SYMPOSIA PAPER Published: 01 January 1981
STP28335S

Multi-Parameter Yield Zone Model for Predicting Spectrum Crack Growth

Source

A systematic technique is presented for modeling crack growth load interaction effects due to spectrum loading. The Multi-Parameter Yield Zone (MPYZ) model accounts for crack growth retardation, acceleration, and underload effects. The load interactions are attributed to the residual stress intensity due to the plastic deformation at the crack tip. As part of an ASTM Task Group E24.06.01 round-robin effort, fatigue crack growth was predicted and compared with test data for a variety of spectrum loadings.

Author Information

Johnson, WS
NASA Langley Research Center, Hampton, Va.
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Details
Developed by Committee: E08
Pages: 85–102
DOI: 10.1520/STP28335S
ISBN-EB: 978-0-8031-4814-7
ISBN-13: 978-0-8031-0715-1