F01 (14-01)

    Item No.Sub No.Item
    1.03Reapproval of F0269-1960(2009) Test Method for Sag of Tungsten Wire WK44907
    2.03Reapproval of F0288-1996(2009) Specification for Tungsten Wire for Electron Devices and Lamps WK44908
    3.03Reapproval of F0289-1996(2009) Specification for Molybdenum Wire and Rod for Electronic Applications WK44909
    4.03Reapproval of F0364-1996(2009) Specification for Molybdenum Flattened Wire for Electron Tubes WK44910
    5.11Revision Of F1262M-1995(2008) Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) WK37055
    6.18Reapproval of F1578-2007 Test Method for Contact Closure Cycling of a Membrane Switch WK45715
    7.18Reapproval of F1598-1995(2007) Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method) WK45714
    8.18Reapproval of F1680-2007A Test Method for Determining Circuit Resistance of a Membrane Switch WK45713