You are being redirected because this document is part of your ASTM Compass® subscription.
    This document is part of your ASTM Compass® subscription.


    Depth Profiling of Hydrogen Isotopes Implanted into TiC Crystals

    Published: 0

      Format Pages Price  
    PDF (144K) 9 $25   ADD TO CART
    Complete Source PDF (18M) 912 $133   ADD TO CART


    The concentration depth profiles of hydrogen isotopes implanted into titanium carbide (TiCx) specimens in the composition range of x = 0.50 to 0.96 have been measured using the elastic recoil detection analysis. The retention behavior of the implanted deuterium changes with the specimen composition; the deuteriums deposit near the projected range, and a saturation is eventually reached for the specimens with the composition close to stoichiometric TiC, while for the specimens with off-stoichiometric compositions they diffuse very fast away from the near surface region to the interior to attain the saturation. The experimental data of retention and isotopic replacement are compared with a simple model of local saturation and replacement.


    hydrogen isotopes, radiation, titanium carbide, deuterium

    Author Information:

    Sato, K
    Associate professor, Miyagi National College of Technology, Natori 981-12,

    Yamaguchi, S
    Professor, Institute for Materials Research, Tohoku University, Sendai 980,

    Fujino, Y
    Associate professor, Tohoku University, Sendai 980,

    Committee/Subcommittee: E10.07

    DOI: 10.1520/STP33866S