SYMPOSIA PAPER Published: 01 January 1962
STP44385S

Fission Fragment Tracks in Thin Films of UO

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Surface effects in UO2 films produced by individual fission events which can be studied with the electron microscope offer promise of giving increased insight into the interaction of fission fragments with solids. Experimental techniques are described in which it is possible to identify the class of fragment giving rise to a particular length of track, the direction of travel of the fragment in producing the track, and the depth of the fragment below the free surface at points along the track. The results obtained using these techniques are correlated with the structures observed. The proposed mechanisms of energy loss of fission fragments are discussed and related to the studies of track structure. Results suggest that electron excitation and ionization energy loss is dominant in determining track registration. Finally, a new mechanism by which ionization energy may be converted into lattice damage is described.

Author Information

Noggle, T, S
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tenn.
Stiegler, J, O
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tenn.
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Details
Developed by Committee: E10
Pages: 47–63
DOI: 10.1520/STP44385S
ISBN-EB: 978-0-8031-5966-2
ISBN-13: 978-0-8031-6120-7