SYMPOSIA PAPER Published: 01 January 1977
STP27388S

A Crack Arrest Measuring Procedure for , , and Properties

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New developments are described which offer a flexible procedure for measuring the fracture resistance values, KIm, KID, and KIa which characterize the crack arrest behavior of materials. The procedure relies on a dynamically stiff, wedge-loading which limits dynamic energy exchanges between the test specimen and the testing machine. This makes it possible to interpret both small and large crack jumps without recourse to crack velocity measurements. The procedure is general and can be applied to ordinary and duplex rectangular and contoured double-cantilever-beam (DCB) specimens, and to compact and single-edge-notched (SEN) specimens when dynamic analyses for these shapes become available. The paper examines the virtues of the different specimen configurations, size and thickness requirements, possible upper and lower bounds on the size of the crack jump, and the problem of branching and side grooves. Measurements of specimen machine interactions are described. Results obtained for A533B steel with a series of rectangular DCB specimens illustrate the dependence of KIa on the size of the crack jump as well as the previously proposed relations between KIa and KIm or KID. The results confirm that the KIm (or KID) values obtained with the new procedure from static measurements of load point displacement and the crack length at arrest agree with values derived from crack velocity measurements. The experiments also illustrate that duplex DCB specimens with modest dimensions (400 by 140 by 50 mm) have the capacity for measuring KIm and KID values in excess of 150 MPa·m½.

Author Information

Hoagland, RG
Battelle Columbus Laboratories, Columbus, Ohio
Rosenfield, AR
Battelle Columbus Laboratories, Columbus, Ohio
Gehlen, PC
Battelle Columbus Laboratories, Columbus, Ohio
Hahn, GT
Battelle Columbus Laboratories, Columbus, Ohio
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Details
Developed by Committee: E08
Pages: 177–202
DOI: 10.1520/STP27388S
ISBN-EB: 978-0-8031-4700-3
ISBN-13: 978-0-8031-0341-2