SYMPOSIA PAPER Published: 01 January 1983
STP37279S

Recent Progress in the Studies of Laser-Induced Intrinsic Damage of Transparent Solids: Deterrent Lack Effect of Seed Electrons in Avalanche Ionization Process

Source

Peculiarities of laser-induced damage in transparent dielectrics caused by electron avalanche in the case of deterrent lack of seed electrons are discussed. Statistical models of the avalanche process initiated by multiphoton ionization of host atoms or impurities are described. Based on the breakdown probability expressions derived, the damage threshold dependence upon the temperature and the focal spot size are discussed. The theoretical results are found to be in good qualitative agreement with the experimental data for the laser-induced damage in alkali-halide crystals.

Author Information

Epifanov, AS
Garnov, SV
Gomelauri, GV
Manenkov, AA
Prokhorov, AM
Price: $25.00
Contact Sales
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Developed by Committee: F01
Pages: 532–540
DOI: 10.1520/STP37279S
ISBN-EB: 978-0-8031-4865-9
ISBN-13: 978-0-8031-0708-3