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    Detection of Inorganic Contamination on Surfaces by an EMF Measurement

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    Electron tubes and semiconductor devices are greatly affected by contaminating materials on the component parts. Many methods for cleaning these component parts have been investigated, published, and put to use. However, methods for detecting inorganic contamination on metal surfaces, either as initial or residual contamination from a cleaning process, are virtually non-existent.

    This paper is a report of progress made on a simple, fast, and inexpensive method for detection of inorganic contamination on metal surfaces. Descriptions of design, operation, and application of the test method are included. Data are presented to indicate the scope of the testing method and its usefulness at the present time.

    Author Information:

    Schimmel, D. G.
    Materials Engineering, Receiving Tube Operations, Sylvania Electric Products Inc., Emporium, Pa

    Committee/Subcommittee: F01.10

    DOI: 10.1520/STP41223S