| ||Format||Pages||Price|| |
|10||$60.00||  ADD TO CART|
This terminology is related to the various disciplines involved in surface analysis.
Formerly under the jurisdiction of Committee E42 on Surface Analysis, this terminology was withdrawn in January 2012 in accordance with section 10.5.3.1 of the Regulations Governing ASTM Technical Committees, which requires that standards shall be updated by the end of the eighth year since the last approval date.
1.1 This terminology is related to the various disciplines involved in surface analysis.
1.2 The definitions listed apply to (a) Auger electron spectroscopy (AES), (b) X-ray photoelectron spectroscopy (XPS), (c) ion-scattering spectroscopy (ISS), (d) secondary ion mass spectrometry (SIMS), and (e) energetic ion analysis (EIA).
|Link to Active (This link will always route to the current Active version of the standard.)|
ASTM E673-03, Standard Terminology Relating to Surface Analysis (Withdrawn 2012), ASTM International, West Conshohocken, PA, 2003, www.astm.orgBack to Top