| ||Format||Pages||Price|| |
|PDF (316K)||16||$25||  ADD TO CART|
|Complete Source PDF (6.1M)||218||$68||  ADD TO CART|
The X-ray emission spectrograph and the X-ray emission electron microprobe are two instruments that derive analytical results by interpretation of the characteristic X-ray spectra emitted from specimens examined by them. Various applications of each of these instruments and differences between them, derived chiefly from the different methods of exciting the characteristic X-ray spectra, are described. The phenomena involved in producing the continuous and characteristic spectra by electron bombardment and the characteristic and scattered X-rays emitted from a specimen when irradiated by an X-ray beam are described, as well as the characteristics of these primary and secondary X-rays. Some details of the requirements and ratings of electron guns for the microprobe and X-ray tubes for the spectrograph are mentioned.
Zemany, P. D.
General Electric Co., Schenectady, N. Y.