SYMPOSIA PAPER Published: 01 January 1978
STP33967S

How to Interpret an Interferogram

Source

This paper presents a method of interferogram reduction for reflected wavefront profiles measuring surface shape, transmitted wavefront profiles combining surface and homogeneity effects, surface irregularities or gradient errors per unit of clear aperture at normal incidence, and parallelism or wedge angle. Also included are several testing methods.

Author Information

Bissinger, HD
Lawrence Livermore Laboratory, Livermore, Calif.
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Details
Developed by Committee: F01
Pages: 11–28
DOI: 10.1520/STP33967S
ISBN-EB: 978-0-8031-4733-1
ISBN-13: 978-0-8031-0709-0