| ||Format||Pages||Price|| |
|PDF (372K)||18||$25||  ADD TO CART|
|Complete Source PDF (3.5M)||168||$55||  ADD TO CART|
This paper presents a method of interferogram reduction for reflected wavefront profiles measuring surface shape, transmitted wavefront profiles combining surface and homogeneity effects, surface irregularities or gradient errors per unit of clear aperture at normal incidence, and parallelism or wedge angle. Also included are several testing methods.
interferogram, interferometer, parallelism, gradient error, wavefront distortion
Technical specialist, Lawrence Livermore Laboratory, Livermore, Calif.