You are being redirected because this document is part of your ASTM Compass® subscription.
    This document is part of your ASTM Compass® subscription.


    Solid-State X-ray Detectors for Electron Microprobe Analysis

    Published: 0

      Format Pages Price  
    PDF (304K) 14 $25   ADD TO CART
    Complete Source PDF (6.3M) 287 $86   ADD TO CART


    Semiconducting X-ray detectors with low noise and high resolution have recently become available for the less than 20 keV range which is the region of interest encountered in the examination of X-rays produced in the electron microprobe analyzer. Although their energy resolution is generally less than that of crystal spectrometers, they offer special advantages including simultaneous collection of all detectable X-ray signals, high collection efficiencies, wavelength measurement independent of specimen position, and rapid collection of data in a form compatible with computer processing. Added to an electron microprobe, they provide a method of detecting in several minutes all elements with atomic number greater than sodium and present in quantities as small as a few tenths of a percent. Quantitative analyses are possible provided care is exercised in evaluating background spectra and peak overlap.


    spectroscopy, solid state devices, semiconductors (materials), X-ray spectra, electron probes, background noise, quantitative analysis, X-ray analysis, scanning, electron microscopes, wavelengths, spectrometers, resolution, data storage, data processing

    Author Information:

    Lifshin, E
    Research staff, General Electric Co., Schenectady, N. Y.

    Committee/Subcommittee: E04.11

    DOI: 10.1520/STP38572S