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    Photothermal Deflection Microscopy of HR and AR Coatings

    Published: Jan 1985

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    Last year at this syposium we reported on the initial results of photothermal deflection microscopy (PDM) studies of single layer dielectric thin films [1]. The high spatial resolution, low-level absorption capabilities of PDM were demonstrated in the form of two-dimensional absorption contour maps of such films.

    In this paper we report on PDM measurements of a number of HR and AR coatings provided by Lawrence Livermore Laboratory and the Naval Weapons Center. The absorption data obtained from these measurements provide the first phase of absorption/damage correlation studies and as these absorption measurements were recently completed, no correlation data are yet available.

    Resolution improvements, measurement methodology and a number of absorption contour maps are presented. Two interesting observations yet to be explained are described and some future experiments are suggested.


    defect location, optical absorption, photothermal deflection, surface defects, thin films

    Author Information:

    Mundy, WC
    Pacific Union College, Angwin, CA

    Ermshar, JEL
    Pacific Union College, Angwin, CA

    Hanson, PD
    Pacific Union College, Angwin, CA

    Hughes, RS
    Pacific Union College, Angwin, CA

    Committee/Subcommittee: F01.19

    DOI: 10.1520/STP28990S

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