Standard Active Last Updated: Dec 27, 2016 Track Document
ASTM C1842-16

Standard Test Method for The Analysis of Boron and Silicon in Uranium Hexfluoride via Fourier-Transform Infrared (FTIR) Spectroscopy

Standard Test Method for The Analysis of Boron and Silicon in Uranium Hexfluoride via Fourier-Transform Infrared (FTIR) Spectroscopy C1842-16 ASTM|C1842-16|en-US Standard Test Method for The Analysis of Boron and Silicon in Uranium Hexfluoride via Fourier-Transform Infrared (FTIR) Spectroscopy Standard new BOS Vol. 12.01 Committee C26
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Significance and Use

5.1 This test method utilizes FTIR spectroscopy to determine the boron and silicon concentration in uranium hexafluoride.

5.2 These detection limits are low and very effective to check the compliance of UF6 with Specifications C787 and C996.

Scope

1.1 This test method is suitable for determining boron and silicon impurities as BF3 and SiF4 in uranium hexafluoride. This test method is an alternative to those described in Test Methods C761 and C1771.

1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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Details
Book of Standards Volume: 12.01
Developed by Subcommittee: C26.05
Pages: 7
DOI: 10.1520/C1842-16
ICS Code: 27.120.30