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Significance and Use
4.1 Accuracy in quantitative X-ray spectrometric analysis depends upon adequate accounting for interelement effects either through sample preparation or through mathematical correction procedures, or both. This guide is intended to serve as an introduction to users of X-ray fluorescence correction methods. For this reason, only selected mathematical models for correcting interelement effects are presented. The reader is referred to several texts for a more comprehensive treatment of the subject ().
1.1 This guide is an introduction to mathematical procedures for correction of interelement (matrix) effects in quantitative X-ray spectrometric analysis.
1.1.1 The procedures described correct only for the interelement effect(s) arising from a homogeneous chemical composition of the specimen. Effects related to either particle size, or mineralogical or metallurgical phases in a specimen are not treated.
1.1.2 These procedures apply to both wavelength and energy-dispersive X-ray spectrometry where the specimen is considered to be infinitely thick, flat, and homogeneous with respect to the depth of penetration of the exciting X-rays ().
1.2 This document is not intended to be a comprehensive treatment of the many different techniques employed to compensate for interelement effects. Consult Refs ( for descriptions of other commonly used techniques such as standard addition, internal standardization, etc. )
2. Referenced Documents (purchase separately) The documents listed below are referenced within the subject standard but are not provided as part of the standard.
E135 Terminology Relating to Analytical Chemistry for Metals, Ores, and Related Materials
ICS Number Code 71.040.50 (Physicochemical methods of analysis)
UNSPSC Code 41115403(Spectrometers)
|Link to Active (This link will always route to the current Active version of the standard.)|
ASTM E1361-02(2014)e1, Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis, ASTM International, West Conshohocken, PA, 2014, www.astm.orgBack to Top