You are being redirected because this document is part of your ASTM Compass® subscription.
    This document is part of your ASTM Compass® subscription.

    STP666

    How to Interpret an Interferogram

    Published: 0


      Format Pages Price  
    PDF (372K) 18 $25   ADD TO CART
    Complete Source PDF (3.5M) 168 $55   ADD TO CART

    Abstract

    This paper presents a method of interferogram reduction for reflected wavefront profiles measuring surface shape, transmitted wavefront profiles combining surface and homogeneity effects, surface irregularities or gradient errors per unit of clear aperture at normal incidence, and parallelism or wedge angle. Also included are several testing methods.

    Keywords:

    interferogram, interferometer, parallelism, gradient error, wavefront distortion


    Author Information:

    Bissinger, HD
    Technical specialist, Lawrence Livermore Laboratory, Livermore, Calif.


    Committee/Subcommittee: F01.02

    DOI: 10.1520/STP33967S