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Most replica techniques used in electron metallography derive their contrast from the relief of the surface of the sample under examination. The differences in elevation on the surface result from differential attack on the various components of the microstructure by a suitable etching solution. The results achieved on structures containing very fine precipitate particles are not always completely satisfactory on account of poor resolution produced by the etchant and failure of a replica to reproduce accurately all the detail of a surface. These difficulties can be avoided by use of a new replica technique developed at this Laboratory and described at the Electron Microscope Society (1) meeting in November, 1952. In this technique the actual precipitate particles are examined rather than a replica of their surface, resulting in higher resolution and permitting identification of the precipitate by electron diffraction examination of selected regions of the replica.
Fisher, R. M.
Research Laboratory, U. S. Steel Corp., Kearny, N. J.