4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented so that the user or potential user may gain a cursory understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.

4.2 It is understood that a laboratory may implement this practice or an X-ray fluorescence method in partnership with a manufacturer of the analytical instrumentation. If a laboratory chooses to consult with an instrument manufacturer, then the following should be considered. The laboratory should have an idea of the alloy matrices to be analyzed, elements and mass fraction ranges to be determined, and the expected performance requirements for each of these elements. The laboratory should inform the instrument manufacturer of these requirements so they may develop an analytical method which meets the laboratory’s expectations. Typically, instrument manufacturers customize the instrument configuration to satisfy the end-user’s requirements for elemental coverage, elemental precision, and detection limits. Instrument manufacturer developed analytical methods may include specific parameters for sample excitation, wavelengths, inter-element interference corrections, calibration and regression, equipment configuration/installation, and sample preparation requirements. Laboratories should have a basic understanding of the parameters derived by the manufacturer.