dopant, and Device Modification using Si(Ge,B) Epitaxy - 01 January 1989

STP26053S: Effect of Pre- and Post-Epitaxial Annealing on Oxygen Precipitation and Internal Gettering in N/N+(100) Epitaxial Wafers - 01 January 1989

STP26054S: Electrical Characterization of Electrically Active Surface Contaminants by Epitaxial Encapsulation - 01 January 1989

STP26055S: Optimum Polysilicon Deposition on Wafer Backs for Gettering Purposes - 01 January 1989

STP26056S: Modification of Control Charts for Use in an Integrated Circuit Fabrication Environment - 01 January 1989

STP26057S: Perkin-Elmer 544 Overlay Evaluation Using Statistical Techniques - 01 January 1989

STP26028S: Softening of Si and GaAs During Thermal Process - 01 January 1989

STP26058S: Revolutionizing Semiconductor Material Specifications - 01 January 1989

STP26059S: Economic Impact of Standards on Productivity in the Semiconductor Industry - 01 January 1989

STP26029S: Nucleation and Growth Kinetics of Bulk Microdefects in Heavily Doped Epitaxial Silicon Wafers - 01 January 1989

STP26030S: On the Application of Calibration Data to Spreading Resistance Analysis - 01 January 1989

STP26025S: The Effect of a Rotational Magnetic Field on MCZ Crystal Growing - 01 January 1989

STP26031S: Epitaxial Silicon Quality Improvement by Automatic Surface Inspection - 01 January 1989

STP26032S: Spreading Resistance Profiles in Gallium Arsenide - 01 January 1989

STP19694S: Use of Analytical Fluorescence with Fiber Optics - 01 January 1988

STP19687S: Multicomponent Detection and Determination of Polycyclic Aromatic Hydrocarbons Using HPLC and a Phase-Modulation Spectrofluorometer - 01 January 1988

STP19688S: Photochemical Reaction Detection in HPLC - 01 January 1988

STP1015-EB: Laser Induced Damage in Optical Materials: 1985 - 01 January 1988

STP18731S: Improvement of The Bulk Laser Damage Threshold of Potassium Dihydrogen Phosphate Crystals by Ultraviolet Irradiation - 01 January 1988

STP18732S: Laser-Induced Damage in Doped and Undoped Fluorozirconate Glass - 01 January 1988

STP18733S: Platinum Particles in the Nd:doped Disks of Phosphate Glass in the Nova Laser - 01 January 1988

STP18734S: Evolution During Multiple-Shot Irradiation of Damage Surrounding Isolated Platinum Inclusions in Phosphate Laser Glasses - 01 January 1988

STP18718S: Computer-Controlled Facility for Laser Switching and Damage Testing - 01 January 1988

STP18735S: Multiple Pulse Damage Studies of BK-7, KCl and SiO2 at 532 nm - 01 January 1988

STP18736S: Picosecond Nonlinear Investigation of Accumulated Damage in Molecular Crystals - 01 January 1988

STP18737S: Laser Photoconductivity in Alkali Halides - 01 January 1988

STP18739S: Ion Exchange Strengthening of Nd Doped Phosphate Laser Glass - 01 January 1988

STP18740S: Infra-Red Absorption Spectroscopy of Nd:YAG and Nd:GSGG Surface Contaminants - 01 January 1988

STP18741S: Excimer Radiation Colouration Processes and Surface Damage to Single Crystal CaF2 Substrates - 01 January 1988

STP18743S: Laser Induced Damage and Ion Emission of GaAs at 1.06 μm - 01 January 1988

STP18716S: Laser-Induced Damage in Optical Materials Seventeenth ASTM Symposium October 28–30, 1985 - 01 January 1988

STP18745S: CO2 Laser Induced Damage to Germanium: Relation to Surface Preparation - 01 January 1988

STP18746S: Study of Mo, Au, and Ni Implanted Molybdenum Laser Mirrors By Spectroscopic Ellipsometry - 01 January 1988

STP18748S: Glancing Incidence Absorption Measurements of Metal Mirrors - 01 January 1988

STP18750S: N-on-1 Damage Testing of Single Crystal Metal Surfaces at 1.06 μm - 01 January 1988

STP18752S: Laser Induced Mo Mirror Damage for High Power CO2 Laser - 01 January 1988

STP18753S: Multifacet, Metal Mirror Design for Extreme-Ultraviolet and Soft X-Ray Free-Electron Laser Resonators - 01 January 1988

STP18754S: The Design of Optimum High Reflectivity Coatings for Grazing Angles of Incidence - 01 January 1988

STP18756S: Phase Control Design Analysis - 01 January 1988

STP18757S: Thermal Conductivity of Enhanced High Reflectors - 01 January 1988

STP18758S: Yttrium Oxide Coatings for High Power Lasers at 351 nm - 01 January 1988

STP18760S: Self-Consistent Dependence of Porosity and Refractive Index on Composition in Co-Evaporated Films - 01 January 1988

STP18761S: The Formation and Development of Nodular Defects in Optical Coatings - 01 January 1988

STP18763S: Interfacial Structure of Ion-Beam Sputter Deposited SiO2/TiO2 Coatings - 01 January 1988

STP18765S: Ion Beam Deposited Oxide Coatings - 01 January 1988

STP18766S: Properties of IAD Al2O3/SiO2 and Ta2O5/SiO2 Thin Film AR Structures - 01 January 1988

STP18719S: Damage Testing in Optics Production and Procurement - 01 January 1988

STP18768S: Ion Assisted Deposition of Optical Films on Heavy Metal Fluoride Glass Substrates - 01 January 1988

STP18720S: A Computer Automated Laser Damage Laboratory - 01 January 1988

STP18769S: Highly Damage Resistant Porous Dielectric Coating for High Power Lasers in the Ultraviolet to Near-infrared Wavelength Region - 01 January 1988

STP18770S: Ion Beam Characterization of Multi-Layer Dielectric Reflectors - 01 January 1988

STP18721S: U.V. Laser Beam Diagnostics using a Computer Controlled Video Frame Store System - 01 January 1988

STP18771S: Raman Scattering Analysis of Thin Film Coatings Using Guided Waves - 01 January 1988

STP18773S: Raman Microprobe of Laser-Induced Surface Damage Regions in TiO2 and ZrO2 Coatings - 01 January 1988

STP18774S: Probing Structural Properties of Amorphous Films With Raman Spectroscopy - 01 January 1988

STP18776S: Detection of Laser Damage by Raman Microscopy - 01 January 1988

STP18777S: Time-Resolved Temperature Determinations From Raman Scattering of TiO2 Coatings During Pulsed Laser Irradiation - 01 January 1988

STP18779S: Effect of Molecular Fluorine on the Performance of Excimer Laser Optics - 01 January 1988

STP18780S: Thresholds Measured With 350-nm Pulses at 25–100 Hz for Bare Polished Crystals of CaF2 and for Silica Sol-gel AR Coatings on Silica Substrates - 01 January 1988

STP18781S: Study of Temporal and Spatial Intensity Variations and Intracavity Damage Thresholds of Alexandrite Lasers - 01 January 1988

STP18783S: Investigation of Metal Coatings for the Free Electron Laser - 01 January 1988

STP18784S: Influence of Deposition and Post Deposition Conditions on Laser Induced Damage in Electron Beam Evaporated TiO2 and SiO2 Films - 01 January 1988

STP18786S: Dependence of Damage Threshold of Anti-Reflection Coatings on Substrate Surface Roughness - 01 January 1988

STP18787S: Correlation Between Local HeNe Scatter and Defect-Initiated Laser Damage at 2.7 μm - 01 January 1988

STP18722S: Beam Profiling Characteristics of a Sensitivity-Enhanced Silicon Vidicon System at 1.06 Microns - 01 January 1988

STP18789S: CO2 Laser Induced Damage in a Model Thin Film System: ZnS on Ge - 01 January 1988

STP18791S: Laser Induced Damage in Dense Optical Thin Films - 01 January 1988

STP18792S: Transient Absorption of Light Induced by Radiation - 01 January 1988

STP18793S: Effects of Radiation Induced Defects on Laser-Induced Breakdown in SiO2 - 01 January 1988

STP18795S: Fundamental Mechanisms Of Optical Damage In Short-Wavelength High-Power Lasers - 01 January 1988

STP18797S: Temporal Distribution of Electron and Ion Emission Caused by Laser Excitation of Optical Surfaces in Ultra-high Vacuum - 01 January 1988

STP18798S: Anomalous Absorption in Optical Coatings - 01 January 1988

STP18800S: Time of Damage and the Effect of the Pulse Repetition Frequency on the Laser Induced Damage Threshold - 01 January 1988

STP18801S: Modeling Laser Damage Caused by Platinum Inclusions in Laser Glass - 01 January 1988

STP18723S: Digital Fluence Profiling System and Software - 01 January 1988

STP18803S: CO2 Laser-Induced Air Breakdown Near Metal Mirror Surfaces - 01 January 1988

STP18724S: Simple Accurate Inversion of Knife-Edge Data from Radially Symmetric Laser Beams - 01 January 1988

STP18725S: Investigation of Optical Damage via Resonance Ionization Mass Spectrometry - 01 January 1988

STP18726S: Laser Mirror Profilometry by High-Q Interferometry - 01 January 1988

STP18727S: Design and Construction of a Single Polarizer Infrared Ellipsometer/Reflectometer for Characterization of Highly Curved Surfaces - 01 January 1988

STP18728S: Directo n2Measurement in Yttria Stabilized Cubic Zirconia - 01 January 1988

STP18729S: Measurement of Optical Damage Threshold of Wire Grid Polarizers at 10.6 μm - 01 January 1988

STP18717S: A Versatile Laser Glass Inspection and Damage Testing Facility - 01 January 1988

STP18730S: Laser Damage Studies of Several Acrylic Polymers - 01 January 1988

STP1028-EB: Laser Induced Damage in Optical Materials: 1986 - 01 January 1988

STP18543S: Sum-Frequency Generation on Dye-Coated Surfaces Using Collinear and Noncollinear Excitation Geometries - 01 January 1988

STP18544S: Thresholds for and Time Dependence of UV-Photon-Induced Desorption of Lithium Atoms from Lithium-Fluoride Single Crystals - 01 January 1988

STP18545S: Radiation Hardness of Nd:YAG and Nd:Cr:GSGG Laser Rods - 01 January 1988

STP18532S: Development of Silicophosphate Glass HAP-3 - 01 January 1988

STP18546S: The Effect of Impurities on U.V. Damage in CaF2 - 01 January 1988

STP18547S: Effect of Cleaning on the Optical Absorption of Calcium Fluoride and Fused Silica at 351 nm - 01 January 1988

STP18548S: Chemically Strengthened Slab Laser Glass with Optical Surface Quality - 01 January 1988

STP18549S: Comparison of Frequency Response Characteristics of an Optical Scatterometer and a Mechanical Profilometer - 01 January 1988

STP18550S: Ultrasmooth Sapphire Produced by Noncontact Polishing - 01 January 1988

STP18551S: Optical Damage in Epoxy Polymers by Millisecond Light Pulses - 01 January 1988

STP18533S: Development of Composite Polymer-Glass Edge Claddings for Nova Laser Disks - 01 January 1988

STP18531S: Laser-Induced Damage in Optical Materials - 01 January 1988

STP18552S: Variations with Laser Pulse Duration of the Thresholds at 350-nm and 1064-nm for Bulk Damage in Crystals of KDP - 01 January 1988

STP18553S: Production Oriented Laser Damage Testing at Hughes Aircraft Company - 01 January 1988

STP18554S: Laser Damage Testing at the Atomic Weapons Research Establishment (AWRE) - 01 January 1988

STP18555S: Temperature Effects on Laser Induced Damage and Accumulation in Silicon - 01 January 1988

STP18556S: End-Group Effects on the Wavelength Dependence of Laser-Induced Photodegradation in Bisphenol-A Polycarbonate - 01 January 1988

STP18557S: Scatter Intensity Mapping of Laser-Illuminated Coating Defects - 01 January 1988

STP18558S: Spectral Emission Studies of Optical Coating Defects - 01 January 1988

STP18559S: Photothermal Measurement of Optical Coating Thermal Transport Properties - 01 January 1988

STP18560S: Dependence of Damage Threshold of Anti-Reflection Coatings on Substrate Surface Roughness - 01 January 1988

STP18561S: Mechanical Stability and Absorptance of Metal Films - 01 January 1988

STP18562S: Highly Damage Resistant Anti-reflection Coating on the Chemically Etched Surface for High Power Lasers - 01 January 1988

STP18563S: Influence of Solution Chemistry on the Microstructure of Sol-Gel Derived Films - 01 January 1988

STP18564S: Quantification of the Magnitude and Duration of the Preconditioning Effect in AR Coated BK-7 Glass - 01 January 1988

STP18565S: Microstructural and Physico-Chemical Investigations of Dielectric Multilayers - 01 January 1988

STP18566S: An Investigation of Laser Processing of Thin Film Coatings - 01 January 1988

STP18567S: Influence of Post-deposition Treatment by UV Light and Oxygen (ozone) on 350 nm Damage Thresholds of SiO2 Films Deposited From Sols - 01 January 1988

STP18568S: Laser Induced Damage of Dielectric Phase Retardation Mirrors at 1.064 Microns - 01 January 1988

STP18569S: Amorphous Silicon for CO2 Laser Mirror Coatings - 01 January 1988

STP18570S: A Study of Thin Film Growth in the ZrO2 - SiO2 System - 01 January 1988

STP18571S: Admixture of SiO2 to Suppress TiO2 Crystallization - 01 January 1988

STP18572S: Long-Range Pulselength Scaling of 351 nm Laser Damage Thresholds - 01 January 1988

STP18573S: Time to Failure in Single Pulse Laser Induced Damage in Thin Film Optical Coatings - 01 January 1988

STP18574S: Thermal Conductivity of Dielectric Films and Correlation to Damage Threshold at 1064nm - 01 January 1988

STP18575S: Correlation of Damage Levels at 1.06μm Varying Modal Content and Irradiance History on Representative Coated Laser Optics - 01 January 1988

STP18576S: 1064 nm and 350 nm Laser Damage Thresholds of High Index Oxide Films Deposited from Organic Solutions and Sols - 01 January 1988

STP18577S: Fabrication of Fluoride Thin Films Using Ultra-High Vacuum Techniques - 01 January 1988

STP18578S: Chemical Vapor Deposition of TiO2 Thin Films at Room Temperature - 01 January 1988

STP18579S: Nondestructive Depth Profiling of Optically Transparent Films by Spectroscopic Ellipsometry - 01 January 1988

STP18580S: Application of Sol-Gel Coating to Slab Laser - 01 January 1988

STP18581S: Properties of IAD Single- and Multi-Layer Oxide Coatings - 01 January 1988

STP18582S: Comparison of the Optical Properties of some High-Index Oxide Films prepared by Ion Beam Sputter Deposition with those of Electron Beam Evaporated Films - 01 January 1988

STP18583S: An Analysis of Rugate Filter Behavior - 01 January 1988

STP18534S: Mass Spectrometric Studies of Laser Damage in Calcium Fluoride - 01 January 1988

STP18584S: Damage Thresholds of Antireflection Coatings at 790 nm - 01 January 1988

STP18585S: Photon Induced Desorption and Emission from Thin Film Dielectric Surfaces - 01 January 1988

STP18586S: The Effect of Layer Thickness Errors in the Design of Coatings with Reduced Electric Field Intensity - 01 January 1988

STP18587S: Wavelength Dependence of Laser-Induced Sputtering from the (111) Surface of BaF2 - 01 January 1988

STP18535S: CaF2: An ESCA Study - 01 January 1988

STP18588S: Layer-Dependent Laser Sputtering of BaF2 (111) - 01 January 1988

STP18589S: Impact of Thermal Blooming on Laser Damage Measurement Accuracy - 01 January 1988

STP18590S: Characterization of Calcium Fluoride Optical Surfaces - 01 January 1988

STP18591S: An Investigation of Laser Processing of Silica Surfaces - 01 January 1988

STP18592S: Spot Size Dependent Laser Materials Interactions Due to Surface Electromagnetic Waves - 01 January 1988

STP18536S: LIMA in Damage Diagnostics - 01 January 1988

STP18593S: Super-Polished Single Crystal Molybdenum Mirror for XUV ∼ X-Ray Radiation - 01 January 1988

STP18594S: Effect of Diamond Machining on Laser Damage Threshold of Germanium - 01 January 1988

STP18595S: Damage Morphologies and Cumulative Behavior of Laser Damage on Single Crystal Metal Surfaces - 01 January 1988

STP18596S: Scattering Distribution from Multilayer Mirrors -Theoretical Research of a Design for Minimum Losses - 01 January 1988

STP18597S: Initiation of Laser Induced Damage by Small Metallic Particles - 01 January 1988

STP18598S: Some Comments On: Temperature Dependent Effects In Laser Induced Damage - 01 January 1988

STP18599S: Laser Induced Damage Threshold Derived from Chaotic Electron Dynamics - 01 January 1988

STP18600S: The Mechanism of Prebreakdown Nonlinear Energy Deposition From Intense Photon Fields at 532 nm in NaCl - 01 January 1988

STP18601S: An Anomalous Absorption Model to Account for Accumulation in N-on-1 Damage in Si and GaAs - 01 January 1988

STP18602S: A Model for Probing Small Absorption Changes During Multiple Pulse Laser-Induced Damage - 01 January 1988

STP18603S: Nonlinear Absorption Initiated Avalanche Breakdown in Dielectric ZrO2 - 01 January 1988

STP18537S: Laser-Induced Damage to Titanium-Doped Sapphire Using 532 nm Wavelength Pulses of 10 ns Duration - 01 January 1988

STP18604S: An Investigation of the Possibility that Laser-Induced Color Centers are Responsible for Multiple Pulse Damage - 01 January 1988

STP18605S: Influence of Impurities and Defects on 1064 nm and 532 nm Damage in Quartz - 01 January 1988

STP18606S: Model Comparisons with Glancing Incidence Measurements of Overcoated Metal Mirrors - 01 January 1988

STP18538S: High-Energy Pulsed Laser Beam Profiling System - 01 January 1988

STP18539S: Performance Characteristics of a Beam Profiling System Consisting of Various Solid State Imaging Devices and an 8-Bit Image Processor - 01 January 1988

STP18540S: Laser-Induced Damage Detection and Assessment by Enhanced Surface Scattering - 01 January 1988

STP18541S: Thermal Properties of Optical Materials - 01 January 1988

STP18542S: Beam-Induced Spherical Aberration in Cooled CW Laser Light Transmitting Components - 01 January 1988

STP1038-EB: Laser Induced Damage in Optical Materials: 1987 - 01 January 1988

STP24408S: Recent Progress in Understanding Fundamental Mechanisms of Laser Induced Damage in Optical Polymers - 01 January 1988

STP24397S: Influence of Optical Components for Laser Processing - 01 January 1988

STP24409S: Large Scale Damage Testing in a Production Environment - 01 January 1988

STP24410S: A New Average-Power Damage Test Facility at LLNL - 01 January 1988

STP24411S: Developments in Beam Profiling with a CCD Area Array Detector - 01 January 1988

STP24412S: A Sensor for Production Oriented Damage Testing at 1.06μm - 01 January 1988

STP24413S: Mapping of Surface Defects of Optical Components by a High Speed Surface Analysis System - 01 January 1988

STP24414S: Scattered Light as a Laser Damage Diagnostic - 01 January 1988

STP24415S: The Growth and Stability of Ag Layers on Cu(110) Monitored by Second-Harmonic Generation - 01 January 1988

STP24416S: Super-Polished Silicon Carbide Mirror for XUV Radiation - 01 January 1988

STP24417S: Ultrafine Polishing of Tungsten and Molybdenum Mirrors for Co 2 Laser - 01 January 1988

STP24418S: A New Forming Technology Using Laser Damage - 01 January 1988

STP24419S: UV Light Cleaning of Silica Surfaces for Improved Laser Damage of AR Coatings - 01 January 1988

STP24421S: Laser Induced Particle Emission as a Precursor to Laser Damage - 01 January 1988

STP24398S: Materials for Aerospace/Large Optics - 01 January 1988

STP24422S: A Chemical Precursor to Optical Damage? Studies by Laser Ionization Mass Spectrometry - 01 January 1988

STP24423S: Ion Emission Kinetics of Laser Damage to Semiconductor and Dielectric Thin Film Surfaces - 01 January 1988

STP24396S: Laser Induced Damage in Optical Materials - 01 January 1988

STP24424S: Laser Induced Desorption and Second Harmonic Generation from the (111) Surface of Barium Fluoride - 01 January 1988

STP24425S: Multiphoton Absorption Near Surface Damage Thresholds of Ionic Crystals and Metals - 01 January 1988

STP24426S: Laser Fluorescence Spectroscopy of Zinc Neutrals Originating from Laser-Irradiated and Ion-Bombarded Zinc Sulfide and Zinc Surfaces - 01 January 1988

STP24399S: Production and Properties of Perrhenate-Doped Alkali Halide Crystals - 01 January 1988

STP24427S: Damage to Fused Silica Windows while Under Simultaneous Exposure to Flowing Solvents and Laser Radiation at 308 nm - 01 January 1988

STP24428S: Laser Damage Studies of Ion Beam Milled Fused Silica - 01 January 1988

STP24429S: Diamond, A Potentially New Optical Coating Material - 01 January 1988

STP24430S: Wavelength Dependence of Edge Filter Absorption - 01 January 1988

STP24431S: Minimizing Scattering in Multilayers: Technique for Searching Optimal Realization Conditions - 01 January 1988

STP24432S: A Comparison of Various Rugate Filter Designs - 01 January 1988

STP24433S: Comparative Study of Reactively Evaporated vs. Ion-Plated TiO2 Thin Films - 01 January 1988

STP24434S: Ion Assisted Deposition of Optical Thin Films at Reduced Substrate Temperature - 01 January 1988

STP24435S: Optical Properties of Low Energy Ion Assisted Deposited TiO2 Films - 01 January 1988

STP24436S: HR Coatings Prepared from Colloidal Suspensions - 01 January 1988

STP24437S: 1064 nm and 350nm Radiation Stability of Low Density ThO2-SiO2 High-Reflective Coatings Deposited from Sols - 01 January 1988

STP24400S: Solubility of Pt in Nd Phosphate Laser Glass - 01 January 1988

STP24438S: Oxide Optical Coatings Prepared by Metal-Organic Vapor Deposition - 01 January 1988

STP24439S: Deposition with Ultra-Fine Particles - 01 January 1988

STP24440S: Cluster Beam Deposition for Optical Thin Films - 01 January 1988

STP24441S: Measurement of HR Coatings Absorptance at 10.6 Microns by Mirage Effect - 01 January 1988

STP24442S: Basic Studies of Optical Coating Thermal Properties - 01 January 1988

STP24443S: Studies of the Thermal Stability of Thin Film Structures - 01 January 1988

STP24444S: Raman Studies of Inherent and Applied Stress in Thin Optical Films - 01 January 1988

STP24401S: Effect of Residual Organic Carbon in Mother Solution of Potassium Dihydrogen Phosphate on Damage Threshold of the Crystals for High Power Lasers - 01 January 1988

STP24445S: Optical Measurements of Surface Oxide Layer Formation on Metal Films - 01 January 1988

STP24446S: The Properties of Laser Annealed Dielectric Films - 01 January 1988

STP24447S: Video Image Processing of Laser-Illuminated Coating Defects - 01 January 1988

STP24448S: Operational Limits for ZnSe/ThF4 Multilayer Mirrors in the Los Alamos Free-Electron Laser Oscillator - 01 January 1988

STP24449S: Damage Threshold of Oscillator Mirrors in Mark III FEL - 01 January 1988

STP24450S: Laser Induced Damage Measurements of Free Electron Laser Optical Components - 01 January 1988

STP24451S: Database of Average-Power Damage Thresholds at 1064 nm - 01 January 1988

STP24452S: Causes of Damage in Multilayer Dielectric Coatings Exposed to High Average Power Visible Laser Radiation - 01 January 1988

STP24402S: Laser Damage on Zinc Selenide and Cadmium Telluride Using the Stanford Mark III Infrared Free Electron Laser - 01 January 1988

STP24453S: On the Role of Water in the Laser Conditioning Effect - 01 January 1988

STP24454S: Optical Coatings for High-Power Nd-Lasers - 01 January 1988

STP24455S: Pulse Length Scaling Results at 248 nm - 01 January 1988

STP24456S: Measurements of Ultra-wide Pulse Damage Thresholds of Anti-reflection Coated IR Materials at 10.6 μn - 01 January 1988

STP24457S: Sample Ranking vs. Damage Threshold Criteria in Small Spot Size Laser Damage Testing - 01 January 1988

STP24458S: Intrinsic Optical Damage in Potassium Bromide at 532 nm - 01 January 1988

STP24459S: The Discovery of Laser-Induced Intrinsic Optical Damage in Wide-Gap Materials at Visible Wavelength - 01 January 1988

STP24460S: The Laser Damage Mechanism for NaCl and KBr at 532 nm — Theoretical Predictions and Experimental Tests - 01 January 1988

STP24461S: New Data Regarding the Thermal Laser-Damage Model and the Accumulation Phenomena in Silicon - 01 January 1988

STP24462S: Observation of Two Photon Absorption Prior to Laser-Induced Damage in ZrO2 - 01 January 1988

STP24463S: Intense-Field Optical Interband Excitations in Semiconductors and Insulators - 01 January 1988

STP24464S: Behavior Studies on Dirt Spikes in Laser Discharge and Their Effects on Thyratron Operations - 01 January 1988

STP24403S: Laser Damage in Silicon Avalanche Photodiode - 01 January 1988

STP24465S: Thermal Shock: A Contributing Factor to Laser Damage in Optical Thin Films Used for High Power Continuous Wave Laser Optics - 01 January 1988

STP24466S: Reverse Thermal Wave Approximation for Temperature Transients in Optical Thin Films and Substrates — Reflective Optics for High Power Repetitive Pulsed Lasers - 01 January 1988

STP24467S: Reverse Thermal Wave Approximation for Temperature Transients in Optical Thin Fitms and Substrates Reflective Optics for High Power Continuous Wave Lasers - 01 January 1988

STP24468S: High Power Continuous Wave and Repetitive Pulsed Thermal Shock Laser Damage to Metallic Reflective Optics - 01 January 1988

STP24404S: Multiphoton Photoconductivity and Laser Induced Damage in Alkali-Halide Crystals Under Picosecond Pulses from YAG:Nd Laser and its Harmonics - 01 January 1988

STP24405S: Radiation-Induced Absorption in Fused Silica - 01 January 1988

STP24406S: Radiation Effects in Amorphous SiO2 for Windows and Mirror Substrates - 01 January 1988

STP24407S: Ultrafast Imaging of Optical Damage in PMMA - 01 January 1988

STP24491S: Low-Frequency, High-Temperature Low Cycle Fatigue of 60Sn-40Pb Solder - 01 January 1988

STP45293S: The Development of an In-Situ Sensor for Measuring the Hydrogen Content of Liquid Iron - 01 January 1988

STP45291S: Electrochemical Sensor for the Determination of Hydrogen in Metals by Potential Measurements - 01 January 1988

STP44852S: The Use of Controlled Source Audio Magnetotellurics (CSAMT) to Delineate Zones of Ground-Water Contamination—A Case History - 01 January 1988

STP44855S: Monitoring Well Construction, and Recommended Procedures for Direct Ground-Water Flow Measurements Using a Heat-Pulsing Flowmeter - 01 January 1988

STP44856S: Determining Whether Wells and Piezometers Give Water Levels or Piezometric Levels - 01 January 1988

STP44868S: Suction Lysimeter Operation at Hazardous Waste Sites - 01 January 1988

STP26171S: Efficacy Testing of an Ultrasonic Bird Repeller - 01 January 1988

STP29073S: A Stress- and Strain-Controlled Monotonic and Cyclic Loading System - 01 January 1988

STP29074S: A 300-mm-Diameter Triaxial Cell with a Double Measuring Device - 01 January 1988

STP29115S: The Cambridge True Triaxial Apparatus - 01 January 1988

STP29116S: A True Triaxial Cell for Soil and Rock - 01 January 1988

STP29117S: A True Triaxial Testing Cell - 01 January 1988

STP29118S: True Triaxial Test of Rock Under Stress and Strain Rate Control - 01 January 1988

STP29119S: A New Independent Principal Stress Control Apparatus - 01 January 1988

STP29120S: Special Stress Paths Along the Limit Surface of a Sand Specimen with the Use of a True Triaxial Apparatus - 01 January 1988

STP29071S: An Automated Triaxial Testing System - 01 January 1988

STP26194S: Comparisons of Localized Ionic Currents as Measured from 1-D and 3-D Vibrating Probes with Finite-Element Predictions for an Iron-Copper Galvanic Couple - 01 January 1988

STP26219S: Smoke and Soot Data Determinations in the Cone Calorimeter - 01 January 1988

STP34288S: Suggested Method for Spectrochemical Analysis of Portland Cement by Fusion with Lithium Tetraborate Using an X-Ray Spectrometer - 01 January 1988

STP34284S: Method for Spectrochemical Analysis of Portland Cement Using an Atomic Absorption Spectrophotometer - 01 January 1988

STP34300S: Method for Analysis of Total Sulfur as SO3 in Portland Cement and Clinker Using the LECO Sulfur Analyzer - 01 January 1988

STP26743S: Accelerating Rate Calorimeter Studies of Metal Oxide Interactions with Hydrocarbons in High-Pressure Oxygen - 01 January 1988

STP26261S: Developing a Portable Automated Biomonitoring System for Aquatic Hazard Evaluation - 01 January 1988

STP26287S: Permeation of Polymeric Materials by Chemicals: A Comparison of 25-mm and 51-mm ASTM Cells - 01 January 1988

STP26289S: Comparative Evaluation of a Smaller Version of the ASTM Permeation Test Cell Versus the Standard Cell - 01 January 1988

STP26290S: Problems in Determining Permeation Cell Equivalency - 01 January 1988

STP26301S: Selected Protective Clothing for Semiconductor Manufacture - 01 January 1988

STP26370S: Packing to Reduce Electrostatic Discharge Damage and Related Testing - 01 January 1988

STP994-EB: Current Trends in Protective Packaging of Computers and Electronic Components - 01 January 1988

STP26369S: ESD Packaging and Handling Problems—the Government Perspective of Causes and Cures - 01 January 1988

STP26371S: Flammability—A High Tech Packaging Issue - 01 January 1988

STP26372S: Predicting Minimum Cushion Thicknesses - 01 January 1988

STP26373S: Predicting Field Performance from Laboratory Testing - 01 January 1988

STP26374S: A Comparison of Three Different Cushion Test Methods - 01 January 1988

STP26402S: Compositional Analysis of Electrical Switch Contact Carriers - 01 January 1988

STP26405S: Compositional Analysis Using a New Symmetrical Microthermobalance - 01 January 1988

STP18490S: Design Considerations on Guarded and Calibrated Hot Box Apparatus - 01 January 1987

STP18504S: A Calorimeter for Determining Heat Transmission Characteristics of Windows - 01 January 1987

STP18510S: Historical Development of Large Heat Flow Meter Apparatus for Measurements of Thermal Resistance of Insulations - 01 January 1987

STP18515S: Building Component Test Development Using Module Simulators - 01 January 1987

STP23191S: A Small, Low Power Microcomputer-Based Controller for Snow Ski Bindings - 01 January 1987

STP18527S: Rheological Properties of Sulfur Asphalt Binders with Fillers Determined by the Sliding Plate Rheometer - 01 January 1987

STP19670S: Use of an Inductively Coupled Plasma Emission Spectrometer System in a Separations Process Plant Laboratory - 01 January 1987

STP19672S: Modification of an Inductively Coupled Plasma Atomic Emission Spectrometer for Analysis of Plutonium Impurities - 01 January 1987

STP19673S: Design for a Contained Inductively Coupled Plasma/D-C Arc Atomic Emission Spectrometer at the Savannah River Plant - 01 January 1987

STP19676S: Adaptation of a Beckman Spectraspan VI Spectrometer to a Plutonium Glove Box - 01 January 1987

STP25706S: Trace Gas Calibration Systems Using Permeation Devices - 01 January 1987

STP25708S: Special Calibration Systems for Reactive Gases and Other Difficult Measurements - 01 January 1987

STP25710S: Laboratory and Field Validation of Solid Sorbent Samplers - 01 January 1987

STP25712S: Detector Tubes - 01 January 1987

STP28181S: Grain Dust Probes—Calibration and Measurement - 01 January 1987

STP28184S: Testing of Electrical Equipment for Use in Class II Hazardous Locations - 01 January 1987

STP25744S: Effect of a Shallow Xenon Implantation on a Profile Measured by Spreading Resistance - 01 January 1987

STP960-EB: Emerging Semiconductor Technology - 01 January 1987

STP25745S: Measurements of Cross-Contamination Levels Produced by Ion Implanters - 01 January 1987

STP25746S: Some Aspects of Productivity of a Low Pressure CVD Reactor - 01 January 1987

STP25747S: Deposition and Properties of Ultra-Thin High Dielectric Constant Insulators - 01 January 1987

STP25748S: The Electrical Properties of MOS Transistors Fabricated with Direct Ion Beam Nitridation - 01 January 1987

STP25736S: ASTM and Semi Standards for the Semiconductor Industry - 01 January 1987

STP25749S: Rie Damage and Its Control in Silicon Processing - 01 January 1987

STP25750S: The Bonding Structure and Compositional Analysis of Plasma Enhanced and Low Pressure Chemical Vapor Deposited Silicon Dielectric Films - 01 January 1987

STP25751S: Monte Carlo Simulation of Plasma Etch Emission Endpoint - 01 January 1987

STP25752S: Profile Control of Plasma Etched Polysilicon Using Implant Doping - 01 January 1987

STP25737S: Low Temperature and Low Pressure Silicon Epitaxy by Plasma-Enhanced CVD - 01 January 1987

STP25753S: The Effects of Plasma Processing of Dielectric Layers on Gallium Arsenide Integrated Circuits - 01 January 1987

STP25754S: Quality Control and Optimization During Plasma Deposition of a-Si:H - 01 January 1987

STP25738S: Thin Silicon Epitaxial Films Deposited at Low Temperatures - 01 January 1987

STP25755S: Effects of Deep UV Radiation on Photoresist in Al Etch - 01 January 1987

STP25757S: Influence of X-Ray Exposure Conditions on Pattern Quality - 01 January 1987

STP25759S: Palladium Silicide Contact Process Development for VLSI - 01 January 1987

STP25762S: Characterization of Silicon Surface Defects by the Laser Scanning Technique - 01 January 1987

STP25765S: Damage Aspects of Ingot-to-Wafer Processing - 01 January 1987

STP25767S: Hydrogen in silicon and generation of haze on silicon surface in aging - 01 January 1987

STP25769S: Identifying Gettered Impurities in Silicon by LIMA Analysis - 01 January 1987

STP25772S: Effect of Bulk Defects in Silicon on SiO2 Film Breakdown - 01 January 1987

STP25739S: Thin Epitaxial Silicon by CVD - 01 January 1987

STP25775S: Free Carrier Absorption and Interstitial Oxygen Measurements - 01 January 1987

STP25776S: High Reliability Infrared Measurements of Oxygen and Carbon in Silicon - 01 January 1987

STP25777S: Nature of Process-Induced Si-SiO2 Defects and Their Interaction with Illumination - 01 January 1987

STP25778S: A Strategy for Reducing Variability in a Production Semiconductor Fabrication Area Using the Generation of System Moments Method - 01 January 1987

STP25779S: Computerized Yield Modeling - 01 January 1987

STP25780S: Particle and Material Control Automation System for VLSI Manufacturing - 01 January 1987

STP25781S: Semiconductor Yield Enhancement Through Particle Control - 01 January 1987

STP25782S: Particulate Control in VLSI Gases - 01 January 1987

STP25783S: Spreading Resistance Measurements — An Overview - 01 January 1987

STP25784S: Some Aspects of Spreading Resistance Profile Analysis - 01 January 1987

STP25785S: Spreading Resistance : A Comparison of Sampling Volume Correction Factors in High Resolution Quantitative Spreading Resistance - 01 January 1987

STP25740S: Effects of Gettering on Epi Quality for CMOS Technology - 01 January 1987

STP25786S: Comparison of Impurity Profiles Generated by Spreading Resistance Probe and Secondary Ion Mass Spectrometry - 01 January 1987

STP25787S: Monte Carlo Calculation of Primary Kinematic Knock-on in Sims - 01 January 1987

STP25788S: A Comparative Study of Carrier Concentration Profiling Techniques in Silicon: Spreading Resistance and Electrochemical CV - 01 January 1987

STP25790S: Analysis of Boron Profiles As Determined by Secondary Ion Mass Spectrometry, Spreading Resistance, and Process Modeling - 01 January 1987

STP25793S: Mapping Silicon Wafers by Spreading Resistance - 01 January 1987

STP25795S: Production Monitoring of 200MM Wafer Processing - 01 January 1987

STP25796S: Applications of x-ray Fluorescence Analysis to the Thin Layer on Silicon Wafers - 01 January 1987

STP25797S: Qualification of GaAs and AlGaAs by Optical and Surface Analysis Techniques - 01 January 1987

STP25798S: Wafer Fab Automation, an Integral Part of the CAM Environment - 01 January 1987

STP25741S: Silicon Epitaxial Growth on N+ Substrate for CMOS Products - 01 January 1987

STP25799S: Computer Integrated Manufacturing: The Realities and Hidden Costs of Automation - 01 January 1987

STP25801S: Industry Considerations in Determining Equipment Reliability - 01 January 1987

STP25742S: Characterization of the in Situ HCl Etch for Epitaxial Silicon - 01 January 1987

STP25735S: Silicon and Semiconductors: Partners in the Late 1980's - 01 January 1987

STP25743S: Doped Oxide Spin-On Source Diffusion - 01 January 1987

STP33007S: A Miniaturized Mechanical Testing System for Small-Scale Specimen Testing - 01 January 1986

STP17439S: An Automated Ultrasonic Data Acquisition and Evaluation System - 01 January 1986

STP17442S: Development of a Sensor for Real-Time Detection of In-plant Crevice Contaminants - 01 January 1986

STP17448S: A New Electrochemical Hydrogen Probe - 01 January 1986

STP17449S: Sensing Probes and Instruments for Electrochemical and Electrical Resistance Corrosion Monitoring - 01 January 1986

STP19311S: The Use of the Accelerating Rate Calorimeter in Oxygen Compatibility Testing - 01 January 1986

STP18366S: Practical Applications of the Particle Measuring Systems Two-Dimensional Imaging Spectrometer - 01 January 1986

STP18368S: Use of a Laser Imaging System for Agricultural Spray Analysis - 01 January 1986

STP23089S: Soil Moisture Monitoring and Sampling Probe for Underground Storage Tanks and Surface Impoundments - 01 January 1986

STP19375S: Digital Filtering of Impact Data - 01 January 1986

STP23112S: Studies of CO2 Laser Induced Damage to Infrared Optical Materials and Coatings - 01 January 1986

STP954-EB: Laser Induced Damage in Optical Materials: 1984 - 01 January 1986

STP23113S: Surface Potential as a Laser Damage Diagnostic - 01 January 1986

STP23114S: Charge Emission and Accumulation in Multiple-Pulse Damage of Silicon - 01 January 1986

STP23115S: Laser Generated Ripple Patterns on Dielectrics and Intermediate Band Gap Semiconductors - 01 January 1986

STP23116S: Surface Damage Mechanisms in Nontransparent Media - 01 January 1986

STP23117S: Picosecond-Pulse Damage Studies of Diffraction Gratings - 01 January 1986

STP23101S: Retrofit of a High Power Nd:Glass Laser System with Liquid Crystal Polarizers - 01 January 1986

STP23118S: Assessment of Optical Coatings Prepared by Molecular Beam Techniques - 01 January 1986

STP23119S: Some Recent Observations on the Properties of UHV-Deposited ZrO2 - 01 January 1986

STP23120S: Oxygen Threshold for Ion-Bean Sputter Deposited Oxide Coatings - 01 January 1986

STP23121S: Tomorrows Coatings Today — They Need Help - 01 January 1986

STP23100S: Laser-Induced Damage in Optical Materials Sixteenth ASTM Symposium October 15–17, 1984 - 01 January 1986

STP23122S: High Damage Threshold Porous Silica Antireflective Coating - 01 January 1986

STP23123S: Pulse Duration Dependence of 1064-nm Laser Damage Thresholds of Porous Silica Antireflection Coatings on Fused Silica Substrates - 01 January 1986

STP23124S: Variation of Transmittance Spectra of Porous Antireflection Coatings with Index Profile - 01 January 1986

STP23125S: Characterization of Aluminum Nitride/Aluminum Oxide Reactively Sputtered Antireflection Coatings - 01 January 1986

STP23102S: Nonlinear Rotatory Power of 90° Twisted Nematic Liquid Crystals - 01 January 1986

STP23126S: Crystallization of Titania Films by Thermal Heating - 01 January 1986

STP23127S: Time Resolved Raman Studies of Laser Induced Damage in TiO2 Optical Coatings - 01 January 1986

STP23128S: Ultraviolet Thin Film Coating Characterization - 01 January 1986

STP23129S: Effect of Overcoats on 355-nm Reflectors - 01 January 1986

STP23130S: Thermal Properties of Optical Thin Film Materials - 01 January 1986

STP23131S: Interface and Bulk Absorption of Oxide Layers and Correlation to Damage Threshold at 1.06 μm - 01 January 1986

STP23132S: Effect of Anisotropic Stress on Thin Flim Damage Thresholds - 01 January 1986

STP23103S: Picosecond Damage in Y2O3 Stabilized Cubic Zirconia - 01 January 1986

STP23133S: Design of High Power Laser Coatings for Grazing Incidence Mirrors - 01 January 1986

STP23134S: The Design of Optimum High Reflectivity Coatings for Grazing Angles of Incidence - 01 January 1986

STP23135S: Angular Dependence of Multilayer-Reflector Damage Thresholds - 01 January 1986

STP23136S: Survey of Laser Damage Thresholds for High Reflector Films at 1.315 Microns - 01 January 1986

STP23137S: Scanning Electron Microscopy Studies of Laser Damage Initiating Defects in ZnSe/ThF4 and SiH/SiO2 Multilayer Coatings - 01 January 1986

STP23138S: Single Pulse Laser Induced Damage in IR Coatings at 10.6 μm - 01 January 1986

STP23139S: Light Stripping of UV Dielectric Coatings - 01 January 1986

STP23140S: An Initial Study of: The Inclusion Model for Repetitively Pulsed Laser Damage - 01 January 1986

STP23141S: Self-Focusing in Damage Experiments Revisited - 01 January 1986

STP23104S: Pulsed Laser Induced Optical Damage Threshold In Nd:Cr:GSGG Crystal - 01 January 1986

STP23142S: Two-Photon Absorption, Nonlinear Refraction and Optical Limiting in Semiconductors - 01 January 1986

STP23105S: Laser Damage Studies of Several Methacrylate Polymeric Materials - 01 January 1986

STP23106S: Leed Analysis of Pulsed Laser Damage to Mo(100) Surfaces - 01 January 1986

STP23107S: The Effect of Defects on the Laser Damage Performance of Metal Mirror Surfaces - 01 January 1986

STP23108S: Automated Pulsed Testing Using a Scatter-Probe Damage Monitor - 01 January 1986

STP23109S: Application of a Computer-Automated IR Sensitive Camera To the Determination of Pulsed Laser Surface Damage Thresholds - 01 January 1986

STP23110S: High-Precision Damage-Resistant Multiple-Pass Ultraviolet Reflectometer - 01 January 1986

STP23111S: A Low Loss, High Power Variable Laser Attenuator - 01 January 1986

STP34193S: Elementary Thermoelectric Concepts - 01 January 1985

STP852-EB: Thermoelectricity Theory, Thermometry, Tool - 01 January 1985

STP34194S: Thermoelectricity and Heat Capacity - 01 January 1985

STP34195S: Quantum Mechanics Theories and Their Relationships - 01 January 1985

STP34198S: Standard, Low-Alloy Thermocouples - 01 January 1985

STP34190S: Introduction - 01 January 1985

STP34199S: High-Alloy Thermoelements - 01 January 1985

STP34200S: Semiconductor Thermoelements - 01 January 1985

STP34201S: Some Research Applications - 01 January 1985

STP852-EB: Thermoelectricity Theory, Thermometiy, Tool - 01 January 1985

STP34191S: The Schrödinger Wave Equation - 01 January 1985

STP34192S: Modern Theories of Solids - 01 January 1985

STP46635S: On-Slope Testing of an Instrumented Alpine Ski Boot - 01 January 1985

STP46642S: A Survey of Actively Controlled (Electronic) Snow Ski Bindings - 01 January 1985

STP33776S: Development of a Fluorescent Ultraviolet and Condensation Apparatus with a Light Energy Control System - 01 January 1985

STP30289S: An Evaluation of Results from Collocated Ambient High-Volume Samplers - 01 January 1985

STP34573S: Fixed-Wall Versus Flexible-Wall Permeameters - 01 January 1985

STP32882S: A Low-Cost Microprocessor-Based Data Acquisition and Control System for Fatigue Crack Growth Testing - 01 January 1985

STP877-EB: Automated Test Methods for Fracture and Fatigue Crack Growth - 01 January 1985

STP32883S: An Automatic Fatigue Crack Monitoring System and Its Application to Corrosion Fatigue - 01 January 1985

STP32886S: A Microprocessor-Based System for Determining Near-Threshold Fatigue Crack Growth Rates - 01 January 1985

STP32887S: Krak-Gages for Automated Fatigue Crack Growth Rate Testing: A Review - 01 January 1985

STP32889S: An Automated Fatigue Crack Growth Rate Test System - 01 January 1985

STP32890S: An Automated Method of Computer-Controlled Low-Cycle Fatigue Crack Growth Testing Using the Elastic-Plastic Parameter Cyclic J - 01 January 1985

STP32878S: An Inexpensive, Multiple-Experiment Monitoring, Recording, and Control System - 01 January 1985

STP32879S: Development of an Automated Fatigue Crack Propagation Test System - 01 January 1985

STP32877S: New Developments in Automated Materials Testing Systems - 01 January 1985

STP32902S: Present and Future Research on Guarded Hot Plate and Heat Flow Meter Apparatus - 01 January 1985

STP879-EB: Guarded Hot Plate and Heat Flow Meter Methodology - 01 January 1985

STP32903S: A Flat Insulation Tester That Uses an Unguarded Nichrome Screen Wire Heater - 01 January 1985

STP32905S: Use of a Heat Flow Meter Apparatus for Testing Loose-Fill Materials Prepared for Laboratory Testing - 01 January 1985

STP32906S: A Review of Current Commercially Available Guarded Hot Plate and Heat Flow Meter Apparatus and Instrumentation - 01 January 1985

STP32907S: Development of a Large Area Heat Flow Meter - 01 January 1985

STP32908S: Recent Developments with the Thin-Heater Thermal Conductivity Apparatus - 01 January 1985

STP32909S: Development of a Company Wide Heat Flow Meter Calibration Program Based on the National Bureau of Standards Certified Transfer Specimens - 01 January 1985

STP32910S: Field Measurements of Steady-State Thermal Transfer Properties of Insulation Systems - 01 January 1985

STP32911S: Surface Temperature Sensor Calibration: In Situ Technique - 01 January 1985

STP32898S: Thermal Conductivity Measurements with the Plate Apparatus: Influence of the Guard Ring Width on the Accuracy of Measurements - 01 January 1985

STP32899S: Error Analysis of Measuring Thermal Conductivity by Circular and One Side Heat Flow Type Guarded Hot Plate Apparatus - 01 January 1985

STP32900S: Summary of Error Analysis for the National Bureau of Standards 1016-mm Guarded Hot Plate and Considerations Regarding Systematic Error for the Heat Flow Meter Apparatus - 01 January 1985

STP32897S: Analysis of Errors in Guarded Hot Plate Measurements as Compiled by the Finite Element Method - 01 January 1985

STP39171S: A New Apparatus and Test Procedure for Running ASTM C 692 Stress Corrosion Cracking Tests - 01 January 1985

STP36332S: Expendable Doppler Penetrometer for Deep Ocean Sediment Measurements - 01 January 1985

STP36333S: A Lightweight 12-m Cone Penetrometer - 01 January 1985

STP36335S: Pressure Release Disturbance in Simulated Marine Cores as Indicated by a Laboratory Gamma-Ray Densitometer - 01 January 1985

STP36355S: A Bridge Site Investigation Using SPTs, MPMTs, and DMTs from Barges - 01 January 1985

STP36331S: In-Situ Undrained Shear Strengths and Permeabilities Derived from Piezometer Measurements - 01 January 1985

STP34594S: Simulation of Road Meters by Separate Analysis of Accelerometer and Height Sensor Data - 01 January 1985

STP32932S: Heat Flux Sensor Applications for Below-Grade Energy Studies - 01 January 1985

STP885-EB: Building Applications of Heat Flux Transducers - 01 January 1985

STP32933S: Engineering Application of Heat Flux Sensors in Buildings—Technical Note - 01 January 1985

STP32934S: Thermal Resistance Measurements with Heat Flow Sensors—Application to Spray-Applied Insulation Systems - 01 January 1985

STP32935S: Heat Flow Sensors on Walls—What Can We Learn? - 01 January 1985

STP32936S: A New Type of Heat Flowmeter for Application and Study of Insulation and Systems - 01 January 1985

STP32937S: Construction and Performance of In Situ Heat Flux Transducers - 01 January 1985

STP32938S: Calculation of Thermal Conductance Based on Measurements of Heat Flow Rates in a Flat Roof Using Heat Flux Transducers - 01 January 1985

STP32939S: Determining the U-Value of a Wall from Field Measurements of Heat Flux and Surface Temperatures - 01 January 1985

STP32940S: Applications of Heat Flux Transducers: A Select and Annotated Bibliography - 01 January 1985

STP32943S: Workshop on Roof Applications of Heat Flux Transducers - 01 January 1985

STP32926S: Heat Flux Sensor Calibration Technique - 01 January 1985

STP32927S: Modeling of Heat Flux Distortion Around Heat Flux Sensors - 01 January 1985

STP32928S: Calibration of Heat Flux Transducers - 01 January 1985

STP32929S: Research in Calibration and Application Errors of Heat Flux Sensors - 01 January 1985

STP32931S: Industrial Systems Testing Using Heat Flux Transducers - 01 January 1985

STP32925S: Engineering Application of Heat Flux Sensors in Buildings—The Sensor and Its Behavior - 01 January 1985

STP38712S: Closed-Loop Temperature Control for High-Frequency Electric-Resistance Tube and Pipe Welding Mills - 01 January 1985

STP895-EB: Applications of Radiation Thermometry - 01 January 1985

STP38713S: Recent Advances and Research Activities in Japan - 01 January 1985

STP38714S: Fiber-Optic Thermometry - 01 January 1985

STP38704S: Methods of Calibration at a National Laboratory - 01 January 1985

STP38705S: Establishing a Calibration Laboratory for Industrial Radiation Thermometry - 01 January 1985

STP38703S: Radiation Thermometry—The Measurement Problem - 01 January 1985

STP38706S: Radiation Thermometry—Status and Trends - 01 January 1985

STP38707S: Mold Temperature Measurement for Glass-Pressing Processes - 01 January 1985

STP38708S: Use of Infrared Radiation Thermometers for Temperature Control of Plastic and Paper Webs in Electric Infrared Ovens - 01 January 1985

STP38709S: Radiation Thermometry for Semiconductor Crystal Growing Furnaces - 01 January 1985

STP38710S: Thermal Imaging Systems for Measuring Temperature Distribution - 01 January 1985

STP38711S: A Review of Temperature Measurement in the Steel Reheat Furnace - 01 January 1985

STP28962S: Strengthening of Calcium Fluoride - 01 January 1985

STP911-EB: Laser Induced Damage In Optical Materials: 1983 - 01 January 1985

STP28963S: Investigation of Window Materials for Repetitively Pulsed CO2 Lasers - 01 January 1985

STP28964S: Laser Induced Bulk Damage in SiO2 at 1.064, 0.532 and 0.355 μm - 01 January 1985

STP28965S: Bulk Absorption Measurements Using Prism-Shaped Samples for Laser Calorimetry - 01 January 1985

STP28966S: Inherent Mechanical Damage in Diamond Machined Optical Surfaces - 01 January 1985

STP28967S: Optical Properties of Diamond-Machined Metal Surfaces and Their Relationship to Physical and Chemical Surface Perfection - 01 January 1985

STP28968S: The Effect of Surface Finish on the Laser-induced Damage Thresholds of Gold-coated Copper Mirrors - 01 January 1985

STP28969S: Thermally Induced Effects on the Infrared Reflectance of Metal Mirrors - 01 January 1985

STP28970S: Single-shot, Cummulative and PRF Dependent Laser Induced Damage Thresholds - 01 January 1985

STP28971S: Damage Threshold of Fused Silica at 3ωo - 01 January 1985

STP28972S: Round-Robin Testing of Low-Scatter Optics - 01 January 1985

STP28953S: Laser Induced Damage in Optical Materials Fifteenth ASTM Symposium November 14–16, 1983 - 01 January 1985

STP28973S: Light Scattering Characteristics of Some Metal Surfaces—A Smoothing Effect? - 01 January 1985

STP28974S: Light Scattering from Surfaces with Microroughness and Static Density Variations in the Bulk Dielectric Permittivity - 01 January 1985

STP28975S: Surface Finish Measurements on Low-Scatter Laser Mirrors and Roughness Standards - 01 January 1985

STP28976S: The Effects of Slope Error on the Imaging Quality of a Mirror as the Ratio of Surface Perturbation Depth to Wavelength Approaches Zero - 01 January 1985

STP28977S: 1.06 Micron Laser Damage of Thin Film Optical Coatings — a Round Robin Experiment Involving Various Pulse Lengths and Beam Diameters - 01 January 1985

STP28978S: Measurements of the Dependence of Damage Thresholds on Laser Wavelength, Pulse Duration and Film Thickness - 01 January 1985

STP28979S: A Fundamental Approach Towards Improved Optical Coatings - 01 January 1985

STP28980S: Development of RF-Sputtered Laser Coatings at Burleigh Northwest - 01 January 1985

STP28981S: Comparison of Optical Coatings Deposited by Novel Physical and Chemical Techniques - 01 January 1985

STP28982S: Optical Characterization of Low-Scatter, Plasma-Deposited Thin Films - 01 January 1985

STP28954S: Studies of Optical and Mechanical Properties of Heavy-Metal Fluoride Glasses - 01 January 1985

STP28983S: Optical Properties of Ion-Beam Sputtered TiO2 Films - 01 January 1985

STP28984S: Improvement of the Damage Threshold of High Reflectivity Multidielectric Coatings 1.06 μM - 01 January 1985

STP28985S: Phase Shift Variations on HEL Mirrors - 01 January 1985

STP28986S: A Review of UV Coating Material Properties - 01 January 1985

STP28987S: Recent Damage Results for Antireflection Coatings at 355 nm - 01 January 1985

STP28988S: Recent Damage Results on High Reflector Coatings at 355 nm - 01 January 1985

STP28989S: Alumina/Silica Multilayer Coatings for Excimer Lasers - 01 January 1985

STP28990S: Photothermal Deflection Microscopy of HR and AR Coatings - 01 January 1985

STP28991S: Laser Damage in Porous-Silica Antireflection Films - 01 January 1985

STP28992S: Defect Damage Precursors in Visible-Wavelength Mirrors - 01 January 1985

STP28993S: Characterization of Micron-Sized, Optical Coating Defects by Photothermal Deflection Microscopy - 01 January 1985

STP28994S: Experimental Observation and Computer Simulation of the Microstructure of Vapor Deposited Thin Films - 01 January 1985

STP28995S: A Wide Spectrum Antireflective Coating for Silica Optics and its Damage Resistance at 350 nm - 01 January 1985

STP28996S: Plasma Deposited Inorganic Thin Films for Optical Applications - 01 January 1985

STP28997S: Laser-Induced Emission and Laser Damage of Optical Components - 01 January 1985

STP28998S: Charge Emission and Related Precursor Events Associated with Laser Damage - 01 January 1985

STP28999S: Predamage Threshold Electron Emission from Insulator and Semiconductor Surfaces - 01 January 1985

STP29000S: Laser Induced Damage of a Thin Film With an Absorbing Inclusion: Thermal Considerations of Substrates and Absorption Profiles - 01 January 1985

STP29001S: Laser Damage Threshold Predictions Based on the Effects of Thermal and Optical Properties Employing a Spherical Impurity Model - 01 January 1985

STP29002S: “Analytical Model for Evaluating Transient, Steady-State, Coating Damage Threshold, Optical Distortion, and Axial Gradient for Externally Cooled Laser Mirrors.” - 01 January 1985

STP29003S: “A Comprehensive Analytical Theory for Unifying Pulsed and Continuous Wave Laser Damage on Metal Mirrors, Encompassing the Relationship of Small Spot to Large Spot Size Damage on Metal Mirrors.” - 01 January 1985

STP29004S: Catastrophic versus Microscopic Damage: Applicability of Laboratory Measurements to Real Systems - 01 January 1985

STP29005S: Toward Improved Accuracy in Limited-Scale Pulsed Laser Damage Testing Via the “Onset Method” - 01 January 1985

STP29006S: The Effects of Self-Focusing on Laser-Induced Breakdown - 01 January 1985

STP28955S: Optical Properties of Infrared Transmitting Glasses - 01 January 1985

STP29007S: Simple Direct Measurements of n2 - 01 January 1985

STP28956S: Optical and Mechanical Properties of Water Clear ZnS - 01 January 1985

STP29008S: Refractive Index of Ternary and Quaternary Compound Semiconductors Below the Funadmental Absorption Edge: Linear and Nonlinear Effects - 01 January 1985

STP28957S: Laser Damage in Plastics at the Frank J. Seiler Research Laboratory (FJSRL) - 01 January 1985

STP28958S: Increase in the Optical Damage Threshold of Cellulose Acetate - 01 January 1985

STP28959S: Strehl Ratio Measurements of Laser Damaged Plastics - 01 January 1985

STP28960S: Damage Thresholds of Fused Silica, Plastics and KDP Crystals Measured with 0.6-ns 355-nm Pulses - 01 January 1985

STP28961S: Strengthening CsI Crystals for Optical Applications - 01 January 1985

STP19283S: Numerical Analysis of Pressuremeter Tests by the Finite Element Method - 01 January 1985

STP950-EB: The Pressuremeter and its Marine Applications: Second International Symposium - 01 January 1985

STP19284S: Principal Stresses Derived from Self-Boring Pressuremeter Tests in Soft Clay - 01 January 1985

STP19285S: Effective Stress Analysis of Soil Response in a Pressuremeter Test - 01 January 1985

STP19286S: A Theoretical Study of Pore Pressure Generation and Dissipation Around the Pressuremeter - 01 January 1985

STP19287S: Relating Undrained Triaxial and Pressuremeter Stress-Strain Characteristics by Using Multi-Yield Surface Model Parameters - 01 January 1985

STP19288S: Interpretation of Pressuremeter Tests Using Laboratory Simulated Tests - 01 January 1985

STP19278S: The Push-in Pressuremeter: 5 Years Offshore Experience - 01 January 1985

STP19289S: Expansion of a Cylindrical Cavity in a Very Deformable Medium: A Theoretical Study - 01 January 1985

STP19290S: Analysis of the Unloading of a Pressuremeter in Sand - 01 January 1985

STP19291S: Conventional Parameters from Pressuremeter Test Data: Review of Existing Methods - 01 January 1985

STP19292S: Determination of Properties of Sand from Self-Boring Pressuremeter Tests - 01 January 1985

STP19293S: Pressuremeter Standard and Pressuremeter Parameters - 01 January 1985

STP19294S: Undrained Strength and Deformation Parameters from Pressuremeter Test Results - 01 January 1985

STP19295S: Correlations of LLT Pressuremeter, Vane, and Dutch Cone Tests in Bangkok Marine Clay, Thailand - 01 January 1985

STP19296S: Proposed Method for Application of Pressuremeter Test Results to Designing of Offshore Foundations - 01 January 1985

STP19297S: Pressuremeter and Deep Foundation Design - 01 January 1985

STP19279S: The Development of a Full Displacement Pressuremeter - 01 January 1985

STP19298S: Settlement Prediction Using the Pressuremeter - 01 January 1985

STP19299S: Analysis and Verification of Louisiana Pile Foundation Design Based on Pressuremeter Results - 01 January 1985

STP19300S: Design of Laterally Loaded Piles Using the Pressuremeter - 01 January 1985

STP19301S: Application of Pressuremeter Testing to Assess Lateral Pile Response in Clays - 01 January 1985

STP19302S: Side Friction Mobilization Rates for Laterally Loaded Piles from the Pressuremeter - 01 January 1985

STP19280S: Self-Boring Pressuremeter in Po River Sand - 01 January 1985

STP19277S: Use of PAM and Pressuremeters in Offshore Foundation Design - 01 January 1985

STP19281S: The Calibration and Use of a High Capacity Pressuremeter to Determine Rock Stiffness - 01 January 1985

STP19282S: Field Evaluation of French Self-Boring Pressuremeter Paf 76 in a Soft Deltaic Louisiana Clay - 01 January 1985

STP34467S: On-Line Ultrasonic Inside-Diameter Control System for Zircaloy Tube Etching - 01 January 1984

STP36824S: Design of Laterally Loaded Displacement Piles Using a Driven Pressuremeter - 01 January 1984

STP36815S: Laterally Loaded Piles and the Pressuremeter: Comparison of Existing Methods - 01 January 1984

STP33230S: Use of the Automatic Capillary Rheometer in Quality Control - 01 January 1984

STP32621S: An Instrumentation System to Automate the Analysis of Fuel-Spray Images Using Computer Vision - 01 January 1984

STP32624S: Comparative Measurements Using Different Particle Size Instruments - 01 January 1984

STP32614S: Investigating the Commercial Instrument Market - 01 January 1984

STP32617S: Extending the Applicability of Diffraction-Based Drop Sizing Instruments - 01 January 1984

STP32633S: Tantalum and Niobium in Some Electronic Applications - 01 January 1984

STP32647S: Dry Etching Using NF3/Ar and NF3/He Plasmas - 01 January 1984

STP850-EB: Semiconductor Processing - 01 January 1984

STP32648S: Edge-Controlled, Self-Consistent Proximity Effect Corrections - 01 January 1984

STP32649S: The Effect of Wafer Flatness on Yield by Off-Line Computer Simulation of the Photolithographic Process - 01 January 1984

STP32650S: Forms of Contamination Affecting Device Processing - 01 January 1984

STP32651S: Problems Associated with Submicrometre Contaminant Measurement - 01 January 1984

STP32652S: Point-Of-Use Ultrafiltration of Deionized Rinse Water and Effects on Microelectronics Device Quality - 01 January 1984

STP32653S: The Effects of Wafer Thermal History on the 450°C Thermal Donor Formation in Cz- Grown P(100) Silicon - 01 January 1984

STP32654S: Interaction Between Point Defects and Oxygen in Silicon - 01 January 1984

STP32641S: Process and Device Modeling for VLSI Structures - 01 January 1984

STP32655S: Effects of Oxygen on Process-Induced Defects and Gettering in Cz-Silicon - 01 January 1984

STP32656S: Precipitation Behavior of Deposited Metals in Cz-Silicon - 01 January 1984

STP32657S: Evaluation of Gettering Efficiency of Backside Damage by the Use of the “Haze” Test - 01 January 1984

STP32658S: Extrinsic Gettering Via the Controlled Introduction of Misfit Dislocations - 01 January 1984

STP32659S: The Effect of Si-SiO2 Interface on the Excess Point Defect Distribution in Silicon - 01 January 1984

STP32660S: Fracture Tracing in Semiconductor Wafers - 01 January 1984

STP32661S: A Preferential Etch for Silicon Crystals - 01 January 1984

STP32662S: Oxygen Determination in Silicon Using Fourier Transform Infrared Spectroscopy - 01 January 1984

STP32663S: A Study of the Spatial Distribution of the Oxygen Content in Silicon Wafers Using an Infrared Transmission Microscope - 01 January 1984

STP32664S: Influence of Electrically Active Impurities on IR Measurements of Interstitial Oxygen in Silicon - 01 January 1984

STP32665S: The Effects of Instrumental Artifacts on the Quantitative Determination of Oxygen in Silicon by Ftir - 01 January 1984

STP32666S: Simultaneous Determination of the Boron and Phosphorus Content in Silicate Glasses by FT-IR Spectroscopy - 01 January 1984

STP32667S: A Method to Determine the Initial Phosphorus and Boron Concentrations in Float-Zoned Polysilicon Rods - 01 January 1984

STP32668S: The Effects of RF Electromagnetic Radiation on Spreading Resistance Measurements - 01 January 1984

STP32642S: Effect of Process Conditions on Autodoping in Silicon Epitaxy - 01 January 1984

STP32669S: Dopant Profiling in Silicon - 01 January 1984

STP32670S: Comparison of Depth Profiling 10B in Silicon Using Spreading Resistance Profiling, Secondary Ion Mass Spectrometry, and Neutron Depth Profiling - 01 January 1984

STP32671S: The Ball Bond Shear Test: Its Methodology and Application - 01 January 1984

STP32672S: The Annealing and Low Temperature Aging Characteristics of Fine Diameter Wire Produced from Dilute Aluminum Alloys - 01 January 1984

STP32673S: Capacitive Microphone Tuning of Ultrasonic/Thermosonic Bonders - 01 January 1984

STP32674S: A Comparative Study of the Mechanical Properties of Bonding Wire - 01 January 1984

STP32643S: An Intrinsic Gettering Process to Improve Minority Carrier Lifetimes in Mos and Bipolar Silicon Epitaxial Technology - 01 January 1984

STP32675S: New Applications of Tape Bonding for High Lead Count Devices - 01 January 1984

STP32676S: Bumped Tape Processing and Application - 01 January 1984

STP32677S: Production and Development of Neutron Transmutation Doped Silicon - 01 January 1984

STP32678S: Production of Detector-Grade Silicon by Neutron Transmutation Doping - 01 January 1984

STP32679S: Neutron Transmutation Doping in Hydrogenated Amorphous Silicon - 01 January 1984

STP32680S: Effects of Hydrogen on Defects in Neutron Irradiated Silicon - 01 January 1984

STP32681S: Neutron Transmutation Doping of Semi-Insulating Czochralskigrown GaAs - 01 January 1984

STP32682S: Ion Channeling Study of Damage in Neutron Transmutation Doped Semiconductors: Application to GaAs - 01 January 1984

STP32683S: A New Silicon Irradiation Facility in the Pluto Mtr at Harwell - 01 January 1984

STP32684S: Equalization of Axial Neutron Flux Density for the Transmutation Doping of Silicon in a Heavy Water Reactor - 01 January 1984

STP32685S: Potential for Large-Diameter NTD Silicon Production in the Advanced Test Reactor - 01 January 1984

STP32686S: Advanced Test Reactor Ntd Silicon Production Hardware - 01 January 1984

STP32644S: Control of Gain Variations in Shallow Junction Ion Implanted Bipolar Transistors Caused by Planar Channelling - 01 January 1984

STP32645S: Ion Implantation for Deep (> 100 μm) Buried Layers - 01 January 1984

STP32646S: A Study of Strain in Ion Implanted Silicon - 01 January 1984

STP32640S: The Impact of Standards on Semiconductor Quality and Manufacturing Efficiency - 01 January 1984

STP29450S: Design of Round-Robin Tests with Guarded/Calibrated Hot Boxes, Guarded Hot Plates, and Heat Flow Meters - 01 January 1983

STP29452S: Comments on Calibration and Design of a Heat Flow Meter - 01 January 1983

STP29453S: Effect of Mounting on the Performance of Surface Heat Flow Meters Used to Evaluate Building Heat Losses - 01 January 1983

STP31777S: Analysis of Silvered Glass Reflectors Exposed to Controlled Environments - 01 January 1983

STP28519S: Design and Performance Aspects of Antilock Brake Control Systems - 01 January 1983

STP28538S: Chemorheological Characterization of B-Stage Printed Wiring Board Resins - 01 January 1983

STP37232S: Laser Damage of Crystalline Silicon by Multiple 1.06μm, Picosecond Pulses - 01 January 1983

STP799-EB: Laser Induced Damage in Optical Materials: 1981 - 01 January 1983

STP37233S: A Technique for Increasing the Optical Strength of Single-Crystal NaCl and KCl Through Temperature Cycling - 01 January 1983

STP37234S: Improving the Bulk Laser-Damage Resistance of KDP by Baking and Pulsed Laser Irradiation - 01 January 1983

STP37235S: Surface-to-Bulk Optical Absorption on Uncoated Sapphire and Zinc Selenide Using Photoacoustic Chopping Frequency Studies - 01 January 1983

STP37236S: Calorimetric Measurement of Temperature Dependent Absorption in Copper - 01 January 1983

STP37237S: Reversible and Irreversible Changes in NaCl and KCl Absorption During Multiple Pulse 10.6 μm Irradiation - 01 January 1983

STP37238S: Intensity Dependent Absorption and Laser Induced Catastrophic Damage in Diamond Turned and Mechanically Polished Cu Mirrors at 1.06 μm - 01 January 1983

STP37239S: Thermo-Optic Coefficient (∂n/∂T) of 1.3 μm Laser Window Materials - 01 January 1983

STP37240S: Polarization Sensitive Laser Calorimetry - 01 January 1983

STP37241S: Polarization Monitor For Thin Film Depositions - 01 January 1983

STP37242S: Cavity Phase Shift Method For High Reflectance Measurements - 01 January 1983

STP37223S: Laser Induced Damage in Optical Materials Thirteenth ASTM Symposium November 17–18, 1981 - 01 January 1983

STP37243S: Instrumentation of a Variable Angle Scatterometer - 01 January 1983

STP37244S: Development of Laser Mirrors of Very High Reflectivity Using the Cavity-Attenuated Phase-Shift (CAPS) Method - 01 January 1983

STP37245S: Damage Thresholds to Metal Mirrors by Short-Pulse CO2 Laser Radiation - 01 January 1983

STP37246S: Laser Damage to Metal Mirrors at Nonormal Incidence - 01 January 1983

STP37247S: Directed Energy Production of Novel Metallic Surfaces - 01 January 1983

STP37248S: The Effect of the Treatment and Ageing on KC1 Surface Breakdown Threshold - 01 January 1983

STP37249S: Surface Finishing Using Soft Abrasives - 01 January 1983

STP37250S: Effects of Deuterium Treatments on the Optical Properties of Fused Silica - 01 January 1983

STP37251S: Laser Desorption Analysis of H2O and Other Contaminants from Optical Surfaces - 01 January 1983

STP37252S: Electrostatic Technology for Control of Dust and Hydrocarbon Vapors in High Power Laser Systems - 01 January 1983

STP37253S: Laser Mirror Operation at Cryogenic Temperatures - 01 January 1983

STP37254S: Dimensional Stability of Zerodur and ULE Mirrors Undergoing Thermal Cycling - 01 January 1983

STP37255S: Thermo-Elastic Action of the Powerful High Pepetition Rate Laser Radiations on the Solid State Surface - 01 January 1983

STP37224S: Transparent Polymers as a New Class of Optical Materials for Lasers - 01 January 1983

STP37256S: The Promising Use of Some Heat Carriers in High Intensity Laser Optics - 01 January 1983

STP37257S: Laser Damage Thresholds of Thin Film Optical Coatings at 248 nm - 01 January 1983

STP37258S: Effects of Undercoats and Overcoats on Damage Thresholds of 248 nm Coatings - 01 January 1983

STP37259S: Laser Damage Results and Analyses for Ultraviolet Reflectors Under Multiple-Shot Irradiation - 01 January 1983

STP37260S: Multiple-Shot Ultraviolet Laser Damage Resistance of Nonquarterwave Reflector Designs for 248 nm - 01 January 1983

STP37261S: Degradation of Dielectric Films by XeF Excimer Intermediates - 01 January 1983

STP37262S: Pulsed D2 - F2 Chain-Laser Damage To Coated Window and Mirror Components - 01 January 1983

STP37263S: Influence of Cleaning Solvents, Sunlight, Humidity, and HF Gas on Pulsed Damage and Optical Characteristics of 3.8-μm Multilayer Coatings - 01 January 1983

STP37264S: Index, Thickness and Birefringence of Thin Films by Guided Waves - 01 January 1983

STP37225S: Survey of 1.3 μm Window Materials Continued - 01 January 1983

STP37265S: Sensitive Technique for Measuring Apparent Optical Figure Error Caused by Coating Nonuniformity - 01 January 1983

STP37266S: Limits to the Validity of Evaluating a Quarter-Wave, High-Reflectance Multilayer Through Analysis of Its Secondary Structure - 01 January 1983

STP37267S: Graded-index Antireflective Coatings for High Power Lasers Deposited by the Sol-Gel Process - 01 January 1983

STP37268S: Selective and Uniform Laser-Induced Failure of Antireflection-Coated LiNbO3 Surfaces - 01 January 1983

STP37269S: A Review of 1064-nm Damage Tests of Electron-Beam Deposited Ta2O5/SiO2 Antireflection Coatings - 01 January 1983

STP37270S: Preparation of Thin Amorphous Films by E-Beam Evaporation from Multiple Sources - 01 January 1983

STP37271S: Improved Si-Based Coating Materials for High Power Infrared Lasers - 01 January 1983

STP37272S: Hydrogenated Amorphous Silicon Films: Preparation, Characterization, Absorption, and Laser-Damage Resistance - 01 January 1983

STP37273S: Optical Properties of Hydrogenated Amorphous Carbon (a-C:H) - a Hard Coating for IR-Optical Elements - 01 January 1983

STP37274S: Studies of Diamond-Like Carbon Coatings for Protection of Optical Components - 01 January 1983

STP37275S: The Deposition of Diamondlike Carbon Thin Films on CaF2 - 01 January 1983

STP37276S: Relationship Between Coating Defects and the Limiting Flux Density a Cooled Laser Mirror Can Withstand - 01 January 1983

STP37277S: A Predictive Tool for Evaluating the Effect of Multiple Defects on the Performance of Cooled Laser Mirrors - 01 January 1983

STP37278S: Preliminary Experimental Results of Spot Size Scaling in Laser Induced Damage to Optical Coatings - 01 January 1983

STP37279S: Recent Progress in the Studies of Laser-Induced Intrinsic Damage of Transparent Solids: Deterrent Lack Effect of Seed Electrons in Avalanche Ionization Process - 01 January 1983

STP37226S: Multispectral Chemically Vapor-Deposited ZnS: An Initial Characterization - 01 January 1983

STP37280S: Quantum Theory of Multiphoton Free Carrier Absorption At High Intensities in Compound Semiconductors - 01 January 1983

STP37281S: Comment on “Intense-field Effects in Solids” - 01 January 1983

STP37227S: Progress in The Development of Multispectral Glasses Based on The Fluorides of Heavy Metals - 01 January 1983

STP37282S: Effects of Higher Order Nonlinearities on Second Order Frequency Mixing - 01 January 1983

STP37283S: The Use of Self-Focusing in the Prevention of Laser-Induced Damage - 01 January 1983

STP37284S: Nonlinear Refractive Coefficient and Self-Focusing Damage in Glasses - 01 January 1983

STP37285S: Nonlinear Absorption and Self-Defocusing of Intense IR-Laser Radiation in Semiconductors Due to Generation of Free Carriers - 01 January 1983

STP37286S: Two-and Three-Photon Absorption in Semiconductors with Subsequent Absorption by Photogenerated Carriers - 01 January 1983

STP37287S: Simple Theory of Microwave Absorption in Alkali Halides - 01 January 1983

STP37288S: Increased Breakdown Thresholds in Air by Admixing an Electronegative Gas - 01 January 1983

STP37228S: Optical Damage, Nonlinear Transmission, and Doubling Efficiency in LiIO3 - 01 January 1983

STP37229S: Studies of Laser-Produced Damage to Transparent Optical Material in the UV Region and in Crossed UV-IR Beams - 01 January 1983

STP37230S: Laser Damage Measurements at 492 nm Using a Flashlamp-Pumped Dye Laser - 01 January 1983

STP37231S: Accumulation and Laser Damage in Optical Glasses - 01 January 1983

STP35193S: Chapter 21—Complex Electronics in Clinical Therapy: Clinical Use of Cardiac Pacemakers - 01 January 1983

STP36162S: Resist Profile Quality and Linewidth Control - 01 January 1983

STP804-EB: Silicon Processing - 01 January 1983

STP36163S: Considerations of Resist Processing - 01 January 1983

STP36164S: Epitaxy: An Introspective Review - 01 January 1983

STP36165S: Modeling and Applications of Silicon Epitaxy - 01 January 1983

STP36166S: Effects of Processing Parameters on Shallow Surface Depressions During Silicon Epitaxial Deposition - 01 January 1983

STP36167S: Improvement in MOS VLSI Device Characteristics Built on Epitaxial Silicon - 01 January 1983

STP36168S: Reduced-Pressure Chemical Vapor Deposition of Polycrystalline Silicon - 01 January 1983

STP36169S: Plasma-Enhanced Chemical Vapor Deposition of Silicon and Silicon-Containing Films - 01 January 1983

STP36170S: Process Technology Requirements for VLSIC Fabrication - 01 January 1983

STP36171S: Defects and High-Pressure Steam Oxidation of Silicon - 01 January 1983

STP36172S: Hydrogen/Chlorine Distributions in Silicon Dioxide: Detection and Model - 01 January 1983

STP36157S: Large-Diameter Czochralski Silicon Crystal Growth - 01 January 1983

STP36173S: Dependence of Thin-Gate Oxide Properties on Processing - 01 January 1983

STP36174S: Polyimide-Substrate Effects During Wet Chemical Processing of Polyimide Films in VLSI - 01 January 1983

STP36175S: Modeling Anomalous Junction Formation in Silicon by the Codiffusion of Implanted Arsenic with Phosphorus - 01 January 1983

STP36176S: Silicon Crystals for VLSI Technologies - 01 January 1983

STP36177S: Material Defect Factors Affecting MOS Device Performance - 01 January 1983

STP36178S: Oxygen Precipitation Studies at Various Impurity Levels Using Thermal Donor Activation - 01 January 1983

STP36179S: Effects of Oxygen Precipitation on Minority Carrier Lifetime in Silicon Crystals - 01 January 1983

STP36180S: Defects and Carrier Lifetime in Silicon - 01 January 1983

STP36158S: Impurity Incorporation in Czochralski Silicon Grown for VLSI - 01 January 1983

STP36181S: Computer-Aided Process Modeling for Design and Process Control - 01 January 1983

STP36182S: Characterizing Process Nonuniformities on Large-Diameter Wafers: An Overview - 01 January 1983

STP36183S: Temperature-Dependent Infrared Characterization of Silicon Wafers - 01 January 1983

STP36184S: Analysis of Infrared Spectra for Oxygen Measurements in Silicon - 01 January 1983

STP36185S: Determination of Oxygen Concentration in Silicon by Infrared Absorption - 01 January 1983

STP36186S: Thickness Measurement of Thin (1.0-µm) Epitaxial Silicon Layers by Infrared Reflectance - 01 January 1983

STP36187S: Automated Detection of Wafer Surface Defects by Laser Scanning - 01 January 1983

STP36188S: Computerized Electron-Beam Linewidth Measuring and Inspection: A New Tool - 01 January 1983

STP36189S: Measurement of Ion Implantation Doses in Silicon by Ellipsometry and Spectral Reflectance - 01 January 1983

STP36159S: Dependence of Silicon Float-Zone Refining Parameters on Frequency - 01 January 1983

STP36156S: Silicon Crystal Growth and Processing Technology: A Review - 01 January 1983

STP36160S: Influence of Laser Marking on Silicon Wafer Properties - 01 January 1983

STP36161S: A Review of Optical Lithographic Techniques for VLSI - 01 January 1983

STP30554S: Oxide Films: Quantitative Sensors of Metal Fatigue - 01 January 1983

STP31870S: Correcting Emission and Excitation Spectra: A Review of Past Procedures and New Possibilities Using Silicon Photodiodes - 01 January 1983

STP33198S: Measurement of the Time-of-Wetness by Moisture Sensors and Their Calibration - 01 January 1982

STP36135S: A Ball-Rod Rolling Contact Fatigue Tester - 01 January 1982

STP36150S: Effect of Platelike Carbides Below the Rolling Surface in a Ball-Washer Thrust Rolling Contact Fatigue Tester - 01 January 1982

STP36131S: NASA Five-Ball Fatigue Tester—Over 20 Years of Research - 01 January 1982

STP30081S: Capabilities and Limitations of the Human Being as a Sensor - 01 January 1982

STP33990S: Organic Vapor Dosimeter - 01 January 1982

STP33986S: A Procedure for Determining the Validity of Data Produced by Automatic Continuous Area Monitors - 01 January 1982

STP33988S: Portable X-ray Survey Meters for In Situ Trace Element Monitoring of Air Particulates - 01 January 1982

STP33989S: PRO-TEK Organic Vapor Air Monitoring Badges - 01 January 1982

STP37001S: Internal Damage to Optical Glasses with 3 ns-Pulse Laser - 01 October 1981

STP759-EB: Laser Induced Damage In Optical Materials: 1980 - 01 October 1981

STP37002S: Development of Forging Processes for Large-Scale Deformation of Lithium Fluoride - 01 October 1981

STP37003S: Stress-Induced Birefringence, Critical Window Orientation, and Thermal Lensing Experiments - 01 October 1981

STP37004S: Survey of 1.3 μm Window Materials - 01 October 1981

STP37005S: Material Property Requirements for Laser Windows - 01 October 1981

STP37006S: A New Photographic Technique for Observing Bulk Laser Damage - 01 October 1981

STP37008S: 1.06 μm Laser-Induced Breakdown of CO2-Laser-Polished Fused SiO2 - 01 October 1981

STP37009S: Wavelength and Temperature Dependence of the Absolute Reflectance of Metals at Visible and Infrared Wavelengths - 01 October 1981

STP36993S: Laser Induced Damage in Optical Materials Twelfth ASTM Symposium September 30 — October 1, 1980 - 01 October 1981

STP37010S: Dependence of Metal Mirror Damage Thresholds on Wavelength, Material, Pulse Length, and Preparation Method - 01 October 1981

STP37011S: Regrowth in Laser Irradiated Elemental Metals and Alloys: Surface Nonuniformities and Coupling Phenomena - 01 October 1981

STP37012S: Epitaxial Regrowth and Defects in Laser Irradiated Single Crystal Ni - 01 October 1981

STP37013S: Pulsed Laser Initiation of Surface Plasma on Metal Mirrors - 01 October 1981

STP37014S: Optical Damage Limitations for Copper Mirrors Used in CO2-ICF Laser Systems - 01 October 1981

STP37015S: Absorption Calorimetry and Laser Induced Damage Threshold Measurements on Germanium and Zinc Selenide - 01 October 1981

STP37016S: Insensitivity of the Catastrophic Damage Threshold of Laser Optics to Dust and other Surface Defects - 01 October 1981

STP37017S: Multiple-Shot Laser Damage Thresholds of Ultraviolet Reflectors at 248 and 308 Nanometers - 01 October 1981

STP37018S: A Novel Technique for Investigating Impurity Initiated Short Pulse Laser Damage in Thin Films - 01 October 1981

STP37019S: Evaluation of Bichromatic Coatings Designed for Pulsed Laser Fusion Applications at 0.53 and 1.06 Micrometers - 01 October 1981

STP37020S: Survey of Damage Thresholds at 532 NM for Production-RUN optical Components - 01 October 1981

STP36994S: Infrared Wavelength Modulation Spectroscopy of Laser Window Materials - 01 October 1981

STP37021S: Laser-Induced Damage in Antireflection Coatings for LiNbO3 Crystals - 01 October 1981

STP37022S: Multithreshold HF/DF Pulsed Laser Damage Measurements on Evaporated and Sputtered Silicon Films - 01 October 1981

STP37023S: The Use of Ion-Beam Deposited Diamond-Like Carbon for Improved Optical Elements for High Powered Lasers - 01 October 1981

STP37024S: Ion-Beam Deposited Ge-As-Se Glass For Applications in the 1μ to 16μ Wavelength Region - 01 October 1981

STP37025S: Characterization of Small Absorptions in Optical Coatings - 01 October 1981

STP37026S: Design and Construction of Three Infrared Ellipsometers for Thin-Film Research - 01 October 1981

STP37027S: Multilayer Thickness Uniformities Required to Meet Wave Front Error Tolerances in Laser Mirrors - 01 October 1981

STP37028S: The Role of Absorbing Defects in the Laser Damage of Transparent Materials - 01 October 1981

STP37029S: Pulse-Width and Focal-Volume Dependence of Laser-Induced Breakdown - 01 October 1981

STP37030S: On Self-Focusing and Spot-Size Dependence of Laser-Induced Breakdown - 01 October 1981

STP37031S: Deformation of Intense Laser Beams Tightly Focused Inside NaCl: A Comparison of the Multiphoton-Polaron and Avalanche Models of Optical Breakdown - 01 October 1981

STP37032S: A Correlation of Laser Damage Vestige Structure and Spherical Aberrations - 01 October 1981

STP37033S: The Role of Laser-Induced Primary Defect Formation in Optical Breakdown of NaCl - 01 October 1981

STP37034S: The High Frequency Electron Scattering Rate and Drude Zener Theory in Compound Semiconductors - 01 October 1981

STP37035S: Interactions of Intense 2.7 μm Picosecond Laser Pulses with Germanium - 01 October 1981

STP37036S: Band Structure Calculations of the Two-Photon Absorption Coefficients of GaAs, InP, CdTe, and ZnSe - 01 October 1981

STP37037S: Two-Photon Absorption in Direct-Gap Crystals—An Addendum - 01 October 1981

STP37038S: Three-Photon Absorption in Direct-Gap Crystals - 01 October 1981

STP36995S: Photoacoustic Spectroscopy of Adsorbed Surface Impurities on Alkali-Halide Laser Windows - 01 October 1981

STP37039S: Theory of Nonlinear Beam Propagation in Optical Waveguides - 01 October 1981

STP36996S: Photoacoustic Measurement of Nonlinear Absorption in Solids - 01 October 1981

STP36997S: 1.3 μm Laser Rate Calorimetry and Photoacoustic Studies of the Surface and Bulk Optical Absorption in CaF2 Single Crystal Samples - 01 October 1981

STP36998S: Intensity Dependent Absorption of Alkali-Halides at 10.6 μm - 01 October 1981

STP36999S: Pulsed CO2 Damage Threshold Measurements of Rb:KCl and NaCl - 01 October 1981

STP37000S: Infrared Absorption in Highly Transparent Glasses Based on Hafnium Fluoride - 01 October 1981

STP27358S: Chapter 7—Reference Junctions - 01 January 1981

STP470B-EB: Manual on the Use of Thermocouples in Temperature Measurement - 01 January 1981

STP27359S: Chapter 8—Calibration of Thermocouples - 01 January 1981

STP27360S: Chapter 9—Installation Effects - 01 January 1981

STP27361S: Chapter 10—Reference Tables for Thermocouples - 01 January 1981

STP27352S: Chapter 1—Introduction - 01 January 1981

STP27354S: Chapter 3—Thermocouple Materials - 01 January 1981

STP27362S: Chapter 11—Cryogenics - 01 January 1981

STP27363S: Chapter 12—Temperature Measurement Uncertainty - 01 January 1981

STP27353S: Chapter 2—Principles of Thermoelectric Thermometry - 01 January 1981

STP27355S: Chapter 4—Typical Thermocouple Designs and Applications - 01 January 1981

STP27356S: Chapter 5—Sheathed, Ceramic-Insulated Thermocouples - 01 January 1981

STP27357S: Chapter 6—Emf Measurements - 01 January 1981

STP27597S: Microwave Eddy-Current Experiments with Ferromagnetic Resonance Probes - 01 January 1981

STP27600S: Design of a Pulsed Eddy-Current Test Equipment with Digital Signal Analysis - 01 January 1981

STP28047S: A Microprocessor-Based Corrosion Measurement System - 01 January 1981

STP28084S: Design Considerations for High-Security Interior Intrusion Detection Systems - 01 January 1981

STP27651S: Electrochemical Hydrogen Patch Probe Correlated to Corrosion Rate in a Slightly Sour Water Flood - 01 January 1981

STP27653S: Mobile Wellhead Analyzer for the Determination of Unstable Constituents in Oil-Field Waters - 01 January 1981

STP33456S: An Assessment of A-C and D-C Potential Systems for Monitoring Fatigue Crack Growth - 01 January 1981

STP33452S: Automatic Decreasing Stress-Intensity Fatigue Crack Growth Rate Testing Using Low-Cost Circuitry - 01 January 1981

STP28749S: Torsion Shear Apparatus for Soil Testing - 01 January 1981

STP28750S: A Servo System for Controlled Stress Path Tests - 01 January 1981

STP28751S: A New Control System for Soils Testing - 01 January 1981

STP28752S: Lateral Stress Measurements in Direct Simple Shear Device - 01 January 1981

STP28779S: Limitations of Direct Simple Shear Test Devices - 01 January 1981

STP28318S: Suitability of Thermocouple Psychrometers for Studying Moisture Movement in Unsaturated Soils - 01 January 1981

STP27339S: Predicting Low Temperature Engine Oil Pumpability with the Mini-Rotary Viscometer - 01 January 1980

STP27341S: Development of a High Shear Rate Capillary Viscometer for Engine Oils - 01 January 1980

STP27332S: Use of a Couette High-Shear-Rate Viscometer for Measuring the Viscosity of Engine Lubricants - 01 January 1980

STP36107S: Durability of Stabilized Roofing Asphalt—An Investigation of Weather-Ometer Versus Outdoor Exposure - 01 January 1980

STP38657S: Energy Calibration of Electron Spectrometers - 01 January 1980

STP38649S: Application of Surface Analysis for Electronic Devices - 01 January 1980

STP27142S: Instrumentation and Testing of a Full-Scale Masonry Structure - 01 January 1980

STP27139S: Field Instrumentation of Concrete Structures - 01 January 1980

STP29218S: Detecting Coolant Corrosivity with Electrochemical Sensors - 01 January 1980

STP35131S: Influence of Impurity-Decorated Stacking Faults on the Transient Response of Metal Oxide Semiconductor Capacitors - 01 January 1980

STP712-EB: Lifetime Factors in Silicon - 01 January 1980

STP35132S: Control of Lifetime in Silicon by Implantation of Iron - 01 January 1980

STP35133S: Carrier Lifetime Measurements for Process Monitoring During Device Production - 01 January 1980

STP35134S: Measurement and Retention of Recombination Lifetime - 01 January 1980

STP35124S: Survey of Literature on Minority Carrier Lifetimes in Silicon and Related Topics - 01 January 1980

STP35135S: Measurement of Minority Carrier Lifetime in Silicon Crystals by the Photoconductive Decay Technique - 01 January 1980

STP35136S: Minority Carrier Lifetime Profile Measurements by Use of the Photocurrent Technique - 01 January 1980

STP35137S: Radial Lifetime Profiling on Silicon Specimens by the Photoconductivity Decay and Photocurrent Methods—A Comparison - 01 January 1980

STP35138S: Lifetime Depth Profile Measurement Method in Heavily Doped Semiconductors Using Electron Beams - 01 January 1980

STP35139S: A High Signal-to-Noise Oscillator for Contactless Measurement of Photoinduced Carrier Lifetimes - 01 January 1980

STP35140S: A Contactless Method of p-n Junction Leakage Testing and Comparison of Associated Data with Contact-Determined Leakage - 01 January 1980

STP35141S: Laser Scanning Technique for the Investigation of Power Devices - 01 January 1980

STP35125S: Influence of Collector Recombination Lifetime on the Current Gain and Storage Time of High-Voltage Power Transitors - 01 January 1980

STP35126S: Effects of Carrier Lifetime and End-Region Recombination on the Forward Current and Switching Behavior of Power Pin Diodes - 01 January 1980

STP35127S: Dynamic Storage Time Measurements on Metal Oxide Semiconductor-Random Access Memory Circuits - 01 January 1980

STP35128S: Minority Carrier Lifetime Degradation in Silicon Due to Thermally Generated Dislocations - 01 January 1980

STP35123S: Minority Carrier Lifetime Characteristics in Semiconductor Silicon—An Overview - 01 January 1980

STP35129S: Study of Minority Carrier Lifetime Behavior in Czochralski-Grown Silicon Crystals - 01 January 1980

STP35130S: Influence of Crystal Defects on the Generation Lifetime of Minority Carriers in Silicon - 01 January 1980

STP33412S: Flow-Through Toxicity Testing System for Molluscan Larvae as Applied to Halogen Toxicity in Estuarine Water - 01 January 1980

STP27503S: Basic Limits in Real-Time Industrial Radiographic Systems - 01 January 1980

STP27504S: Real-Time Radiographic Imaging for Submerged-Arc Welded Pipe - 01 January 1980

STP27508S: A Real-Time X-Ray Topography System - 01 January 1980

STP27509S: Video Display of X-Ray Topographic Images for In-Process Inspection of Semiconductor Devices - 01 January 1980

STP27497S: Radiation Sources and Detectors - 01 January 1980

STP27510S: Real-Time Optical Processing: Automatized Optical Plotter and Interferometric Device for 3D-Imaging - 01 January 1980

STP27512S: Real-Time Digital Image Processing for Radiological Imaging - 01 January 1980

STP27516S: Sensitivity of High-Energy Real-Time Radiography with Digital Integration - 01 January 1980

STP27517S: Summary - 01 January 1980

STP27498S: Detection of X-Rays for Real-Time Imaging - 01 January 1980

STP27499S: Concepts and Implementations in X-Ray Intensification - 01 January 1980

STP27496S: Fundamentals of Radiographic Imaging - 01 January 1980

STP27500S: Microchannel X-Ray Image Intensifiers - 01 January 1980

STP27501S: X-Ray-Sensitive Television Camera Tubes - 01 January 1980

STP27502S: X-Ray Phosphors and Screens - 01 January 1980

STP29277S: The Calibration of Heat Flow Meters - 01 January 1980

STP29280S: Implementation of a New Quality-Control Instrument for Thermal Measurements of a Low-Density Building Insulation - 01 January 1980

STP29281S: Sampling Faced Foam Insulation Board for Heat Flow Meter Thermal Performance Testing - 01 January 1980

STP29282S: A Method for Determining the Thermal Resistances of Experimental Flat Roof Systems Using Heat Flow Meters - 01 January 1980

STP27525S: An Automated Controlled-Flow Air Infiltration Measurement System - 01 January 1980

STP27569S: Biological Exposure Sensors in Coal-Conversion Technologies - 01 January 1980

STP27572S: Calibration Techniques - 01 January 1980

STP38130S: Portable Slow Strain-Rate Stress Corrosion Test Device - 01 January 1979

STP33727S: Analysis of Load Tests on Instrumented Steel Test Piles in Compressible Silty Soil - 01 January 1979

STP33739S: Load Testing of Instrumented 225-Foot-Long Prestressed Concrete Piles - 01 January 1979

STP33742S: Static and Cyclic Axial Load Tests on a Fully Instrumented Pile - 01 January 1979

STP33743S: Cyclic Pile Load Testing—Loading System and Instrumentation - 01 January 1979

STP36927S: Control and Testing of Epoxy Resins Used for Printed Circuit Boards - 01 January 1979

STP34934S: Single-Edge-Cracked Crack Growth Gage - 01 January 1979

STP39111S: Liquids for High Repetition Rate Glass Laser Systems - 01 January 1979

STP689-EB: Laser Induced Damage in Optical Materials: 1978 - 01 January 1979

STP39112S: Physical and Optical Properties of Surfaces Generated by Diamond-turning on an Advanced Machine - 01 January 1979

STP39113S: Optical and Metallurgical Characterization of Molybdenum Laser Mirrors - 01 January 1979

STP39097S: Absorption Coefficient of NaF by Attenuated Total Reflection Spectroscopy - 01 January 1979

STP39114S: 1064—NM Laser Damage Thresholds of Polished Glass Surfaces as a Function of Pulse Duration and Surface Roughness - 01 January 1979

STP39115S: Large Giant and Free-Running Laser Pulse Energy and Power Densities Through Optical Fibers - 01 January 1979

STP39116S: Ultraviolet Damage Resistance of Laser Coatings - 01 January 1979

STP39098S: Laser Calorimetric Measurement of Two Photon Absorption - 01 January 1979

STP39093S: DOE Welcome Presentation of Awards to Drs. Guenther and Glass - 01 January 1979

STP39117S: Multithreshold Evaluation of 100-nsec Pulsed Laser Damage to Coating Materials at 2.7- and 3.8-µm Wavelengths - 01 January 1979

STP39118S: Multithreshold Damage Measurements on As2S3, As2Se3, and NaF at HF and DF Wavelengths - 01 January 1979

STP39119S: TEM Investigation of Effects of a Barrier Layer on Damage to 1.064µ AR Coatings - 01 January 1979

STP39120S: Optical Techniques for the Determination of Pulsed Laser Damage in Thin Films - 01 January 1979

STP39121S: A Statistical Analysis of Absorptive Laser Damage in Dielectric Thin Films - 01 January 1979

STP39122S: New Coating Materials for IR Laser Optical Components - 01 January 1979

STP39099S: A Comparison of Bulk and Surface Absorptions in NaCl and KCl between 9.2 and 10.8 µm - 01 January 1979

STP39123S: Improved PbF2 Coatings for the Infrared - 01 January 1979

STP39124S: Graded Index Coatings of Cubic Thallium Iodide (TLI) and Lead Fluoride (PbF 2) - 01 January 1979

STP39125S: Simple Expressions for Calculating the Effect of Volume or Interface Absorption in Thin Films on the Performance of High Reflectance or Antireflectance Multilayer Coatings - 01 January 1979

STP39126S: Simplified Description of Dielectric Reflectors - 01 January 1979

STP39127S: Electric Fields Near Coated Surfaces: Application to Damage Protection - 01 January 1979

STP39128S: Computer Simulation of Laser Damage Morphology in the Alkali-Halides - 01 January 1979

STP39129S: The Relative Role of Impact and Multiphoton Ionization Mechanisms in Laser Induced Damage of Transparent Dielectrics - 01 January 1979

STP39130S: Theory of Laser Damage in Dielectric Solids - 01 January 1979

STP39131S: Laser-Induced Damage in Semiconductors - 01 January 1979

STP39132S: Frequency Dependence of Breakdown Fields in Single-Crystal NaCl and KCl - 01 January 1979

STP39133S: Investigation of Surface Breakdown Mechanism in IR-Optical Materials - 01 January 1979

STP39100S: A 1.06µm Laser Absorption Calorimeter for Optical Coatings - 01 January 1979

STP39101S: Measured Thin Film Absorption at the Air-Film Interface, the Film Bulk, and the Film-Substrate Interface - 01 January 1979

STP39094S: Remarks to the Tenth Annual Boulder Optical Materials for High Power Lasers Symposium - 01 January 1979

STP39102S: Photoacoustic Spectroscopy Studies of Thin Film Coatings on Laser Windows - 01 January 1979

STP39103S: Piezo-Optic Coefficients of Some Neodymium Doped Laser Glasses and Single Crystals of CaF2, BaF2 and SrF2 - 01 January 1979

STP39104S: Refractive Index of Strontium Fluoride - 01 January 1979

STP39105S: The Development of Fluorides for High Power Laser Optics - 01 January 1979

STP39095S: Symposium Welcome - 01 January 1979

STP39106S: Optical Properties of KCl Forged between Optically Polished Dies - 01 January 1979

STP39107S: Bulk Optical Properties of Fine Grained Forged Calcium Fluoride - 01 January 1979

STP39108S: CW Laser Damage in AR Coated Alkaline Earth Fluorides at 3.8 µm - 01 January 1979

STP39096S: Discussion of a Theory of Analysis of Rate Calorimetry Which Includes Coating Absorption - 01 January 1979

STP39109S: Lattice Absorption, Phonon Assignments, and Image Spoiling Properties of Cvd ZnS in the Infrared - 01 January 1979

STP39110S: Laser Induced Damage in Fluoride Glasses: A Status Report - 01 January 1979

STP28012S: A Simple High Shear Viscometer—Aspects of Correlation with Engine Performance - 01 January 1978

STP38634S: Adhesion Measurements on Thick-Film Conductors - 01 January 1978

STP38636S: Evaluation of Methods for Performing Adhesion Measurements of Thick-Film Terminations on Chip Components - 01 January 1978

STP38637S: Adhesion Measurement Technique for Soldered Thick-Film Conductors - 01 January 1978

STP38639S: Adherence Measurements and Evaluation of Thick-Film Platinum-Gold - 01 January 1978

STP38641S: Methods for Evaluating Adhesion of Photoresist Materials to Semiconductor Devices - 01 January 1978

STP27314S: Metallic Barriers for Protection of Contacts in Electronic Circuits from Atmospheric Corrosion - 01 January 1978

STP28736S: A Comparison of Two Slip-Resistance Testers - 01 January 1978

STP28737S: Description of the National Institute for Occupational Safety and Health (NIOSH) Universal Friction Testing Machine (UFTM) - 01 January 1978

STP28739S: A Different Approach to Measuring Pedestrian Friction: The CEBTP Skidmeter - 01 January 1978

STP36582S: Meteorological Instruments for Use Near the Ground: Their Selection and Use in Air Pollution Studies - 01 January 1978

STP36583S: Applicability of a Measurement System: Sensor Response and Representativeness - 01 January 1978

STP35751S: Pipe Insulation Testers - 01 January 1978

STP35755S: Evaluation of High-Temperature Pipe Insulations Using a 16-ln.-Diameter Pipe Test Apparatus - 01 January 1978

STP33974S: Determining Image Quality and Wavefront Profiles from Interferograms - 01 January 1978

STP666-EB: Optical Interferograms—Reduction and Interpretation - 01 January 1978

STP33967S: How to Interpret an Interferogram - 01 January 1978

STP33975S: A Facility for the Analysis of Interferograms - 01 January 1978

STP33976S: Heterodyne Interferometry - 01 January 1978

STP33968S: A New, Semiautomatic Interferogram Evaluation Technique - 01 January 1978

STP33966S: A Manual Method for Interpretation of Nominally Plane Wavefronts - 01 January 1978

STP33969S: Automatic Techniques for Analyzing Nulled Interferograms - 01 January 1978

STP33970S: Real-Time Interferogram Simulation - 01 January 1978

STP33971S: A Computer Program for Analysis of Interferometric Data - 01 January 1978

STP33972S: Mathematical Methods for Deriving Wavefronts from Interferograms - 01 January 1978

STP33973S: Interferogram Reduction and Interpretation as Applied to the Optical Analysis of a Laser Fusion System - 01 January 1978

STP34807S: Measurement of Temporary and Permanent Shear with the Instron Capillary Rheometer - 01 January 1977

STP27037S: Hermetic Test Procedures and Standards for Semiconductor Electronics - 01 January 1977

STP27018S: Image Quality Indicators—Penetrameters - 01 January 1977

STP27092S: The Influence of Intermolecular Interactions on Viscosities at Low Temperatures: Forced-Sphere and Forced-Cylinder Viscometers - 01 January 1977

STP33910S: Detection Systems for Neutron Radiography - 01 January 1976

STP33911S: Neutron Gaging Systems - 01 January 1976

STP32358S: Verification of In Situ Source Emission Analyzer Data - 01 January 1976

STP598-EB: Calibration in Air Monitoring - 01 January 1976

STP32359S: Statistical Implications of the Environmental Protection Agency Procedure for Evaluating the Accuracy of Sulfur Dioxide and Nitrogen Oxide Monitors of Stationary Sources - 01 January 1976

STP32363S: Calibration of Permeation and Diffusion Devices by an Absolute Pressure Method - 01 January 1976

STP32352S: Gas Turbine Emission Measurement Instrument Calibration - 01 January 1976

STP32365S: Application of Gas Phase Titration in the Calibration of Nitric Oxide, Nitrogen Dioxide, and Ozone Analyzers - 01 January 1976

STP32368S: Use of the National Bureau of Standards Standard Reference Gases in Mobile Source Emissions Testing - 01 January 1976

STP32354S: Application and Description of a Portable Calibration System - 01 January 1976

STP32351S: Calibration of Stack Gas Instrumentation - 01 January 1976

STP32357S: Certification Experience with Extractive Emission Monitoring Systems - 01 January 1976

STP27841S: A Laser-Based Optical Filtering System to Analyze Samples of Diatom Communities - 01 January 1976

STP27834S: Evaluation of an Automated Biological Monitoring System at an Industrial Site - 01 January 1976

STP27835S: An Electronic System to Monitor the Effects of Changes in Water Quality on Fish Opercular Rhythms - 01 January 1976

STP27836S: A Biological Monitoring System Employing Rheotaxis of Fish - 01 January 1976

STP27838S: An Automatic System for Rapid Detection of Acute High Concentrations of Toxic Substances in Surface Water Using Trout - 01 January 1976

STP37207S: Calculation Methods for Predicting Smoke Movement in Building Fires and Designing Smoke Control Systems - 01 January 1976

STP39009S: Pesticide Residue Screening Methods Utilizing Multidetector Configurations - 01 January 1975

STP39028S: Sensors for Monitoring Water Quality - 01 January 1975

STP32277S: One Electronic Company's Approach to Metrication - 01 January 1975

STP33357S: A Monitor for the Continuous Measurement of Suspended Solids in Liquids - 01 January 1975

STP582-EB: Water Pollution Assessment: Automatic Sampling and Measurement - 01 January 1975

STP33352S: An Assessment of Automatic Sewer Flow Samplers - 01 January 1975

STP33351S: Performance of Portable Automatic Wastewater Composite Sample Collectors - 01 January 1975

STP33353S: An Automated Remote Marshland Water Sampling Station - 01 January 1975

STP33354S: Industrial Experience with On-Line Instrumentation for Water Pollution Monitoring - 01 January 1975

STP29180S: Excavation and Soldier Pile-Tremie Concrete (SPTC) Wall Instrumentation and Monitoring Program - 01 January 1975

STP29184S: Instrumentation of Large Buried Culverts - 01 January 1975

STP29177S: Instrumentation of a 50-ft (15.2-m) Deep Braced Excavation - 01 January 1975

STP29178S: Measurement of Strut Loads by Means of Vibrating-Wire Strain Gages - 01 January 1975

STP36551S: New Gaging System for Modified ISO Metric Screw Threads - 01 January 1975

STP32208S: Monitoring Fatigue Testing - 01 October 1974

STP32211S: Automated Fatigue Testing - 01 October 1974

STP32203S: Basic Elements of a Fatigue Test System - 01 October 1974

STP32204S: Drive Systems for Conventional Fatigue Testing Machines - 01 October 1974

STP32205S: Drive Systems for Multiaxial and Special Purpose Test Systems - 01 October 1974

STP288C-EB: Supplement to the Bibliography and Abstracts on Thermostat Metals - 01 June 1974

STP288C-EB: Supplement to the Bibliography and Abstracts on Thermostat Metals - 01 January 1974

STP27303S: Chapter 8—Calibration of Thermocouples - 01 January 1974

STP470A-EB: Manual on the Use of Thermocouples Temperature Measurement - 01 January 1974

STP27304S: Chapter 9—Installation Effects - 01 January 1974

STP27305S: Chapter 10—Reference Tables for Thermocouples - 01 January 1974

STP27298S: Chapter 3—Thermocouple Materials - 01 January 1974

STP27306S: Chapter 11—Cryogenics - 01 January 1974

STP27297S: Chapter 2—Principles of Thermoelectric Thermometry - 01 January 1974

STP27299S: Chapter 4—Thermocouple Hardware and Fabrication - 01 January 1974

STP27300S: Chapter 5—Sheathed, Ceramic-Insulated Thermocouples - 01 January 1974

STP27301S: Chapter 6—Emf Measurements - 01 January 1974

STP27302S: Chapter 7—Reference Junctions - 01 January 1974

STP38933S: An Ultrasensitive Hydrogen Detector - 01 January 1974

STP38934S: Neodymium Detection System - 01 January 1974

STP38932S: Hydrogen Detection Gage - 01 January 1974

STP34778S: Robinson Line-Heat-Source Guarded Hot Plate Apparatus - 01 January 1974

STP34779S: Calibrated Hot Box: An Effective Means for Measuring Thermal Conductance in Large Wall Sections - 01 January 1974

STP34774S: Design Criteria for Guarded Hot Plate Apparatus - 01 January 1974

STP554-EB: Field Testing and Instrumentation of Rock - 01 January 1974

STP32147S: Optimization of the Design and Use of a Triaxial Strain Cell for Stress Determination - 01 January 1974

STP32148S: A Radio Frequency Warning Device for Early Roof Failure Detection - 01 January 1974

STP32144S: Laboratory Calibration and Field Performance of Inclinometers - 01 January 1974

STP38970S: Evaluation of New Ozone Monitoring Instruments by Measuring in Nonurban Atmospheres - 01 January 1974

STP555-EB: Instrumentation for Monitoring Air Quality - 01 January 1974

STP38971S: Review of Commercial Ozone Measurement Instrumentation - 01 January 1974

STP38974S: Filter Media for Atmospheric Sampling and Analysis - 01 January 1974

STP38975S: Measuring Particulate Matter in Air - 01 January 1974

STP38976S: Recent Developments in IN SITU Size Spectrum Measurement of Submicron Aerosols - 01 January 1974

STP38961S: Performance Evaluation of SO2 Monitoring Instruments - 01 January 1974

STP38965S: Instrumentation for the Measurement of Nitrogen Dioxide - 01 January 1974

STP38967S: Performance of Hydrocarbon Monitoring Instrumentation - 01 January 1974

STP38968S: Plumbing Problems — Gases for 6800 Hydrocarbon Analyzers - 01 January 1974

STP38969S: Obtaining Reliable Performance from Hydrocarbon Analyzers - 01 January 1974

STP38962S: Selection of Continuous Sulfur Dioxide Monitors for Ambient and Source Concentration Levels - 01 January 1974

STP33331S: The Electron Microprobe as a Metallographic Tool - 01 January 1974

STP32176S: Techniques for Characterizing Bituminous Materials Using a Versatile Triaxial Testing System - 01 January 1974

STP565-EB: Evolution of the International Practical Temperature Scale of 1968 - 01 January 1974

STP32197S: A Compilation and Historical Review of Temperature Scale Differences - 01 January 1974

STP32196S: The Origin and Present Status of the IPTS-68 - 01 January 1974

STP32198S: International Practical Temperature Scale of 1968 - 01 January 1974

STP32199S: The International Practical Temperature Scale of 1968: Adopted by the Comité International des Poids et Mesures - 01 January 1974

STP47399S: Spreading Resistance Measurements on Silicon with Non-blocking Aluminum-Silicon Contacts - 01 January 1974

STP572-EB: Semiconductor Measurement Technology: Spreading Resistance Symposium - 01 January 1974

STP47400S: The Preparation of Bevelled Surfaces for Spreading Resistance Probing by Diamond Grinding and Laser Measurement of Bevel Angles - 01 January 1974

STP47401S: Spreading Resistance Correction Factors for (111) and (100) Surfaces - 01 January 1974

STP47402S: On the Calibration and Performance of a Spreading Resistance Probe - 01 January 1974

STP47403S: Comparison of the Spreading Resistance Probe with other Silicon Characterization Techniques - 01 January 1974

STP47404S: Preparation of a Lightly Loaded, Close-Spaced Spreading Resistance Probe and its Application to the Measurement of Doping Profiles in Silicon - 01 January 1974

STP47405S: A Direct Comparison of Spreading Resistance and MOS-CV Measurements of Radial Resistivity Inhomogeneities on PICTUREPHONE® Wafers - 01 January 1974

STP47391S: The Physics of Spreading Resistance Measurements - 01 January 1974

STP47406S: Investigations on Local Oxygen Distribution in Silicon Single Crystals by Means of Spreading Resistance Technique - 01 January 1974

STP47407S: Use of the Spreading Resistance Probe for the Characterization of Microsegregation in Silicon Crystals - 01 January 1974

STP47388S: Welcoming Remarks at the ASTM/NBS Symposium on Spreading Resistance Measurements Gaithersburg, Maryland June 13, 1974 - 01 January 1974

STP47408S: Effects of Oxygen and Gold on Silicon Power Devices - 01 January 1974

STP47409S: The Evaluation of Thin Silicon Layers by Spreading Resistance Measurements - 01 January 1974

STP47410S: Evaluation of the Effective Epilayer Thickness by Spreading Resistance Measurement - 01 January 1974

STP47411S: The Experimental Investigation of Two-Point Spreading Resistance Correction Factors for Diffused Layers - 01 January 1974

STP47412S: Application of the Spreading Resistance Technique to Silicon Characterization for Process and Device Modeling - 01 January 1974

STP47413S: Improved Surface Preparation For Spreading Resistance Measurements on p-type Silicon - 01 January 1974

STP47392S: Formal Comparison of Correction Formulae for Spreading Resistance Measurements on Layered Structures - 01 January 1974

STP47389S: Welcoming Remarks from ASTM - 01 January 1974

STP47393S: Two-Point Probe Correction Factors - 01 January 1974

STP47394S: On the Validity of Correction Factors applied to Spreading Resistance Measurements on Bevelled Structures - 01 January 1974

STP47390S: Keynote Address Symposium on Spreading Resistance Gaithersburg, Maryland June 13–14, 1974 - 01 January 1974

STP47395S: SRPROF, A Fast and Simple Program for Analyzing Spreading Resistance Profile Data - 01 January 1974

STP47396S: Multilayer Analysis of Spreading Resistance Measurements - 01 January 1974

STP47397S: An Automated Spreading Resistance Test Facility - 01 January 1974

STP47398S: Angle-Bevelling Silicon Epitaxial Layers, Technique and Evaluation - 01 January 1974

STP36851S: Recording Fluxmeter of High Accuracy and Sensitivity with Galvanometer-Photoelectric Integrators - 01 January 1973

STP47375S: Fundamentals of Dynamic Properties Measurement of Elastomers: Part II—Instrumentation, Computation, and Compensation - 01 January 1973

STP38910S: A Gravimetric Calibration Procedure for Modern Controls IRD-2 Infrared Water Vapor Diffusometer and Its Correlation with Results from ASTM Method E 96 - 01 January 1973

STP32095S: Development of a Heat Release Rate Calorimeter at NBS - 01 January 1972

STP36844S: Design of Modern Image Measurement Systems - 01 January 1972

STP36845S: European Instruments for Quantitative Image Analysis - 01 January 1972

STP38571S: Role of Multichannel Analyzer in Data Handling - 01 January 1971

STP38572S: Solid-State X-ray Detectors for Electron Microprobe Analysis - 01 January 1971

STP38575S: Role of the Gas Flow Proportional Counter in Energy Dispersive Analysis - 01 January 1971

STP38576S: Light Element Analysis Using the Semiconductor X-ray Energy Spectrometer with Electron Excitation - 01 January 1971

STP38577S: Rapid Quantitative Electron Probe Microanalysis with a Nondiffractive Detector System - 01 January 1971

STP38578S: Design and Application of X-ray Emission Analyzers Using Radioisotope X-ray or Gamma Ray Sources - 01 January 1971

STP38567S: The Future of Silicon X-Ray Detectors - 01 January 1971

STP38568S: Low-Noise Cryogenic Preamplifiers - 01 January 1971

STP38569S: Characterization Of Semiconductor X-ray Energy Spectrometers - 01 January 1971

STP38021S: A Study of Thermal Ratchetting Using Closed-Loop, Servo-Controlled Test Machines - 01 January 1971

STP38026S: An Automatic Flash Photomicrographic System for Fatigue Crack Initiation Studies - 01 January 1971

STP46144S: Calibration of Thermocouples - 01 January 1970

STP470-EB: Manual on the Use of Thermocouples in Temperature Measurement - 01 January 1970

STP46145S: Installation Effects - 01 January 1970

STP46146S: Reference Tables for Thermocouples - 01 January 1970

STP46139S: Thermocouple Materials - 01 January 1970

STP46137S: Introduction - 01 January 1970

STP46147S: Cryogenics - 01 January 1970

STP46138S: Principles of Thermoelectric Thermometry - 01 January 1970

STP46140S: Thermocouple Hardware and Fabrication - 01 January 1970

STP46141S: Sheathed, Ceramic-Insulated Thermocouples - 01 January 1970

STP46142S: Emf Measurements - 01 January 1970

STP46143S: Reference Junctions - 01 January 1970

STP28618S: Precision of Air-Permeability, Turbidimeter, and No. 325 Sieve Fineness Data - 01 January 1970

STP28621S: Use of the Coulter Counter and the Alpine Sieve for Particle Size Analysis of Cement - 01 January 1970

STP48452S: Accuracy of Strain Measurements at Elevated Temperatures with Electric Resistance Strain Gages - 01 January 1970

STP38503S: Suggested Method of Test for Infiltration Rate in Field Using Double-Ring Infiltrometers - 01 January 1970

STP38515S: Suggested Method of Test for Thermal Resistivity of Soil by the Thermal Probe - 01 January 1970

STP38529S: Suggested Methods of Test for Density of Soil in Place Using the Washington Densometer - 01 January 1970

STP38470S: General Guide for Use of Borehole Cameras—A Guide - 01 January 1970

STP32081S: The Electron Microprobe Analyzer as a Research Instrument - 01 January 1970

STP47286S: Experiments with Instrumented Pile Groups in Sand - 01 January 1969

STP47287S: Instrumentation and Downdrag - 01 January 1969

STP47293S: Lateral Load Tests on Instrumented Timber Piles - 01 January 1969

STP48357S: The Use of a Nuclear Asphalt Content Gauge - 01 January 1969

STP469-EB: Damage in Laser Glass - 01 January 1969

STP48616S: Laser Damage in Optical Glasses - 01 January 1969

STP48617S: Self-Focusing in Glass - 01 January 1969

STP48618S: Glass Laser Materials Testing at Naval Research Laboratory - 01 January 1969

STP48619S: Diagnostics and Evidence of Pre-catastrophic Damage in Transparent Solids - 01 January 1969

STP48606S: Introduction - 01 January 1969

STP48610S: Laser-Beam Self-Focusing and Glass Damage Caused by Electrostrictively Driven Acoustic Waves - 01 January 1969

STP48607S: Review and Summary - 01 January 1969

STP48611S: Non-Destructive Damage Studies of Ruby Laser Rods - 01 January 1969

STP48612S: Applications of Electron Spin Resonance to Study of Damage in Glass Lasers - 01 January 1969

STP48613S: Surface-Damage Threshold Measurements for Several Laser Glasses - 01 January 1969

STP48614S: Damage-Threshold Testing of Laser Glass at Owens-Illinois - 01 January 1969

STP48615S: Laser-Induced Damage in Glass - 01 January 1969

STP48608S: Preamble - 01 January 1969

STP48609S: Laser-Damage Mechanisms in Transparent Dielectrics - 01 January 1969

STP31984S: Recommended Practice for Evaluation of Mass Spectrometers for Use in Chemical Analysis - 01 January 1968

STP412-EB: The Use of Nuclear Meters in Soils Investigations: A Summary of Worldwide Research and Practice - 01 January 1968

STP46063S: Use of Nuclear Meters in Soils Investigations: A Summary of Worldwide Research and Practice - 01 January 1968

STP428-EB: Automated Analyzers and Quality Control for the Petroleum Industry - 01 January 1968

STP45868S: Advanced Process Chromatograph and Modern Petroleum Plant Analysis and Control Requirements - 01 January 1968

STP45869S: Automatic Blending and Inspection of Lubricating Oils at the Refinery - 01 January 1968

STP45870S: In-Line Gasoline Blending Trends, Economics, and the Use of Continuous Analyzers for Quality Control - 01 January 1968

STP45867S: Instrumentation for Quality Assurance of Petroleum Products - 01 January 1968

STP45871S: Quality Assurance in Petroleum Pipeline Transfer Operations - 01 January 1968

STP45872S: Quality Assurance in Jet Fuel Transfer Operations - 01 January 1968

STP41829S: Report of the Washington Electron Probe Users' Group - 01 January 1968

STP34104S: Requirements for Coordination of Instrumental and Sensory Techniques - 01 January 1968

STP411-EB: Thermal Conductivity Measurements of Insulating Materials at Cryogenic Temperatures - 01 January 1967

STP47223S: A Cryogenic Heat-Flow-Meter Apparatus - 01 January 1967

STP47216S: A Guarded-Hot-Plate Thermal-Conductivity Apparatus for Multilayer Cryogenic Insulation - 01 January 1967

STP47214S: Introduction - 01 January 1967

STP47217S: Cryogenic Thermal-Conductivity Measurements of Insulating Materials - 01 January 1967

STP47215S: A Flat-Plate Thermal-Conductivity Apparatus for Measuring Low-Conductivity Materials at Cryogenic Temperatures - 01 January 1967

STP47218S: An Apparatus for Thermal Conductivity at Cryogenic Temperatures Using a Heat Flow Meter - 01 January 1967

STP47219S: A Double-Guarded Cold-Plate Thermal-Conductivity Apparatus - 01 January 1967

STP47220S: A Nonsteady-State Thermal-Conductivity Tester for Cryogenic Insulations - 01 January 1967

STP47221S: An Improved Guarded-Cold-Plate Thermal-Conductivity Apparatus - 01 January 1967

STP47222S: A Simple Multilayer Insulation Calorimeter - 01 January 1967

STP46441S: Instrumentation and Data Acquisition for Pressure-Suited Test Subjects in Space Environment Simulation Testing - 01 January 1966

STP47208S: Plasticity and Cure Control and Cross-Linking Studies of Rubber Using the Wallace-Shawbury Curometer - 01 January 1965

STP47207S: Continuous Measurement of Rubber Vulcanization with the Agfa Vulcameter - 01 January 1965

STP47210S: Uses of an Oscillating Disk Rheometer for Determining the Rheological Properties of Elastomers During Vulcanization - 01 January 1965

STP47211S: The Viscurometer—A Study of Variables Associated with its Use - 01 January 1965

STP47212S: Vulcanization Measurement Using the Instron Tester - 01 January 1965

STP384-EB: Radiation Effects in Electronics - 01 January 1965

STP44608S: Proton and Electron Permanent Damage in Silicon Semiconductor Devices - 01 January 1965

STP44609S: The Effects of Ionizing Radiation on Transistor Gain - 01 January 1965

STP44610S: Radiation Induced Surface Effects on Selected Semiconductor Devices - 01 January 1965

STP44611S: Influence of Operating Conditions on Radiation Damage to Transistor Gain - 01 January 1965

STP44612S: Transient Radiation Effects on Traveling-Wave Tubes - 01 January 1965

STP44604S: Transient High Energy Effects in Semiconductors and Insulators - 01 January 1965

STP44613S: Development of a Radiation Tolerant All Solid State Tracking and Command System - 01 January 1965

STP44615S: Remarks on Correlation Studies - 01 January 1965

STP44605S: EPR Measurements of Radiation Immunization in Poly (methyl Methacrylate) by Organic Additives - 01 January 1965

STP44603S: Radiation-Induced Electronic Phenomena in Polyethylene - 01 January 1965

STP44606S: Neutron and Neutron Spectra Contribution to Damage in Silicon F.E.T.'s - 01 January 1965

STP44607S: Transient Radiation Effects in Semiconductor Devices - 01 January 1965

STP392-EB: Instruments and Apparatus for Soil and Rock Mechanics - 01 January 1965

STP41282S: Instrumentation for Movements Within Rockfill Dams - 01 January 1965

STP41283S: Measurement of Embankment Stresses on a Hundred-Foot-High Retaining Wall - 01 January 1965

STP41284S: Measurement of Hydrostatic Uplift Pressure on Spillway Weir with Air Piezometers - 01 January 1965

STP41285S: An Instrument to Measure Skin Friction and Normal Earth Pressure on Deep Foundations - 01 January 1965

STP41275S: Planning Soil Dynamics Instrumentation - 01 January 1965

STP41276S: The Development of a Free-Field Soil Stress Gage for Static and Dynamic Measurements - 01 January 1965

STP41278S: Apparatus for Vibration of Soil Specimens During the Triaxial Test - 01 January 1965

STP41279S: A Hydraulic Earth Pressure Cell - 01 January 1965

STP41280S: A Technique For Measurement of Shock-Induced Soil-Structural Motion - 01 January 1965

STP41281S: Measurement of Rock Deformations in Foundations for Mass Concrete Dams - 01 January 1965

STP349-EB: Symposium on X-Ray and Electron Probe Analysis - 01 January 1964

STP45944S: X-ray Optics in Electron Microanalysis - 01 January 1964

STP45943S: Production of X-rays in X-ray Emission Spectrography - 01 January 1964

STP45956S: Summary of Papers on the Electron Probe - 01 January 1964

STP45945S: X-ray Detectors - 01 January 1964

STP45950S: Electron Optical Design of Electron Probes - 01 January 1964

STP46179S: Calibration of Nuclear Meters for Measuring Moisture and Density - 01 January 1964

STP44569S: Polyken Probe Tack Tester - 01 January 1964

STP30006S: Test Methods and New Equipment - 01 January 1964

STP30012S: A Simple Pore Water Pressure Gage - 01 January 1964

STP30015S: A Transducer to Measure Pore Water Pressures in Soil Tests - 01 January 1964

STP48333S: Variable Bias Illumination Control for the Electron Microscope - 01 January 1964

STP46557S: 1963 Supplement to Bibliography and Abstracts on Electrical Contacts—1962 and 1963 - 01 January 1964

STP46553S: Introduction - 01 January 1964

STP46556S: New References for 1955–1961 - 01 January 1964

STP45805S: Printed Wiring Surface Preparation Methods—Elimination of Gold Plating as a Surface Preparation for Printed Circuits and Development of a Contamination-Free Surface - 01 January 1963

STP44423S: A Portable Proximity Probe for Detection of Moisture Within a Laminate - 01 January 1963

STP46406S: Analytical Methods and Instrumentation for Determining Cyanogen Compounds - 01 January 1963

STP41749S: The Use of Semiconductor Lithium Drifted P-I-N Junction Detectors for Dosimetry - 01 January 1963

STP342-EB: Symposium on Cleaning and Materials Processing for Electronics and Space Apparatus - 01 January 1963

STP44485S: Methods of Evaluating Sonic Cleaning Systems - 01 January 1963

STP44475S: A New Principle for Airborne Contamination Control in Clean Rooms and Work Stations - 01 January 1963

STP44486S: Effect of Temperature on Ultrasonic Cavitation of Fluorinated Solvents - 01 January 1963

STP44487S: The Role of Cavitation in Sonic Energy Cleaning - 01 January 1963

STP44488S: An Instrument for the Contactless Measurement of Minority Carrier Lifetime - 01 January 1963

STP44489S: Photography and Metal Parts Production - 01 January 1963

STP44490S: An Ionized Gas Jet Surface Cleaner - 01 January 1963

STP44491S: Characteristics of Frequency Control Devices for Satellite Environments - 01 January 1963

STP44492S: Doping of Germanium Transistor Surfaces by Fluid-Base Encapsulant Systems - 01 January 1963

STP44493S: Both Reversible and Permanent Effects of Moisture After Stress on Electrical Characteristics of Germanium Transistors - 01 January 1963

STP44494S: Some Experiments on Water Introduced Into Electron Tubes - 01 January 1963

STP44495S: Evaluation of Polycrystalline Silicon Batches for Czochralski Crystal Pulling - 01 January 1963

STP44496S: Infrared-Tested Surface Properties of Semiconductor Wafers - 01 January 1963

STP44497S: Evaluation of Semiconductor Epitaxial Layers Report of Subcommittee 6 of ASTM Committee F-1 - 01 January 1963

STP44498S: Modular Dopant for Silicon Czochralski Crystals - 01 January 1963

STP44476S: A Comparison of Dust Count Data Obtained from Different Measuring Methods - 01 January 1963

STP44499S: The Preparation and Properties of Single Crystals of Aluminum Antimonide - 01 January 1963

STP44477S: A Review of the Gravity-Settling Technique for Measuring Airborne Dust in Electron Device Processing Areas - 01 January 1963

STP44478S: Enumeration of Airborne Particulate Matter by the Scattered Light Technique - 01 January 1963

STP44479S: A Referee Method for Sizing and Counting of Airborne Particulate Contamination - 01 January 1963

STP44480S: Tentative Method for Sizing and Counting Airborne Particulate Contamination in Clean Rooms and Other Dust-Controlled Areas Designed for Electronic and Similar Applications - 01 January 1963

STP44474S: Portable Low-Cost Polyethylene Ultraclean Assembly Areas - 01 January 1963

STP44481S: The Silting Index: An Evaluation of Micron and Submicron Contamination in Liquids - 01 January 1963

STP44482S: Chemical Factors in the use and Handling of Electronic Grade Hydrogen Peroxide - 01 January 1963

STP44483S: Effect of Temperature on Resistance of Ultrapure Organic Solvents - 01 January 1963

STP44484S: Chemical Durability Evaluation of Electronic Glasses - 01 January 1963

STP41256S: Rotating Cylinder Viscometers for Gelled Materials - 01 January 1962

STP44374S: Performance of Embedded Pressure Gages Under Static and Dynamic Loadings - 01 January 1962

STP43686S: X-Ray Diffraction in the Electron Probe Microanalyzer - 01 January 1962

STP43678S: Iffusion Measurements in Iron-Nickel with the Electron Probe Microanalyzer - 01 January 1962

STP47030S: Control of Construction Dewatering by Use of Piezometers - 01 January 1962

STP47029S: Development and Installation of Piezometers for the Measurement of Pore-Fluid Pressures in Earth Dams - 01 January 1962

STP44406S: Development and Performance of the Portable Skid-Resistance Tester - 01 January 1962

STP46550S: 1961 Supplement to Bibliography and Abstracts on Electrical Contacts—1960 and 1961 - 01 January 1962

STP46546S: Introduction - 01 January 1962

STP46549S: New References for 1954–1959 - 01 January 1962

STP45053S: Accomplishments and Limitations of Solid State Theory - 01 January 1961

STP45054S: The Influence of Surfaces on the Properties of Materials - 01 January 1961

STP45055S: Mechanical Properties of Semiconductors - 01 January 1961

STP45056S: Status of Ductile Ceramic Research - 01 January 1961

STP39622S: Design and Calibration of a Neutron Moisture Meter - 01 January 1961

STP39623S: Application of Nuclear Soil Meters to Compaction Control for Airfield Pavement Construction - 01 January 1961

STP39624S: Experiences with Nuclear Moisture and Density Surface Probes on O'hare Field Project - 01 January 1961

STP39621S: Design and Application of the Nuclear-Chicago /M-Gauge - 01 January 1961

STP39625S: Comparison of Nuclear and Sand-Cone Methods of Density and Moisture Determinations for four New York State Soils - 01 January 1961

STP39626S: Evaluation of Nuclear Moisture-Density Testing Equipment - 01 January 1961

STP300-EB: Materials and Electron Device Processing - 01 January 1961

STP41229S: Elimination of Contaminants from Electron Tube Components: Automation of Chemical Processing - 01 January 1961

STP41230S: Transducer Parameters Affecting Sonic Cleaning - 01 January 1961

STP41231S: Removal of Water-Soluble Flux from Assembled Printed Circuit Boards - 01 January 1961

STP41232S: Size Distribution and Identification of Air-Borne Particulates - 01 January 1961

STP41233S: ARC Sealing of Borosilicate Glasses - 01 January 1961

STP41234S: Recommended Practices for Safe Handling of Beryllium Oxide Ceramics - 01 January 1961

STP41235S: Beryllium Oxide Dielectric Heat Sinks for Electronic Devices - 01 January 1961

STP41236S: Sulfamic Acid Cleaning of Electron Tube Parts - 01 January 1961

STP41237S: A 24-Position Semiautomatic Vacuum Tube Exhaust Machine - 01 January 1961

STP41238S: Purification, Distribution, Control, and Monitoring of High-Purity Gases for Electron Device Processing - 01 January 1961

STP41219S: A Comparison of Electrostatic and High-Efficiency Impingement Air Filters for Use in Device Development Laboratories - 01 January 1961

STP41239S: Comparison of Standard Leak Rates Measured by Viscous and Molecular Flow Techniques - 01 January 1961

STP41240S: Gas Composition During Pumping and in Sealed-off Power Tubes - 01 January 1961

STP41217S: The Role of Impurities in Impurity-Dominated Electronic Materials and Devices - 01 January 1961

STP41241S: Determination of Trace Amounts of Oxygen in Protective Gaseous Ambients - 01 January 1961

STP41242S: Mass Spectrometric Studies of Power Klystron Exhaust Processing - 01 January 1961

STP41243S: Quality Control of Getters - 01 January 1961

STP41220S: Dust Monitoring by the Dry Slide Settling Technique - 01 January 1961

STP41244S: Residual Gas Content as a Function of Tube Processing - 01 January 1961

STP41245S: Changes in Stability of Germanium Alloy Transistors Through Etching, Washing, and Encapsulation Processing - 01 January 1961

STP41246S: Effects of Various Cleaning Methods on Electronic Components in the Micromodule - 01 January 1961

STP41247S: Noise-Tested Cathode Activation - 01 January 1961

STP41221S: An Approach to Control of Transistor Processing Environments - 01 January 1961

STP41222S: Electron Beam Microanalyzer: A New Tool for Electron Device Development - 01 January 1961

STP41223S: Detection of Inorganic Contamination on Surfaces by an EMF Measurement - 01 January 1961

STP41224S: Electrode Potential: A Tool for the Control of Materials and Processes in Electron Device Fabrication: I. EMF—Time Studies of Clean and Contaminated Platinum Electrodes - 01 January 1961

STP41225S: Electrode Potential: A Tool for the Control of Materials and Processes in Electron Device Fabrication: II. EMF Studies of the Behavior of 36 Per Cent Nickel-Iron Alloy in Hydrogen Peroxide — Formic Acid Etchants - 01 January 1961

STP41226S: Use of Radioisotope Tracer Techniques in Contamination Studies - 01 January 1961

STP41218S: Particulate Concentrations in Ultraclean Rooms - 01 January 1961

STP41227S: Gas-Phase Proportional Counting: A Radiotracer Technique for Examination of Electronic Components and Materials - 01 January 1961

STP41228S: Fluorine Release from Glasses - 01 January 1961

STP46543S: 1960 Supplement to Bibliography and Abstracts on Electrical Contacts—1959 and 1960 - 01 January 1961

STP46539S: Introduction - 01 January 1961

STP45776S: The Future of X-Ray Fluorescence Instrumentation - 01 January 1960

STP46349S: Operation of Batch-Type and Continuous Electric Membrane Demineralizers - 01 January 1960

STP46369S: A Solid State Bragg-Gray Cavity Chamber - 01 January 1960

STP46531S: Introduction - 01 January 1960

STP46536S: 1959 Supplement to Bibliography and Abstracts on Electrical Contacts—1958 and 1959 - 01 January 1960

STP46532S: Errata, 1958 Supplement - 01 January 1960

STP39298S: Light Scattering Instrumentation for Particle Size Distribution Measurements - 01 January 1959

STP39300S: Electronic Size Analysis of Subsieve Particles by Flowing through a Small Liquid Resistor - 01 January 1959

STP39310S: Internal Friction, Plastic Strain, and Fatigue in Metals and Semiconductors - 01 January 1959

STP39352S: Transfers Using Positive—Displacement Meters-Techniques and Procedures - 01 January 1959

STP39353S: Application, Installation, and Maintenance of Automatic Tank Gages - 01 January 1959

STP39354S: Suggested Standard Procedures for Use of Positive Displacement Meters in Custody Transfer Measurements - 01 January 1959

STP250-EB: Symposium on Instrumentation in Atmospheric Analysis - 01 January 1959

STP39357S: Light Scattering Instrumentation for Particle size Distribution Measurements - 01 January 1959

STP39360S: An Atmospheric Fluoride Recorder - 01 January 1959

STP46949S: Performance Characteristics of Objectives, Eyepieces, and Illuminators for Microscopy - 01 January 1959

STP46947S: Introduction - 01 January 1959

STP46950S: Chemical Microscopy in the Optical Industry - 01 January 1959

STP46948S: Measurement with Phase and Interference Microscopes - 01 January 1959

STP46528S: 1958 Supplement to Bibliography and Abstracts on Electrical Contacts—1957 and 1958 - 01 January 1959

STP46523S: Introduction - 01 January 1959

STP46527S: New References for 1919–1956 - 01 January 1959

STP48051S: The Beckman Dissolved Oxygen Analyzer - 01 January 1958

STP48052S: Evaluation of Hartmann and Braun Dissolved Oxygen Recorder for Boiler Feedwater - 01 January 1958

STP48053S: Determination of Dissolved Oxygen by Means of the Cambridge Analyzer - 01 January 1958

STP41998S: Ultrasonic Transmission Tester for Detection of Unbonded Areas - 01 January 1958

STP41999S: An Ultrasonic Scanner and Recording System - 01 January 1958

STP42013S: A Recording X-Ray Photometer - 01 January 1958

STP42018S: A Panoramic Camera for Inspecting Walls of Deep Narrow Slots - 01 January 1958

STP230-EB: Symposium on Elevated Temperature Strain Gages - 01 January 1958

STP45039S: Bonding Agents for High-Temperature Strain Gages - 01 January 1958

STP45040S: The Stability of Strain Gage Alloy Wires - 01 January 1958

STP45041S: Foil Gages for High-Temperature Applications - 01 January 1958

STP45042S: Temperature Compensation Techniques - 01 January 1958

STP45043S: Problems in Thermal Stress Measurements - 01 January 1958

STP45044S: Elevated Temperature Strain-Gage Investigations at Grumman Aircraft Engineering Corporation - 01 January 1958

STP45029S: Progress on Metalfilm Strain Gages - 01 January 1958

STP45045S: High Temperature Strain Gage Evaluator - 01 January 1958

STP45046S: Bakelite Strain Gages for Temperatures Between −320 and 450 F. - 01 January 1958

STP45047S: Investigation of Strain Gages for Long-Time Static Testing to 650 F - 01 January 1958

STP45048S: High-Temperature Strain-Gage Testing at Rolls-Royce - 01 January 1958

STP45049S: Development and Application of High-Temperature Strain Gages for Stress Measurements in Jet Engines - 01 January 1958

STP45050S: The Synthetic Mica Gage - 01 January 1958

STP45030S: Advances in Static and Dynamic High Temperature Strain Gage Research - 01 January 1958

STP45031S: Temperature Compensation of High-Temperature Strain Gages - 01 January 1958

STP45028S: Recent Laboratory Evaluation of High-Temperature Strain Gages to 900 F - 01 January 1958

STP45032S: Laboratory Evaluation of Nichrome-Foil Strain Gage Installations Up to 1200 F - 01 January 1958

STP45033S: Optical Strain Gages for Use at Elevated Temperatures - 01 January 1958

STP45034S: A Facility for the Evaluation of Resistance Strain Gages at Elevated Temperatures - 01 January 1958

STP45035S: Resistance Measurement of Ceramic-Type Strain-Gage Cements - 01 January 1958

STP45036S: Development of High-Temperature Strain Gage Wire - 01 January 1958

STP45037S: Evaluation of Several Gage Configurations Fabricated with Armour Alloy “D” - 01 January 1958

STP45038S: Ceramic Coatings for Experimental Stress Analysis - 01 January 1958

STP46520S: 1957 Supplement to Bibliography and Abstracts on Electrical Contacts—1956 and 1957 - 01 January 1958

STP46515S: Introduction - 01 January 1958

STP46516S: Errata, 1955 Supplement - 01 January 1958

STP46519S: New References for 1934–1955 - 01 January 1958

STP46279S: Quality Level Cannot be Determined by “Go”-“No Go” Gage - 01 January 1957

STP44114S: The Performance of Some Soft Solders at Elevated Temperatures and Pressures - 01 January 1957

STP44115S: Dip-Soldered Printed Circuit Joint Characteristics - 01 January 1957

STP44119S: Controlling Quality on Soldered Electrical Connections - 01 January 1957

STP44120S: Symposium Summation - 01 January 1957

STP44106S: Dip Soldering Printed Circuits - 01 January 1957

STP44107S: Soldering in Semiconductor Devices - 01 January 1957

STP44108S: Industrial Survey of Paste Solder Alloys - 01 January 1957

STP44109S: Corrosive Fluxes—Their Role in Soldering - 01 January 1957

STP44110S: The Use of Rosin and Activated Rosin Fluxes - 01 January 1957

STP44111S: Soldering Fluxes and Flux Principles - 01 January 1957

STP44112S: Non-Corrosive Fluxes—Evaluation of Spread and Corrosion Properties - 01 January 1957

STP44113S: A Method for Testing and Evaluating the Joint Properties of a Copper Liner Soldered in an Aluminum Casting - 01 January 1957

STP48037S: Construction and Operation of Larson-Lane Steam Purity and Condensate Analyzers - 01 January 1957

STP48491S: Electronic X-Ray Image Systems - 01 January 1957

STP43653S: An Improved Guarded Hot Plate Thermal Conductivity Apparatus with Automatic Controls - 01 January 1957

STP45000S: Summary of Pyrometric Procedure Employed by one Company in Creep-Rupture Testing and an Analysis of Results Obtained - 01 January 1956

STP45001S: Creep and Rupture Test Pyrometry - 01 January 1956

STP44999S: Thermocouple Immersion Errors - 01 January 1956

STP46508S: Introduction - 01 January 1956

STP46511S: New References for 1945–1953 - 01 January 1956

STP46512S: 1955 Supplement to Bibliography and Abstracts on Electrical Contacts—1954 and 1955 - 01 January 1956

STP46504S: Replacements and New References for 1934–1950 - 01 January 1954

STP46505S: 1952 and 1953 Supplements to Bibliography and Abstracts on Electrical Contacts—1951 to 1953 - 01 January 1954

STP46501S: Preface and Introduction - 01 January 1954

STP47703S: Development of a Moisture Resistance Test - 01 January 1953

STP47705S: Accelerated Weathering Devices - 01 January 1953

STP46259S: Mass Spectrometric Analysis of Copper for Cuprous-Oxide Rectifiers - 01 January 1953

STP39243S: Use of the Beckman and Perkin-Elmer Flame Photometers for the Determination of Alkalies in Portland Cement - 01 January 1952

STP39245S: The Determination of Lithium Oxide in Portland Cement by Flame Photometer - 01 January 1952

STP46738S: The Kingsbury Tapered-Plug Viscometer for Determining Viscosity Variation with Temperature and Rate of Shear - 01 January 1951

STP46739S: The Comparison of Viscosity-Shear Data Obtained with the Kingsbury Tapered Plug Viscometer and the PRL High Shear Capillary Viscometer - 01 January 1951

STP97-EB: Symposium on Testing of Cast Iron with SR-4 Type of Gage - 01 January 1950

STP48060S: Introduction - 01 January 1950

STP47899S: A Study of the Controlled Spectrographic Spark Source - 01 January 1948

STP76-EB: Symposium on Spectroscopic Light Sources - 01 January 1948

STP47897S: Introduction - 01 January 1948

STP47900S: Some Properties of Gas Discharges Used As Spectral Sources - 01 January 1948

STP47898S: The Present Status of Excitation in Spectrographic Analysis - 01 January 1948

STP47901S: Short-Period Phenomena in Light Sources - 01 January 1948

STP38753S: Synthetic Rubbers in the Wire and Cable Industry - 01 January 1944

STP43912S: A Million-Volt Portable Radiographic X-ray Unit - 01 January 1943

STP43915S: An Investigation of the Apparatus Used in Radium Radiography - 01 January 1943

STP43916S: An Exposure Meter for X-Ray Radiography - 01 January 1943

STP43918S: Equivalent Penetrameters in Radiographic Testing - 01 January 1943