ASTM F1996 - 14

    Standard Test Method for Silver Migration for Membrane Switch Circuitry

    Active Standard ASTM F1996 | Developed by Subcommittee: F01.18

    Book of Standards Volume: 10.04

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    Significance and Use

    4.1 The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.

    4.2 Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).

    1. Scope

    1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.

    1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.

    2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.

    ASTM Standards

    F1596 Test Method for Exposure of Membrane Switches to Temperature and Relative Humidity

    F1689 Test Method for Determining the Insulation Resistance of a Membrane Switch

    ICS Code

    ICS Number Code 77.120.99 (Other non-ferrous metals and their alloys)

    UNSPSC Code

    UNSPSC Code 39122200(Electrical switches and accessories)

    Referencing This Standard
    Link Here
    Link to Active (This link will always route to the current Active version of the standard.)

    DOI: 10.1520/F1996-14

    Citation Format

    ASTM F1996-14, Standard Test Method for Silver Migration for Membrane Switch Circuitry, ASTM International, West Conshohocken, PA, 2014,

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