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    Critical Examination of Battelle Columbus Laboratory Crack Arrest Toughness Measurement Procedure

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    Two procedures to characterize crack arrest toughness have been proposed to the ASTM E24.03.04 Committee for possible adoption as a testing standard. One of the procedures, proposed by Battelle Columbus Laboratory (BCL), uses results from a dynamic computer code based on an energy balance criterion. This computer code is utilized to construct two reference curves which relate KID/KQ or KIDm with Δa/ao and V/co with Δa/ao. Here KID represents the plane-strain fast fracture toughness, KIDm the minimum value of plane-strain fast fracture toughness or plane-strain crack arrest toughness, KQ the initial stress intensity, V the crack velocity, co the bar wave velocity, Δa the crack jump distance, and ao the initial crack length.

    With these two reference curves for a given specimen geometry and a knowledge of KQ, co, and Δa/ao, not only is the determination of the crack arrest toughness KIDm proposed but also the characterization of the stress-intensity factor and crack velocity relationship.

    The authors have utilized a one-dimensional version of the computer code developed by BCL to examine the predicted crack behavior in Homalite 100 and have made comparisons with experimentally observed crack behavior. This paper discusses the following aspects:

    1. Comparison of the predicted crack positions with experimentally observed positions for rectangular double cantilever beam (R-DCB) models.

    2. Influence of the shape of the K versus crack velocity (˙a) relationship on the reference curves generated for the R-DCB geometry.

    3. Examination and comparison of the BCL code-generated K-versus-˙a curve with the experimental curve for R-DCB and crack line loaded (CLL) compact specimens.

    4. K levels and velocities predicted by the reference curves compared on a test-by-test basis with experimentally observed values.


    stress intensity factor, battelle columbus laboratory procedure, crack arrest toughness, K-versus-˙a, relationship, crack velocity, dynamic photoelasticity

    Author Information:

    Fourney, WL
    Professor and associate professor, University of Maryland, College Park, Md.

    Kobayashi, T
    Professor and associate professor, University of Maryland, College Park, Md.

    Committee/Subcommittee: E08.93

    DOI: 10.1520/STP27453S