SYMPOSIA PAPER Published: 01 January 1987
STP33866S

Depth Profiling of Hydrogen Isotopes Implanted into TiC Crystals

Source

The concentration depth profiles of hydrogen isotopes implanted into titanium carbide (TiCx) specimens in the composition range of x = 0.50 to 0.96 have been measured using the elastic recoil detection analysis. The retention behavior of the implanted deuterium changes with the specimen composition; the deuteriums deposit near the projected range, and a saturation is eventually reached for the specimens with the composition close to stoichiometric TiC, while for the specimens with off-stoichiometric compositions they diffuse very fast away from the near surface region to the interior to attain the saturation. The experimental data of retention and isotopic replacement are compared with a simple model of local saturation and replacement.

Author Information

Sato, K
Miyagi National College of Technology, Natori 981-12, Japan
Yamaguchi, S
Institute for Materials Research, Tohoku University, Sendai 980, Japan
Fujino, Y
Tohoku University, Sendai 980, Japan
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Details
Developed by Committee: E10
Pages: 857–865
DOI: 10.1520/STP33866S
ISBN-EB: 978-0-8031-5016-4
ISBN-13: 978-0-8031-0962-9