SYMPOSIA PAPER Published: 01 January 1962
STP44400S

Extension of Sensitivity in Analysis of Impurities in Solids by Mass Spectrometry

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There are two commonly used techniques for the analysis of impurities in solids by mass spectrometry—spark analysis using a double focusing mass spectrograph with photographic film recording, and isotopic dilution with chemical separation and isotopic analysis. At the 1951 Symposium on Chemical Analysis of Inorganic Solids by Means of the Mass Spectrometer held by ASTM Committee E-2 on Emission Spectroscopy, Inghram (1) and Hipple (2) gave papers describing these methods in detail. This discussion presents a brief review of these methods, the outstanding improvements since 1951, the limitations of the methods, and, finally, the general trends for overcoming these limitations. This discussion emphasizes the isotopic dilution method and high-sensitivity surface ionization analysis, primarily as used for nonroutine and research type analysis problems where the most sensitive methods are in use.

Author Information

Stevens, C., M.
Special Materials and Services, Argonne National Laboratory, Argonne, Ill.
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Developed by Committee: E03
Pages: 58–68
DOI: 10.1520/STP44400S
ISBN-EB: 978-0-8031-6202-0
ISBN-13: 978-0-8031-6203-7