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Significance and Use
5.1 This test method is useful in calibrating the temperature signal of a differential scanning calorimeter for cooling experiments such as the determination of crystallization temperatures in Test Method D3418 and Test Method E794.
1.1 This test method covers the temperature calibration of differential scanning calorimeters on cooling using the difference between transition temperatures upon heating and cooling in the temperature range of 50 to 185°C. An offset in the indicated temperature between heating and cooling experiments, within this temperature range, may be used to provide temperature calibration on cooling at other temperature ranges.
1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific precautionary statements are given in Section 6.
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
D3418 Test Method for Transition Temperatures and Enthalpies of Fusion and Crystallization of Polymers by Differential Scanning Calorimetry
E473 Terminology Relating to Thermal Analysis and Rheology
E794 Test Method for Melting And Crystallization Temperatures By Thermal Analysis
E928 Test Method for Purity by Differential Scanning Calorimetry
E967 Test Method for Temperature Calibration of Differential Scanning Calorimeters and Differential Thermal Analyzers
E1970 Practice for Statistical Treatment of Thermoanalytical Data
ICS Number Code 17.200.10 (Heat. Calorimetry)
UNSPSC Code 41112201(Calorimeters)
|Link to Active (This link will always route to the current Active version of the standard.)|
ASTM E2069-06(2012), Standard Test Method for Temperature Calibration on Cooling of Differential Scanning Calorimeters, ASTM International, West Conshohocken, PA, 2012, www.astm.orgBack to Top