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An eddy current test bench composed of basic electronic circuits is described. By interconnection of these circuits and construction of suitable probes, such a bench can be used to perform a variety of electromagnetic tests, can cover a rather wide band of frequencies, and is therefore especially useful for custom nondestructive testing as well as for the development of production line instrumentation. Specific applications of this bench to various plating problems, to graphite studies, and to instrument development programs are described. The probes developed for each application are depicted, and the resultant accuracy of the various measurements is given.
Edwards, P. D.
University of California Los Alamos Scientific Laboratory, Los Alamos, N. Mex.