| ||Format||Pages||Price|| |
|3||$40.00||  ADD TO CART|
|Hardcopy (shipping and handling)||3||$40.00||  ADD TO CART|
|Standard + Redline PDF Bundle||6||$48.00||  ADD TO CART|
Significance and Use
4.1 The effects of silver migration are short circuiting or reduction in insulation resistance. It is evidenced by staining or dicoloration between the cathode and anode conductive traces.
4.2 Accelerated testing may be accomplished by increasing the voltage over the specified voltages. (A typical starting point would be 5Vdc 50mA).
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
F1596 Test Method for Exposure of Membrane Switches to Temperature and Relative Humidity
F1689 Test Method for Determining the Insulation Resistance of a Membrane Switch
ICS Number Code 77.120.99 (Other non-ferrous metals and their alloys)
UNSPSC Code 39122200(Electrical switches and accessories)
|Link to Active (This link will always route to the current Active version of the standard.)|
ASTM F1996-14, Standard Test Method for Silver Migration for Membrane Switch Circuitry, ASTM International, West Conshohocken, PA, 2014, www.astm.orgBack to Top