You are being redirected because this document is part of your ASTM Compass® subscription.
    This document is part of your ASTM Compass® subscription.


    Fluorescent X-ray Spectrographic Analysis of Trace Elements, Including Thin Films

    Published: 0

      Format Pages Price  
    PDF (500K) 22 $25   ADD TO CART
    Complete Source PDF (6.1M) 218 $68   ADD TO CART


    Limits of detectability for trace elements in metal, powder, and solution samples range from 0.1 to 100 ppm depending on the element being determined, sample composition, and the complexity of the X-ray spectra. The limits of detectability range from 0.01 to 10 μg for elements that have been preconcentrated chemically in a form suitable for X-ray spectrographic determination.

    Author Information:

    Campbell, William J.
    Supervisory Research Chemist, U.S. Department of the Interior, College Park, Md.

    Committee/Subcommittee: E13.03

    DOI: 10.1520/STP45947S