E42 (12-02)

    Item No.Sub No.Item
    1.03Revision Of E0984-2006 Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy WK32331
    2.03Reapproval with Editorial Changes to E1016-2007 Guide for Literature Describing Properties of Electrostatic Electron Spectrometers WK37608
    3.03Guide For Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments WK23393
    4.06Revision Of E1880-2006 Practice for Tissue Cryosection Analysis with SIMS WK32810
    5.06Revision Of E1881-2006 Guide for Cell Culture Analysis with SIMS WK32809
    6.08Withdraw With Replacement to E0684-2004 Practice for Approximate Determination of Current Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces WK38686
    7.14Reapproval of E2382-2004 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy WK38844