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Significance and Use
5.1 Digital logic circuits are used in system applications where they are exposed to pulses of radiation. It is important to know the minimum radiation level at which transient failures can be induced, since this affects system operation.
1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (matl.)/s.
1.1.1 Discussion—This document is intended to be a guide to determine upset threshold, and is not intended to be a stand-alone document.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation
E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
F1893 Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
Military Standards:Method 1019 in MIL-STD-883. Steady-State Total Dose Irradiation Procedure Method 1021 in MIL-STD-883. Dose Rate Threshold for Upset of Digital Microcircuits.
|Link to Active (This link will always route to the current Active version of the standard.)|
ASTM F1262M-14, Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric), ASTM International, West Conshohocken, PA, 2014, www.astm.orgBack to Top