STP Published: 1994
STP1175-EB

Effects of Radiation on Materials: 16th International Symposium

Editor(s): Arvind S. Kumar, David S. Gelles, Randy K. Nanstad, Edward A. Little

Comprehensive look at the latest research on how radiation effects metal and non-metal materials, with emphasis on fundamental mechanisms of damage and applications to nuclear systems.

Over 80 peer-review papers in 15 sections. The diversity of the selections cover a complete range of topics, including:

• The importance of research on radiation embrittlement as a predictor of safety margins

• General aspects of radiation damage

• Research covering reactor pressure vessels (RPV) steels and the various properties and microstructures

• Results of studies of ferritic and ferritic-martensitic steels

• Areas of research involving austentic alloys, copper and copper alloys, as well as alloys of zirconium, aluminum and vanadium

• Irradiation of nonmetallics, including one paper on fast reactor nuclear fuel.

Table of Contents

AD Rossin

A Taboada, M Mayfield

CH Woo, FA Garner, RA Holt

T Hashimoto, N Shigenaka

RG Faulkner, EA Little

DS Gelles

K Abe, M Kanzaki, M Satou, K Arai

A Jain, S Loganathan, Jaipal, D Kanjilal, GK Mehta

W Schüle

Y Aono, E Kuramoto, N Yoshida, H Kurishita, H Kayano

AS Kumar, ST Rosinski, NS Cannon, ML Hamilton

K Wallin, M Valo, R Rintamaa, R Ahlstrand

FM Haggag

C Ganguly, UK Viswanathan, KS Balakrishnan

D Pachur

S Chatterjee, HK Sriharsha, UK Viswanathan

ST Rosinski, EL Kennedy, JR Foulds

RK Nanstad, RG Berggren

MJ DeVan, AL Lowe, CS Wade

AS Kumar, NS Cannon, ML Hamilton

KR Lawless, AL Lowe

JR Hawthorne

JT Buswell, CJ Bolton, MR Wootton, PJE Bischler, RB Jones, LT Jones, WJ Phythian, RR Sinclair

C Leitz, EN Klausnitzer, G Hofmann

FM Haggag

GR Odette, EV Mader, GE Lucas, WJ Phythian, CA English

RE Stoller

JT Buswell, RB Jones

G Solt, F Frisius, WB Waeber, P Tipping

WJ Phythian, N de Diego, J Mace, RJ McElroy

MK Miller, MG Burke

G Brauer, F Eichhorn, F Frisius, R Kampmann

M Akamatsu, G Dai, X Li, P Moser, JC Van Duysen, G Zacharie

LS Harbison, AL Lowe

ML Hamilton, DS Gelles, PL Gardner

MI de Vries

FH Huang

RL Klueh, DJ Alexander

TS Morgan, EA Little, RG Faulkner

YJ Aixin, RP Han

FA Garner, ML Hamilton, RJ Puigh, CR Eiholzer, DR Duncan, MB Toloczko, AS Kumar

A Fissolo, V Lévy, JL Séran, A Maillard, J Royer, O Rabouille

I Shibahara, T Omori, Y Sato, S Onose, S Nomura

JM Douglas, JG Gravenor

FA Garner, ML Hamilton, CR Eiholzer, MB Toloczko, AS Kumar

RL Sindelar, GR Caskey, JK Thomas, JR Hawthorne, AL Hiser, RA Lott, JA Begley, RP Shogan

JC Van Duysen, P Todeschini, G Zacharie

C-A Wang, ML Grossbeck, BA Chin

C-A Wang, HT Lin, ML Grossbeck, BA Chin

FA Garner, T Lauritzen, MA Mitchell

VS Neustroev, VK Shamardin

A Maillard, H Touron, J-L Séran, A Chalony

BA Kalin, II Chernov, AN Kalashnikov, AV Markin, GN Shishkin, SN Korshunov

HM Chung, WE Ruther, JE Sanecki, AG Hins, TF Kassner

WJ Liu, JJ Kai, CH Tsai

M Kodama, K Fukuya, H Kayano

AJ Jacobs

FA Garner, ML Hamilton, LR Greenwood, JF Stubbins, BM Oliver

T Muroga

H Watanabe, T Muroga, N Yoshida

S Ohnuki, H Takahashi, H Kinoshita, N Akasaka, S Onose, I Shibahara

Y Katoh, Y Yutaka, A Kohyama

N Sekimura, K Hamada, S Ishino

BN Singh, A Horsewell

T Muroga, E Ishimaru, N Yoshida

CK Lee, BA Chin, SJ Zinkle, RC Wilcox

DJ Edwards, JW Newkirk, FA Garner, ML Hamilton, A Nadkarni, P Samal

BN Singh, M Eldrup, A Möslang

M Griffiths, PCK Chow, CE Coleman, RA Holt, S Sagat, VF Urbanic

N Christodoulou, AR Causey, CH Woo, CN Tome, RJ Klassen, RA Holt

KS Balakrishnan, S Chatterjee

JC Yang, JY Ren

DJ Alexander

JR Weeks, CJ Czajkowski, K Farrell

HM Chung, BA Loomis, DL Smith

WV Witzenburg, HJ de Bruyne

H Matsui, M Tanaka, M Yamamoto, A Hasegawa, K Abe

T Shikama, M Narui, H Kayano, T Sagawa, Y Endo

WY Wu, BA Chin, RH Zee

T Shikama, M Narui, H Kayano, T Sagawa, T Tanabe, M Fujitsuka

TD Burchell, WP Eatherly, JP Strizak

T Tanabe, M Fujitsuka, H Shinno, T Shikama

J Rest

BA Thiele, L Binkele, K Koizlik, H Nickel

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Details
Developed by Committee: E10
Pages: 1400
DOI: 10.1520/STP1175-EB
ISBN-EB: 978-0-8031-1488-3
ISBN-13: 978-0-8031-5262-5