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    Background Correction Used with a High-Resolution Spectrometer for Plasma Emission Spectrochemical Analysis

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    An echelle grating spectrometer can be configured in a straightforward fashion to provide short-range scanning. With this capability, the instrument enables observation of the wavelength regions a few spectral bandwidths on either side of an analyte line for the investigation of suspected spectral interferences. Acquisition of scan data of this sort can simplify the decision of whether or not to use some type of background correction procedure. Various background correction approaches are available with this short-range wavelength scan capability.

    The characteristics of a high-resolution echelle grating polychromator which has dynamic background correction capabilities is described. Its use for the elimination or alleviation of a number of suspected and verified cases of spectral interferences is examined.


    metals, analytical techniques, trace constituents, echelle spectrometer, background correction techniques, atomic emission spectrometry, d-c plasma emission

    Author Information:

    Zander, AT
    Application engineer, SpectraMetrics, Inc., Andover, Mass.

    Committee/Subcommittee: E03.02

    DOI: 10.1520/STP28096S