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    Photo Thermal Micro-Spectroscopy — A New Method for Infared Analysis of Materials

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    Many modern materials are composite structures with complex morphologies that play a large role in determining the material function. The ability to investigate the relationship between structure and property on a microscopic scale can play a crucial role in material development. Micro-Thermal Analysis (μTA)™ is a unique set of analytical techniques for characterizing materials on a micrometer and nanometer scale. Micro-TA combines the imaging power of atomic force microscopy with the ability to analyze physical, mechanical, thermal, and chemical characteristics at a specific point of interest on the surface of a material. At the heart of the technique is a miniaturized thermal probe. In a new technique termed Photo Thermal Micro-Spectroscopy (PTMS), this thermal probe is used to detect temperature fluctuations in samples that have been irradiated by IR radiation. A Fourier Transform Infrared (FT-IR) spectrum can be constructed from this information. This paper describes the PTMS technique and discusses recent applications.


    Atomic Force Microscopy, Scanning Thermal Microscopy, Photothermal, Infared Spectroscopy, Infared Microscopy, FT-IR, Microspectroscopy

    Author Information:

    Slough, Carlton G.
    TA Instruments, New Castle, DE

    Hammiche, Azzedine
    Department of Physics, Lancaster University, Lancaster,

    Reading, Mike
    Department of Chemical Sciences and Pharmacy, University of East Anglia, Norwich,

    Pollock, Hubert M.
    Department of Physics, Lancaster University, Lancaster,

    Committee/Subcommittee: E37.01

    DOI: 10.1520/STP45229S